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Quantitative Characterization of Ferroelectric/Dielectric Interface Traps by Pulse Measurements

IEEE transactions on electron devices, 2021-03, Vol.68 (3), p.1214-1220

2021

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Tenfold Enhancement in Light Emission from Low‐Temperature Operational Doped OLEDs by Detrapping Super‐Long‐Lived Trapped Charges

Advanced functional materials, 2023-11, Vol.33 (46)

2023

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Impact of Total Ionizing Dose Effects on the Threshold Voltage Hysteresis of SiC MOSFETs

IEEE transactions on electron devices, 2024-11, Vol.71 (11), p.6889-6896

2024

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Copper oxide nanoparticle doped bulk-heterojunction photovoltaic devices

Synthetic metals, 2019-06, Vol.252, p.21-28

2019

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Investigation of trapped charges profile for an irradiated insulated material

Journal of microscopy (Oxford), 2022-06, Vol.286 (3), p.245-251

2022

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Triple-Level-Cell/Single-Level-Cell Mix-Mode Operation Induced Data Retention Degradation in 3-D NAND Flash Memories

IEEE electron device letters, 2021-12, Vol.42 (12), p.1762-1765

2021

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Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal

Radiation physics and chemistry (Oxford, England : 1993), 2021-12, Vol.189, p.109722, Article 109722

2021

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Effects of illumination on the electrical characteristics in organic thin-film transistors based on dinaphtho [2,3-b:2′,3′-f] thieno[3,2-b] thiophene (DNTT): Experiment and modeling

Synthetic metals, 2022-01, Vol.283, p.116985, Article 116985

2022

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Low Interface Trapped Charge Density for AlO/β-GaO (001) Metal-Insulator-Semiconductor Capacitor

IEEE journal of the Electron Devices Society, 2022, Vol.10, p.942-946

2022

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Impact of Cycling Induced Intercell Trapped Charge on Retention Charge Loss in 3-D NAND Flash Memory

IEEE journal of the Electron Devices Society, 2020, Vol.8, p.62-66

2020

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Role of Hydroxyl on Conductivity Switching of Poly(ethylene oxide)/TiO2 Electrical Bistable Devices

Physica status solidi. A, Applications and materials science, 2019-09, Vol.216 (18), p.n/a

2019

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Time evolution of secondary electron emission and trapped charge accumulation in polyimide film under various primary electron irradiation currents

Applied surface science, 2016-12, Vol.390, p.346-349

2016

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Short-Circuit Failure Model of SiC MOSFET Including the Interface Trapped Charges

IEEE journal of emerging and selected topics in power electronics, 2020-03, Vol.8 (1), p.90-98

2020

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Effects of Trapped Charges in Gate Dielectric and High- Encapsulation on Performance of MoS2 Transistor

IEEE transactions on electron devices, 2019-02, Vol.66 (2), p.1107-1112

2019

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Elimination of Trapped Charges in Photonics Devices to Reduce Propagation Loss

2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2023, p.1-4

2023

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Radiation Effects of Advanced Electronic Devices and Circuits

2024

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Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices

Electronics (Basel), 2023-03, Vol.12 (6), p.1403

2023

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Preparation of Remote Plasma Atomic Layer-Deposited HfO2 Thin Films with High Charge Trapping Densities and Their Application in Nonvolatile Memory Devices

Nanomaterials (Basel, Switzerland), 2023-06, Vol.13 (11), p.1785

2023

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Amplitude of Random Telegraph Noise in Junctionless FinFET with Different Channel Shape

e-Journal of Surface Science and Nanotechnology, 2021/03/04, Vol.19, pp.9-12

2021

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Investigation of Total Ionizing Dose Radiation Effects on SiC MOSFETs by Modulating the Nitrogen Content in Gate Oxide Processing

2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2024, p.96-99

2024

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Technique for Profiling the Cycling-Induced Oxide Trapped Charge in NAND Flash Memories

Electronics (Basel), 2021-10, Vol.10 (20), p.2492

2021

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Structural Innovation for Better MOSFET Performance Suitable for Low Power Application

SILICON, 2022-07, Vol.14 (11), p.6219-6231

2022

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Performance Tuning and Reliability Analysis of the Electrostatically Configured Nanotube Tunnel FET with Impact of Interface Trap Charges

SILICON, 2021-12, Vol.13 (12), p.4553-4564

2021

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Comparison of effect of 5 MeV proton and Co-60 gamma irradiation on silicon NPN rf power transistors and N-channel depletion MOSFETs

Radiation effects and defects in solids, 2017-12, Vol.172 (11-12), p.952-963

2017

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Charge trapped mechanism for semi-crystalline polymer electrets: quasi-dipole model

IET Nanodielectrics, 2020-09, Vol.3 (3), p.81-87

2020

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Quantitative Characterization of Ferroelectric/Dielectric Interface Traps by Pulse Measurements

Tenfold Enhancement in Light Emission from Low‐Temperature Operational Doped OLEDs by Detrapping Super‐Long‐Lived Trapped Charges

Impact of Total Ionizing Dose Effects on the Threshold Voltage Hysteresis of SiC MOSFETs

Copper oxide nanoparticle doped bulk-heterojunction photovoltaic devices

Investigation of trapped charges profile for an irradiated insulated material

Triple-Level-Cell/Single-Level-Cell Mix-Mode Operation Induced Data Retention Degradation in 3-D NAND Flash Memories

Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal

Effects of illumination on the electrical characteristics in organic thin-film transistors based on dinaphtho [2,3-b:2′,3′-f] thieno[3,2-b] thiophene (DNTT): Experiment and modeling

Low Interface Trapped Charge Density for AlO/β-GaO (001) Metal-Insulator-Semiconductor Capacitor

Impact of Cycling Induced Intercell Trapped Charge on Retention Charge Loss in 3-D NAND Flash Memory

Role of Hydroxyl on Conductivity Switching of Poly(ethylene oxide)/TiO2 Electrical Bistable Devices

Time evolution of secondary electron emission and trapped charge accumulation in polyimide film under various primary electron irradiation currents

Short-Circuit Failure Model of SiC MOSFET Including the Interface Trapped Charges

Effects of Trapped Charges in Gate Dielectric and High- Encapsulation on Performance of MoS2 Transistor

Elimination of Trapped Charges in Photonics Devices to Reduce Propagation Loss

Radiation Effects of Advanced Electronic Devices and Circuits

Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices

Preparation of Remote Plasma Atomic Layer-Deposited HfO2 Thin Films with High Charge Trapping Densities and Their Application in Nonvolatile Memory Devices

Amplitude of Random Telegraph Noise in Junctionless FinFET with Different Channel Shape

Investigation of Total Ionizing Dose Radiation Effects on SiC MOSFETs by Modulating the Nitrogen Content in Gate Oxide Processing

Technique for Profiling the Cycling-Induced Oxide Trapped Charge in NAND Flash Memories

Structural Innovation for Better MOSFET Performance Suitable for Low Power Application

Performance Tuning and Reliability Analysis of the Electrostatically Configured Nanotube Tunnel FET with Impact of Interface Trap Charges

Comparison of effect of 5 MeV proton and Co-60 gamma irradiation on silicon NPN rf power transistors and N-channel depletion MOSFETs

Charge trapped mechanism for semi-crystalline polymer electrets: quasi-dipole model

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