Sortiert nach
Materials science forum, 1995-01, Vol.196-201, p.791-796
1995
Link zum Volltext
Materials science forum, 1995-01, Vol.196-201, p.951-956
1995
Link zum Volltext
Superlattices and microstructures, 2016-11, Vol.99, p.1-2
2016
Link zum Volltext
Semiconductors (Woodbury, N.Y.), 2010-07, Vol.44 (7), p.841-853
2010
Link zum Volltext
Japanese Journal of Applied Physics, 2000-01, Vol.39 (S1), p.399
2000
Link zum Volltext
13th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP XIII),2009-09-13 - 2009-09-17, 2010-06, Vol.39 (6), p.794-798
2010
Link zum Volltext
Journal of applied physics, 2016-05, Vol.119 (18)
2016
Link zum Volltext
Physica B + C, 1983-02, Vol.116 (1-3), p.1-3
1983
Link zum Volltext
2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID), 2022, p.150-155
2022
- Link zum Volltext
Physica. B, Condensed matter, 2007-12, Vol.401, p.1-6
2007
Link zum Volltext
Journal of applied physics, 2022-10, Vol.132 (15)
2022
Link zum Volltext
Journal of electronic materials, 2020-08, Vol.49 (8), p.4563-4568
2020
Link zum Volltext
Physica status solidi. A, Applications and materials science, 2019-03, Vol.216 (5), p.n/a
2019
Link zum Volltext
12th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors,2007-09-09 - 2007-09-13, 2008-12, Vol.19 (Suppl 1), p.111-114
2008
Link zum Volltext
2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2023, p.141-144
2023
Link zum Volltext
Journal of materials research, 2024-01, Vol.39 (2), p.177-187
2024
Link zum Volltext
2022 IEEE 20th International Conference on Industrial Informatics (INDIN), 2022, p.572-577
2022
Link zum Volltext
Journal of electronic materials, 2023-08, Vol.52 (8), p.5189-5198
2023
Link zum Volltext
2022 IEEE International Conference on Image Processing (ICIP), 2022, p.1796-1800
2022
- Link zum Volltext
Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.92-95
2008
Link zum Volltext
Journal of applied physics, 2018-04, Vol.123 (16)
2018
Link zum Volltext
Materials science & engineering. R, Reports, 2010-11, Vol.70 (3), p.151-168
2010
Link zum Volltext
PloS one, 2019-08, Vol.14 (8), p.e0221043-e0221043
2019
Link zum Volltext
Journal of electronic materials, 2018-09, Vol.47 (9), p.4998-5001
2018
Link zum Volltext
Journal of electronic materials, 2018-08, Vol.47 (8), p.4226-4233
2018
Link zum Volltext
Aktive Filter
Suchergebnisse filtern
Filter anzeigenNur zeigen
Publikationsform
Sprache
Erscheinungsjahr
n.n
n.n
Thema
- Technology
- Physical Sciences
- Physics
- Materials Science
- Physics, Applied
- Engineering
- Materials Science, Multidisciplinary
- Engineering, Electrical & Electronic
- Exact Sciences And Technology
- Science & Technology - Other Topics
- Physics, Condensed Matter
- Nanoscience & Nanotechnology
- Chemistry
- Applied Sciences
- Electronics
- Computer Science
- Silicon
- Thin Films
- Chemistry And Materials Science
Kollektion
- Ingenta E-Journals
- EZB Electronic Journals Library
- IngentaConnect Journals
- SpringerLink Journals - AutoHoldings
- Elsevier ScienceDirect Journals
- SpringerLINK Contemporary (Konsortium Baden-Württemberg)
- 美国小型学会期刊集（AIP Scitation平台）
- Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
- Wiley-Blackwell Journals
- IEEE/IET Electronic Library
- NUS Single-Journal Subscriptions
- Wiley Online Library Full Collection 2018
- North East Research Libraries Nature Academic Titles
- Journals@Ovid Complete
- ACM Digital Library
- Taylor & Francis Journals Complete
- Taylor & Francis
- eBooks on EBSCOhost
- Ebook Central Perpetual and DDA
- Nexis Uni
Zeitschrift / Serie
- Journal Of Physics. Conference Series
- Journal Of Physics: Conference Series
- Journal Of Crystal Growth
- Scientific Reports
- Journal Of Electronic Materials
- Journal Of Applied Physics
- Journal Of Vacuum Science & Technology B: Microelectronics And Nanometer Structures
- Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
- Iop Conference Series. Materials Science And Engineering
- Iop Conference Series: Materials Science And Engineering
Neu hinzugefügt