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Ion-Implantation Control of Ferromagnetism in (Ga,Mn)As Epitaxial Layers

13th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP XIII),2009-09-13 - 2009-09-17, 2010-06, Vol.39 (6), p.794-798

2010

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Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering

2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID), 2022, p.150-155

2022

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Improvement of Surface Defects in CdZnTe Crystals by Rapid Thermal Annealing

Journal of electronic materials, 2020-08, Vol.49 (8), p.4563-4568

2020

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Domain-wall induced magneto-resistive memory in ferromagnetic (Ga, Mn)As nanostructures

12th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors,2007-09-09 - 2007-09-13, 2008-12, Vol.19 (Suppl 1), p.111-114

2008

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Quantum Modeling of Semiconductors Leakage Currents Induced by Defects

2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2023, p.141-144

2023

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Comparison of Outdoor and Indoor PL and EL Images in Si Solar Cells and Panels for Defect Detection and Classification

Journal of electronic materials, 2023-08, Vol.52 (8), p.5189-5198

2023

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Exploring Active Learning for Semiconductor Defect Segmentation

2022 IEEE International Conference on Image Processing (ICIP), 2022, p.1796-1800

2022

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Volltext

Effect of electrical operation on the defect states in organic semiconductors

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.92-95

2008

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LVM Spectroscopy Investigation of Complex Defects in InAs Single Crystals Grown by the LEC Method

Journal of electronic materials, 2018-09, Vol.47 (9), p.4998-5001

2018

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Recombination-Enhanced Effect in Green/Yellow Luminescence from BeZnCdSe Quantum Wells Grown by Molecular Beam Epitaxy

Journal of electronic materials, 2018-08, Vol.47 (8), p.4226-4233

Akimoto, Ryoichi

2018

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Crystalline Morphology of SiGe Films Grown on Si(110) Substrates

Journal of electronic materials, 2023-08, Vol.52 (8), p.5121-5127

2023

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Study of the degradation of AlGaAs-based high-power laser bars: V defects

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.140-144

2008

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Recognition and Imaging of Point Defect Diffusion, Recombination, and Reaction During Growth of Czochralski-Silicon Crystals

Journal of electronic materials, 2020-09, Vol.49 (9), p.5110-5119

2020

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Characterization of Silicon Crystals Grown from Melt in a Granulate Crucible

Journal of electronic materials, 2020-09, Vol.49 (9), p.5120-5132

2020

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Defects in nanostructures with ripened InAs/GaAs quantum dots

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.96-100

2008

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A CNN-based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing

2018 International Symposium on Semiconductor Manufacturing (ISSM), 2018, p.1-3

2018

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Volltext

Point defect structure in CdTe and ZnTe thin films

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.375-381

2008

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Non-destructive Detection of Screw Dislocations and the Corresponding Defects Nucleated from Them During SiC Epitaxial Growth and Their Effect on Device Characteristics

Journal of electronic materials, 2018-09, Vol.47 (9), p.5099-5104

2018

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Investigation of defects in polyhedral oligomeric silsesquioxanes based organic light emitting diodes

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.87-91

2008

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On the characterisation of grown-in defects in Czochralski-grown Si and Ge

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.24-31

2008

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Challenges of Overcoming Defects in Wide Bandgap Semiconductor Power Electronics

Electronics (Basel), 2022-01, Vol.11 (1), p.10

2022

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Point defects in SiGe alloys: structural guessing based on electronic transition analysis

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.115-121

2008

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Generation and Auto-Revealing of Dislocations in Si During Macropore Etching

Journal of electronic materials, 2018-09, Vol.47 (9), p.5113-5117

2018

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Defect investigation and temperature analysis of high-power AlGaInP laser diodes during catastrophic optical damage

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.155-159

2008

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High-resolution photoinduced transient spectroscopy of defect centers in vanadium-doped semi-insulating SiC

Journal of materials science. Materials in electronics, 2008-12, Vol.19 (Suppl 1), p.224-228

2008

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Ion-Implantation Control of Ferromagnetism in (Ga,Mn)As Epitaxial Layers

Identifying Combination of Defects and Unknown Defects on Semiconductor Wafers using Deep Learning and Hierarchical Reclustering

Improvement of Surface Defects in CdZnTe Crystals by Rapid Thermal Annealing

Domain-wall induced magneto-resistive memory in ferromagnetic (Ga, Mn)As nanostructures

Quantum Modeling of Semiconductors Leakage Currents Induced by Defects

Comparison of Outdoor and Indoor PL and EL Images in Si Solar Cells and Panels for Defect Detection and Classification

Exploring Active Learning for Semiconductor Defect Segmentation

Effect of electrical operation on the defect states in organic semiconductors

LVM Spectroscopy Investigation of Complex Defects in InAs Single Crystals Grown by the LEC Method

Recombination-Enhanced Effect in Green/Yellow Luminescence from BeZnCdSe Quantum Wells Grown by Molecular Beam Epitaxy

Crystalline Morphology of SiGe Films Grown on Si(110) Substrates

Study of the degradation of AlGaAs-based high-power laser bars: V defects

Recognition and Imaging of Point Defect Diffusion, Recombination, and Reaction During Growth of Czochralski-Silicon Crystals

Characterization of Silicon Crystals Grown from Melt in a Granulate Crucible

Defects in nanostructures with ripened InAs/GaAs quantum dots

A CNN-based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing

Point defect structure in CdTe and ZnTe thin films

Non-destructive Detection of Screw Dislocations and the Corresponding Defects Nucleated from Them During SiC Epitaxial Growth and Their Effect on Device Characteristics

Investigation of defects in polyhedral oligomeric silsesquioxanes based organic light emitting diodes

On the characterisation of grown-in defects in Czochralski-grown Si and Ge

Challenges of Overcoming Defects in Wide Bandgap Semiconductor Power Electronics

Point defects in SiGe alloys: structural guessing based on electronic transition analysis

Generation and Auto-Revealing of Dislocations in Si During Macropore Etching

Defect investigation and temperature analysis of high-power AlGaInP laser diodes during catastrophic optical damage

High-resolution photoinduced transient spectroscopy of defect centers in vanadium-doped semi-insulating SiC

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