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Regression of non-linear coupling of noise in LIGO detectors

Classical and quantum gravity, 2018-03, Vol.35 (5), p.55008

2018

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The Effects of Microvoid Defects on MWIR HgCdTe-Based Diodes

Journal of electronic materials, 2011-08, Vol.40 (8), p.1693-1698

2011

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Development of MBE II–VI Epilayers on GaAs(211)B

Journal of electronic materials, 2012-10, Vol.41 (10), p.2707-2713

2012

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Novel substrates for Helium adsorption: Graphane and Graphene—Fluoride

Journal of physics. Conference series, 2012-01, Vol.400 (1), p.12010-6

2012

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Measurement of Minority Carrier Lifetime in n-Type MBE HgCdTe on Variable Substrates

Journal of electronic materials, 2012-10, Vol.41 (10), p.2785-2789

2012

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Ultrahigh vacuum-compatible fabrication and electrical characterization systems for environmentally sensitive metal oxide semiconductor capacitors

Review of scientific instruments, 2007-06, Vol.78 (6), p.065113-065113-5

2007

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Ferroelectric stability of BaTiO3 in a crystalline oxide on semiconductor structure

Physica Status Solidi (b), 2004-08, Vol.241 (10), p.2287-2290

2004

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Electrical characteristics of epitaxially grown SrTiO3 on silicon for metal-insulator-semiconductor gate dielectric applications

IEEE electron device letters, 2003-04, Vol.24 (4), p.218-220

2003

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“My Curriculum to Go”: An Educational Project at the Medical College of Georgia

Oral surgery, oral medicine, oral pathology, oral radiology and endodontics, 2008, Vol.105 (4), p.e53-e53

2008

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A study of charge trapping in PECVD PTEOS films

IEEE transactions on nuclear science, 1997-12, Vol.44 (6), p.1834-1839

1997

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IEEE_Xplore

Identification of the microscopic structure of new hot carrier damage centers in short channel MOSFETs

Microelectronic engineering, 1997-06, Vol.36 (1), p.271-274

1997

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Process integration of an interlevel dielectric (ILDO) module using a building-in reliability approach

IEEE transactions on electron devices, 1998-03, Vol.45 (3), p.655-664

1998

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IEEE_Xplore

Lateral Extended Drain Transistor Reliability Dependence on Lithography CD Variation

2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 2007, p.249-252

2007

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IEEE_Xplore

Lithography CD Variation effects on LFNDMOS Transistor Hot-Carrier Degradation

2006 IEEE International Integrated Reliability Workshop Final Report, 2006, p.152-155

2006

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IEEE_Xplore

Electrical characteristics of epitaxially grown SrTiO(3) on silicon for metal-insulator-semiconductor gate dielectric applications

IEEE electron device letters, 2003-04, Vol.24 (4), p.218-220

2003

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Ferroelectric stability of BaTiO 3 in a crystalline oxide on semiconductor structure

physica status solidi (b), 2004-08, Vol.241 (10), p.2287-2290

2004

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Approach to Extrapolating Reliability of Circuits Operating in a Varying and Low Temperature Range

2006 IEEE International Reliability Physics Symposium Proceedings, 2006, p.307-312

2006

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IEEE_Xplore

Observational Learning From Internal Feedback: A Simulation of an Adaptive Learning Method

Cognitive science, 1988-10, Vol.12 (4), p.587-625

1988

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Cryogenic Reliability Impact on Analog Circuits at Extreme Low Temperatures

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual, 2007, p.156-160

2007

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IEEE_Xplore

Design for A/D converter reliability for low temperature applications

2006 IEEE Aerospace Conference, 2006, p.7 pp.

2006

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IEEE_Xplore

Design for ASIC reliability for low-temperature applications

2005 IEEE International Integrated Reliability Workshop, 2005, p.5 pp.

2005

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IEEE_Xplore

Crystalline oxides on semiconductors: a structural transition of the interface phase

Bulletin of the American Physical Society, 2004-03, Vol.49 (1), p.A21 8-A21 8

2004

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Electrical characteristics of epitaxially grown SrTiO sub(3) on silicon for metal-insulator-semiconductor gate dielectric applications

IEEE electron device letters, 2003-01, Vol.24 (4)

2003

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History versus mystery: the test of time in Murder in the Cathedral

Clio (Fort Wayne, Ind.), 1980, Vol.10 (1), p.47

Billman, Carol

1980

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Design for ASIC reliability for low-temperature applications

IEEE transactions on device and materials reliability, 2006-06, Vol.6 (2), p.146-153

2006

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IEEE_Xplore

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Regression of non-linear coupling of noise in LIGO detectors

The Effects of Microvoid Defects on MWIR HgCdTe-Based Diodes

Development of MBE II–VI Epilayers on GaAs(211)B

Novel substrates for Helium adsorption: Graphane and Graphene—Fluoride

Measurement of Minority Carrier Lifetime in n-Type MBE HgCdTe on Variable Substrates

Ultrahigh vacuum-compatible fabrication and electrical characterization systems for environmentally sensitive metal oxide semiconductor capacitors

Ferroelectric stability of BaTiO3 in a crystalline oxide on semiconductor structure

Electrical characteristics of epitaxially grown SrTiO3 on silicon for metal-insulator-semiconductor gate dielectric applications

“My Curriculum to Go”: An Educational Project at the Medical College of Georgia

A study of charge trapping in PECVD PTEOS films

Identification of the microscopic structure of new hot carrier damage centers in short channel MOSFETs

Process integration of an interlevel dielectric (ILDO) module using a building-in reliability approach

Lateral Extended Drain Transistor Reliability Dependence on Lithography CD Variation

Lithography CD Variation effects on LFNDMOS Transistor Hot-Carrier Degradation

Electrical characteristics of epitaxially grown SrTiO(3) on silicon for metal-insulator-semiconductor gate dielectric applications

Ferroelectric stability of BaTiO 3 in a crystalline oxide on semiconductor structure

Approach to Extrapolating Reliability of Circuits Operating in a Varying and Low Temperature Range

Observational Learning From Internal Feedback: A Simulation of an Adaptive Learning Method

Cryogenic Reliability Impact on Analog Circuits at Extreme Low Temperatures

Design for A/D converter reliability for low temperature applications

Design for ASIC reliability for low-temperature applications

Crystalline oxides on semiconductors: a structural transition of the interface phase

Electrical characteristics of epitaxially grown SrTiO sub(3) on silicon for metal-insulator-semiconductor gate dielectric applications

History versus mystery: the test of time in Murder in the Cathedral

Design for ASIC reliability for low-temperature applications

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