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Electronics letters, 2017-03, Vol.53 (6), p.399-401
2017
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Advanced materials (Weinheim), 2007-09, Vol.19 (17), p.2341-2346
2007
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Acta materialia, 2013-01, Vol.61 (2), p.519-528
2013
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European cells & materials, 2014-11, Vol.28, p.387-403
2014
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Journal of instrumentation, 2022-07, Vol.17 (7), p.P07034
2022
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Nanoscale, 2016-10, Vol.8 (39), p.17113-17121
2016
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Journal of synchrotron radiation, 2023-03, Vol.30 (2), p.445-448
2023
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Advanced functional materials, 2006-12, Vol.16 (18), p.2393-2397
2006
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Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2013-04, Vol.707, p.45-53
2013
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2023-08, Vol.541, p.260-263
- Hong, B.
- Ahn, D.S.
- Ahn, J.K.
- Bae, J.
- Bae, Y.
- Bok, J.S.
- Choi, S.W.
- Do, S.
- Heo, C.
- Huh, J.
- Hwang, J.
- Jang, Y.
- Kang, B.
- Kim, A.
- Kim, B.K.
- Kim, C.
- Kim, E.-J.
- Kim, G.W.
- Kim, G.Y.
- Kim, H.C.
- Kim, J.S.
- Kim, J.Y.
- Kim, S.H.
- Kim, Y.
- Kim, Y.J.
- Kim, Y.S.
- Kweon, M.
- Lee, C.S.
- Lee, H.I.
- Lee, H.J.
- Lee, H.S.
- Lee, J.H.
- Lee, J.S.
- Lee, J.-W.
- Lee, J.W.
- Lee, S.H.
- Lee, S.J.
- Lim, S.H.
- Moon, D.H.
- Nam, S.H.
- Park, J.
- Park, J.H.
- Seo, J.
- Yang, H.M.
2023
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Journal of materials chemistry. C, Materials for optical and electronic devices, 2016-01, Vol.4 (28), p.6864-6872
2016
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Journal of materials chemistry. C, Materials for optical and electronic devices, 2017, Vol.5 (17), p.4214-4218
2017
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Intermetallics, 2019-04, Vol.107, p.24-33
2019
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The international journal of pavement engineering, 2019-10, Vol.20 (10), p.1182-1192
2019
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Journal of intelligent manufacturing, 2020-03, Vol.31 (3), p.661-680
2020
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Energy (Oxford), 2012-07, Vol.43 (1), p.402-415
2012
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ACS nano, 2015-09, Vol.9 (9), p.8689-8696
2015
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Advanced functional materials, 2005-01, Vol.15 (1), p.77-82
2005
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Advanced materials (Weinheim), 2006-03, Vol.18 (5), p.572-576
2006
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Electronics letters, 2018-05, Vol.54 (10), p.663-665
2018
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Journal of instrumentation, 2018-12, Vol.13 (12), p.P12032-P12032
- Abe, K.
- Hiraide, K.
- Ichimura, K.
- Kishimoto, Y.
- Kobayashi, K.
- Kobayashi, M.
- Moriyama, S.
- Nakahata, M.
- Ogawa, H.
- Sato, K.
- Sekiya, H.
- Suzuki, T.
- Takachio, O.
- Takeda, A.
- Tasaka, S.
- Yamashita, M.
- Yang, B.S.
- Kim, N.Y.
- Kim, Y.D.
- Itow, Y.
- Kanzawa, K.
- Masuda, K.
- Martens, K.
- Suzuki, Y.
- Xu, B. D.
- Miuchi, K.
- Oka, N.
- Takeuchi, Y.
- Kim, Y.H.
- Lee, K.B.
- Lee, M.K.
- Fukuda, Y.
- Miyasaka, M.
- Nishijima, K.
- Fushimi, K.
- Kanzaki, G.
- Nakamura, S.
2018
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Nature nanotechnology, 2008-03, Vol.3 (3), p.145-150
2008
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Journal of nondestructive evaluation, 2015-03, Vol.34 (1), Article 273
2015
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Acta materialia, 2006-05, Vol.54 (9), p.2419-2429
2006
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Nano letters, 2018-11, Vol.18 (11), p.6655-6659
2018
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