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Corrections to “A Highly Linear and Efficient 28-GHz PA With a P ₛₐₜ of 23.2 dBm, P ₁ dB of 22.7 dBm, and PAE of 35.5% in 65-nm Bulk CMOS” [early access, doi: 10.1109/JSSC.2020.3036830]

IEEE journal of solid-state circuits, 2021-09, Vol.56 (9), p.2896-2896

2021

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64/50 dBc Over the First/Second Nyquist Zone

IEEE journal of solid-state circuits, 2021-01, Vol.56 (10), p.3145

2021

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A Process and Temperature Insensitive CMOS Linear TIA for 100 Gb/s/[Formula Omitted] PAM-4 Optical Links

IEEE journal of solid-state circuits, 2019-01, Vol.54 (11), p.3180

2019

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE transactions on electron devices, 2019-02, Vol.66 (2), p.1127-1127

2019

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE transactions on electron devices, 2019-01, Vol.66 (1), p.834-834

2019

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE transactions on electron devices, 2018-12, Vol.65 (12), p.5554-5554

2018

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE transactions on electron devices, 2018-11, Vol.65 (11), p.5222-5222

2018

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE transactions on electron devices, 2018-10, Vol.65 (10), p.4734-4734

2018

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE transactions on electron devices, 2018-09, Vol.65 (9), p.4025-4025

2018

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE transactions on electron devices, 2018-08, Vol.65 (8), p.3582-3582

2018

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE transactions on semiconductor manufacturing, 2018-11, Vol.31 (4), p.545-545

2018

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Manuscript Submission Guidelines

Clotho (Ljubljana, Online), 2019-12, Vol.1 (2), p.115-118

Clotho Editors

2019

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A 0.8-V 230- mu W 98-dB DR Inverter-Based capital sigma Delta Modulator for Audio Applications

IEEE journal of solid-state circuits, 2013-10, Vol.48 (10), p.2430-2441

2013

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Navodila za avtorje

Clotho (Ljubljana, Online), 2019-06, Vol.1 (1), p.129-131

Uredništvo

2019

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Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE journal of photovoltaics, 2019-01, Vol.9 (1), p.344-344

2019

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High-efficiency fast-transient-response V super( 2)-controlled boost converter with small ESR capacitor

Electronics letters, 2013-10, Vol.49 (22), p.1402-1402

2013

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Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

IEEE journal of photovoltaics, 2018-09, Vol.8 (5), p.1390-1390

2018

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0.6mW 6.3 GHz 40nm CMOS divide-by-2/3 prescaler using heterodyne phase-locking technique

Electronics letters, 2013-03, Vol.49 (7), p.1-1

2013

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Inverter-based second-order sigma-delta modulator for smart sensors

Electronics letters, 2013-03, Vol.49 (7), p.1-1

2013

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Multi-function ESD protection circuit for UHF RFID devices in CMOS technology

Electronics letters, 2013-03, Vol.49 (7), p.1-1

2013

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High-performance bulk silicon interdigital capacitive temperature sensor based on graphene oxide

Electronics letters, 2013-03, Vol.49 (7), p.1-1

2013

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Cryo-CMOS Circuits and Systems for Quantum Computing Applications

IEEE journal of solid-state circuits, 2018-01, Vol.53 (1), p.309-321

2018

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3-10 GHz self-biased resistive-feedback LNA with inductive source degeneration

Electronics letters, 2013-03, Vol.49 (6), p.1-1

2013

Volltextzugriff (PDF)

CMOS 45 GHz vector modulator with gain/phase correction through calibration

Electronics letters, 2013-02, Vol.49 (4), p.1-1

2013

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Duty-cycle detector based on time-to-digital conversion

Electronics letters, 2013-02, Vol.49 (4), p.1-1

Ravezzi, L

2013

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Corrections to “A Highly Linear and Efficient 28-GHz PA With a P ₛₐₜ of 23.2 dBm, P ₁ dB of 22.7 dBm, and PAE of 35.5% in 65-nm Bulk CMOS” [early access, doi: 10.1109/JSSC.2020.3036830]

64/50 dBc Over the First/Second Nyquist Zone

A Process and Temperature Insensitive CMOS Linear TIA for 100 Gb/s/[Formula Omitted] PAM-4 Optical Links

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Manuscript Submission Guidelines

A 0.8-V 230- mu W 98-dB DR Inverter-Based capital sigma Delta Modulator for Audio Applications

Navodila za avtorje

Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

High-efficiency fast-transient-response V super( 2)-controlled boost converter with small ESR capacitor

Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

0.6mW 6.3 GHz 40nm CMOS divide-by-2/3 prescaler using heterodyne phase-locking technique

Inverter-based second-order sigma-delta modulator for smart sensors

Multi-function ESD protection circuit for UHF RFID devices in CMOS technology

High-performance bulk silicon interdigital capacitive temperature sensor based on graphene oxide

Cryo-CMOS Circuits and Systems for Quantum Computing Applications

3-10 GHz self-biased resistive-feedback LNA with inductive source degeneration

CMOS 45 GHz vector modulator with gain/phase correction through calibration

Duty-cycle detector based on time-to-digital conversion

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