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High-Resolution Hybrid Lithography with Negative Tone Chemically Amplified Resists

Japanese Journal of Applied Physics, 2004-06, Vol.43 (6S), p.3974

2004

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Magnetic Levitation of Plastic Chips: Applications for Magnetic Susceptibility Measurement and Magnetic Separation

Japanese Journal of Applied Physics, 2005-09, Vol.44 (9R), p.6801

2005

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Temperature Distribution Measurement in AlGaN/GaN High-Electron-Mobility Transistors by Micro-Raman Scattering Spectroscopy

Japanese Journal of Applied Physics, 2002-04, Vol.41 (Part 2, No. 4B), p.L452-L454

2002

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Measurement of Frequency Dispersion of AlGaN/GaN High Electron Mobility Transistors

Japanese Journal of Applied Physics, 2003, Vol.42 (Part 1, No. 2A), p.424-425

2003

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Basic Study on Sludge Concentration and Dehydration with Ultrasonic Exposure

Japanese Journal of Applied Physics, 2005-06, Vol.44 (6S), p.4678

2005

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Electroluminescence in AlGaN/GaN High Electron Mobility Transistors under High Bias Voltage

Japanese Journal of Applied Physics, 2002, Vol.41 (Part 1, No. 4A), p.1990-1991

2002

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Data Processing in High Resolution X-Ray Spectroscopy

Japanese Journal of Applied Physics, 1978-01, Vol.17 (S2), p.436

1978

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Mechanical Properties of Sharpened Carbon Nanotube Tips

Japanese Journal of Applied Physics, 2005-04, Vol.44 (4R), p.1637

2005

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Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy

Japanese Journal of Applied Physics, 2000-08, Vol.39 (8B), p.L887-L889

2000

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Buckling Test under Axial Compression for Multiwall Carbon Nanotubes

Japanese Journal of Applied Physics, 2005-01, Vol.44 (8L), p.L1097

2005

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Low-Damage Sputtering of GaAs and GaP Using Size-Selected Ar Cluster Ion Beams

Japanese Journal of Applied Physics, 2005-01, Vol.44 (1L), p.L164

2005

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Orthopedic Treatment of Multiwalled Carbon Nanotube Probes

Japanese Journal of Applied Physics, 2003, Vol.42 (Part 1, No. 7B), p.4866-4868

2003

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Quantitative Analysis of the Magnetic Properties of Metal-Capped Carbon Nanotube Probe

Japanese Journal of Applied Physics, 2002, Vol.41 (Part 1, No. 7B), p.5013-5016

2002

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Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip

Japanese Journal of Applied Physics, 2000-06, Vol.39 (6S), p.3707

2000

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Importance of Pure Si Films in Pulsed-Laser-Induced Lateral Growth

Japanese Journal of Applied Physics, 2006-05, Vol.45 (5R), p.3922

2006

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Selective area epitaxy of GaAs using GaAs oxide as a mask

Japanese Journal of Applied Physics, 1990-08, Vol.29 (8), p.L1360-L1362

1990

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Observation of reconstructed Pt(100) surface by reflection electron microscopy

Japanese Journal of Applied Physics, 1993-11, Vol.32 (11A), p.L1631-L1634

1993

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Electrically induced orientation of poly(silane)s

Japanese Journal of Applied Physics, 1995, Vol.34 (1A), p.L57-L60

1995

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A chemical-state-discriminated XPED study on structure of thin CaO layer formed by electron bombardment heating on CaF2(111)

Japanese journal of applied physics, 1990, Vol.29 (10), p.2106-2110

1990

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Fine pattern formation of gallium arsenide by in situ electron-beam lithography using an ultrathin surface oxide as a resist

Japanese Journal of Applied Physics, 1990, Vol.29 (1), p.L182-L184

1990

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High-Resolution Hybrid Lithography with Negative Tone Chemically Amplified Resists

Magnetic Levitation of Plastic Chips: Applications for Magnetic Susceptibility Measurement and Magnetic Separation

Temperature Distribution Measurement in AlGaN/GaN High-Electron-Mobility Transistors by Micro-Raman Scattering Spectroscopy

Measurement of Frequency Dispersion of AlGaN/GaN High Electron Mobility Transistors

Basic Study on Sludge Concentration and Dehydration with Ultrasonic Exposure

Electroluminescence in AlGaN/GaN High Electron Mobility Transistors under High Bias Voltage

Data Processing in High Resolution X-Ray Spectroscopy

Mechanical Properties of Sharpened Carbon Nanotube Tips

Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy

Buckling Test under Axial Compression for Multiwall Carbon Nanotubes

Low-Damage Sputtering of GaAs and GaP Using Size-Selected Ar Cluster Ion Beams

Orthopedic Treatment of Multiwalled Carbon Nanotube Probes

Quantitative Analysis of the Magnetic Properties of Metal-Capped Carbon Nanotube Probe

Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip

Importance of Pure Si Films in Pulsed-Laser-Induced Lateral Growth

Selective area epitaxy of GaAs using GaAs oxide as a mask

Observation of reconstructed Pt(100) surface by reflection electron microscopy

Electrically induced orientation of poly(silane)s

A chemical-state-discriminated XPED study on structure of thin CaO layer formed by electron bombardment heating on CaF2(111)

Fine pattern formation of gallium arsenide by in situ electron-beam lithography using an ultrathin surface oxide as a resist

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