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2023 3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), 2023, p.1-5
2023
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2019 IEEE Energy Conversion Congress and Exposition (ECCE), 2019, p.551-556
2019

2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia), 2023, p.1031-1037
2023

2019 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (WoW), 2019, p.140-143
2019
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2018 9th Annual Power Electronics, Drives Systems and Technologies Conference (PEDSTC), 2018, p.26-29
2018
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23rd IEEE VLSI Test Symposium (VTS'05), 2005, p.427-432
2005

2017 2nd International Conference On Emerging Computation and Information Technologies (ICECIT), 2017, p.1-6
2017
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2017 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (WoW), 2017, p.1-6
2017
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2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE), 2013, p.67-70
2013

A built-in I/sub DDQ/ testing circuit
Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005, 2005, p.471-474
2005

International Test Conference, 2003. Proceedings. ITC 2003, 2003, Vol.1, p.555-564
2003

A BIST circuit for I/sub DDQ/ tests
2003 Test Symposium, 2003, p.390-395
2003

IEEE International Conference on Test, 2005, 2005, p.10 pp.-963
2005

48th Midwest Symposium on Circuits and Systems, 2005, 2005, p.179-182 Vol. 1
2005

Proceedings. International Test Conference, 2002, p.954-963
2002

22nd IEEE VLSI Test Symposium, 2004. Proceedings, 2004, p.109-114
2004


22nd IEEE VLSI Test Symposium, 2004. Proceedings, 2004, p.65-70
2004

17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings, 2002, p.390-398
2002

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146), 1999, p.143-150
1999

Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013), 1999, p.78-86
1999

Proceedings International Test Conference 2001 (Cat. No.01CH37260), 2001, p.101-110
2001

Proceedings 10th Asian Test Symposium, 2001, p.111-116
2001