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Systematic x-ray photoelectron spectroscopic study of La1−xSrx-based perovskite-type oxides

Surface and interface analysis, 2002-05, Vol.33 (5), p.414-425

van der Heide, P. A. W.

2002

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4d core hole formation in silver and its role in Ag − secondary ion formation/survival

Applied surface science, 2006-07, Vol.252 (19), p.6433-6435

van der Heide, P.A.W.

2006

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Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1 keV Cs + impact

Applied surface science, 2006-07, Vol.252 (19), p.6456-6458

van der Heide, P.A.W.

2006

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SIMS imaging of insulator surfaces

Surface and interface analysis, 1993-11, Vol.20 (12), p.1000-1006

1993

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Topographic Correction of 3D SIMS Images

Surface and interface analysis, 1997-09, Vol.25 (10), p.788-789

1997

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Incorporation of Titanium into Mesoporous Silica Molecular Sieve SBA-15

Chemistry of materials, 1999-12, Vol.11 (12), p.3680-3686

1999

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Multiplet splitting patterns exhibited by the first row transition metal oxides in X-ray photoelectron spectroscopy

Journal of electron spectroscopy and related phenomena, 2008-07, Vol.164 (1), p.8-18

van der Heide, P.A.W.

2008

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The infinite velocity method: A new method for SIMS quantification

Surface and interface analysis, 1994-11, Vol.21 (11), p.747-757

1994

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Characterization of porous titania glass: Raman, x-ray diffraction and x-ray photoelectron spectroscopic studies

Journal of Raman spectroscopy, 1992-03, Vol.23 (3), p.161-166

1992

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Oxidation Kinetics of Mg-, Si-, and Fe-Implanted Aluminum by Using X-ray Photoelectron Spectroscopy

The journal of physical chemistry. B, 1999-04, Vol.103 (13), p.2402-2407

1999

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X-ray photoelectron spectroscopic and ion scattering study of the SrTiO3(001) surface

Surface science, 2001-02, Vol.473 (1-2), p.59-70

2001

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Charge stabilization and ion trapping under specimen isolation conditions during Sims analysis

Surface and interface analysis, 1992-04, Vol.18 (4), p.262-268

1992

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Single-Molecule I2@US-Tube Nanocapsules: A New X-ray Contrast-Agent Design

Advanced materials (Weinheim), 2007-02, Vol.19 (4), p.573-576

2007

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A systematic study of the characteristic velocities of the negative secondary ion emissions of H, O and matrix species from Sc, Ti, V, Co, Ni and Cu substrates

Surface science, 1996-09, Vol.365 (2), p.473-488

van der Heide, P.A.W.

1996

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Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1keV Cs+ impact

Applied surface science, 2006-07, Vol.252 (19), p.6456-6458

van der Heide, P.A.W.

2006

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Secondary ion formation/survival during the initial stages of sputtering Si and SiO2 with Cs

Surface science, 2004-04, Vol.555 (1-3), p.193-208

VAN DER HEIDE, P. A. W

2004

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Surface core level shifts in photo-electron spectra from the Ca, Sr and Ba titanates

Surface science, 2001-09, Vol.490 (3), p.L619-L626

van der Heide, P.A.W.

2001

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Quantitative SIMS analysis of trace Au in pyrite using the infinite velocity (IV) method

Journal of geochemical exploration, 1998-03, Vol.60 (3), p.241-247

1998

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Secondary ion emission and work function measurements over the transient region from n and p type Si under Cs + irradiation

Applied surface science, 2004-06, Vol.231, p.97-100

van der Heide, P.A.W.

2004

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Work function, valence band and secondary ion intensity variations noted during the initial stages of SIMS depth profiling of Si and SiO2 by Cs

Surface science, 2003-06, Vol.531 (3), p.L369-L377

2003

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Application of the infinite velocity method for quantifying negative secondary ion emissions to multi-layered samples

Surface and interface analysis, 1995-03, Vol.23 (3), p.163-170

1995

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Secondary ion emission from polycrystalline Al under Cs + irradiation

Applied surface science, 2004-06, Vol.231, p.86-89

van der Heide, P.A.W.

2004

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A systematic study of the surface roughening and sputter rate variations occurring during SIMS ultrashallow depth profile analysis of Si with Cs

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2003-02, Vol.201 (2), p.413-425

2003

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Modes of surface exchange in La0.2Sr0.8Cr0.2Fe0.8O3-d

Solid state ionics, 2005-01, Vol.176 (3-4), p.319-323

2005

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Cesium-induced transient effects on the Si+ and Si- secondary ion emissions from Si and SiO2

Surface science, 2000-02, Vol.447 (1-3), p.62-72

VAN DER HEIDE, P. A. W

2000

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Systematic x-ray photoelectron spectroscopic study of La1−xSrx-based perovskite-type oxides

4d core hole formation in silver and its role in Ag − secondary ion formation/survival

Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1 keV Cs + impact

SIMS imaging of insulator surfaces

Topographic Correction of 3D SIMS Images

Incorporation of Titanium into Mesoporous Silica Molecular Sieve SBA-15

Multiplet splitting patterns exhibited by the first row transition metal oxides in X-ray photoelectron spectroscopy

The infinite velocity method: A new method for SIMS quantification

Characterization of porous titania glass: Raman, x-ray diffraction and x-ray photoelectron spectroscopic studies

Oxidation Kinetics of Mg-, Si-, and Fe-Implanted Aluminum by Using X-ray Photoelectron Spectroscopy

X-ray photoelectron spectroscopic and ion scattering study of the SrTiO3(001) surface

Charge stabilization and ion trapping under specimen isolation conditions during Sims analysis

Single-Molecule I2@US-Tube Nanocapsules: A New X-ray Contrast-Agent Design

A systematic study of the characteristic velocities of the negative secondary ion emissions of H, O and matrix species from Sc, Ti, V, Co, Ni and Cu substrates

Characterizing SIMS transient effects apparent in matrix secondary ion signals from silicon under 1keV Cs+ impact

Secondary ion formation/survival during the initial stages of sputtering Si and SiO2 with Cs

Surface core level shifts in photo-electron spectra from the Ca, Sr and Ba titanates

Quantitative SIMS analysis of trace Au in pyrite using the infinite velocity (IV) method

Secondary ion emission and work function measurements over the transient region from n and p type Si under Cs + irradiation

Work function, valence band and secondary ion intensity variations noted during the initial stages of SIMS depth profiling of Si and SiO2 by Cs

Application of the infinite velocity method for quantifying negative secondary ion emissions to multi-layered samples

Secondary ion emission from polycrystalline Al under Cs + irradiation

A systematic study of the surface roughening and sputter rate variations occurring during SIMS ultrashallow depth profile analysis of Si with Cs

Modes of surface exchange in La0.2Sr0.8Cr0.2Fe0.8O3-d

Cesium-induced transient effects on the Si+ and Si- secondary ion emissions from Si and SiO2

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