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Electron Microscopy: Principles and Fundamentals

2008

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In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines

Journal of applied physics, 2001-07, Vol.90 (1), p.167-174

2001

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A Structure Model and Growth Mechanism for Multishell Carbon Nanotubes

Science (American Association for the Advancement of Science), 1995-03, Vol.267 (5202), p.1334-1338

1995

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The study of carbon nanotubules produced by catalytic method

Chemical physics letters, 1994-06, Vol.223 (4), p.329-335

1994

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Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays

Applied physics letters, 1999-11, Vol.75 (19), p.2912-2914

1999

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Postoperative Management for Articular Cartilage Surgery in the Knee

The Journal of knee surgery, 2021-01, Vol.34 (1), p.20-29

2021

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Structural characterization of Nb–TiO2 nanosized thick-films for gas sensing application

Sensors and actuators. B, Chemical, 2000-08, Vol.68 (1-3), p.140-145

2000

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The Texture of Catalytically Grown Coil-Shaped Carbon Nanotubules

Europhysics letters, 1994-07, Vol.27 (2), p.141-146

1994

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Intensity Profiles for Fringe Patterns Due to Planar Interfaces as Observed by Electron Microscopy

September 1, 2021, Vol.11, Number 1, p.693-714

2021

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Optical spectroscopy of oxygen precipitates in heavily doped p-type silicon

Journal of physics. Condensed matter, 2002-12, Vol.14 (48), p.13185-13193

2002

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Microstructure and spectroscopy studies on cubic boron nitride synthesized under high-pressure conditions

Journal of physics. Condensed matter, 2002-11, Vol.14 (44), p.10983-10988

2002

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TEM Study on Precipitation Behavior in Cu-Co Alloys

Physica status solidi. A, Applied research, 1998-07, Vol.168 (1), p.27-35

1998

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In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates

Journal of materials research, 2001-03, Vol.16 (3), p.701-708

2001

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Transmission electron microscopy studies of (111) twinned silver halide microcrystals

Microscopy research and technique, 1998-07, Vol.42 (2), p.85-99

1998

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Evolution of Crystallographic Phases in (Sr1−xCax)TiO3 with Composition (x)

Journal of solid state chemistry, 2001-11, Vol.162 (1), p.20-28

2001

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Conical, helically wound, graphite whiskers: a limiting member of the “fullerenes”?

Journal of crystal growth, 1992-08, Vol.121 (4), p.543-558

1992

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Handbook of microscopy: applications in materials science, solid-state physics and chemistry

2008

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Handbook of Microscopy, Handbook of Microscopy: Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II

1. Aufl., 2008

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TEM study and Monte-Carlo simulation of nano-scale Co particles precipitated in a Cu matrix

Physica status solidi. A, Applied research, 2003-08, Vol.198 (2), p.436-442

2003

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On the mechanism of {111}-defect formation in silicon studied by in situ electron irradiation in a high resolution electron microscope

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1998-02, Vol.77 (2), p.423-435

1998

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Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques

Journal of applied physics, 2002-02, Vol.91 (4), p.2493-2498

2002

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Nanocrystalline diamond films: transmission electron microscopy and Raman spectroscopy characterization

Diamond and related materials, 1997, Vol.6 (1), p.159-168

1997

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Gallium colloid formation during ion implantation of glass

Journal of non-crystalline solids, 1995, Vol.180 (2), p.266-274

1995

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The formation of 3C-SiC in crystalline Si by carbon implantation at 950°C and annealing — a structural study

Journal of crystal growth, 1997-11, Vol.181 (3), p.218-228

1997

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Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer

Applied physics letters, 2000-07, Vol.77 (4), p.507-509

2000

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Electron Microscopy: Principles and Fundamentals

In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines

A Structure Model and Growth Mechanism for Multishell Carbon Nanotubes

The study of carbon nanotubules produced by catalytic method

Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays

Postoperative Management for Articular Cartilage Surgery in the Knee

Structural characterization of Nb–TiO2 nanosized thick-films for gas sensing application

The Texture of Catalytically Grown Coil-Shaped Carbon Nanotubules

Intensity Profiles for Fringe Patterns Due to Planar Interfaces as Observed by Electron Microscopy

Optical spectroscopy of oxygen precipitates in heavily doped p-type silicon

Microstructure and spectroscopy studies on cubic boron nitride synthesized under high-pressure conditions

TEM Study on Precipitation Behavior in Cu-Co Alloys

In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates

Transmission electron microscopy studies of (111) twinned silver halide microcrystals

Evolution of Crystallographic Phases in (Sr1−xCax)TiO3 with Composition (x)

Conical, helically wound, graphite whiskers: a limiting member of the “fullerenes”?

Handbook of microscopy: applications in materials science, solid-state physics and chemistry

Handbook of Microscopy, Handbook of Microscopy: Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II

TEM study and Monte-Carlo simulation of nano-scale Co particles precipitated in a Cu matrix

On the mechanism of {111}-defect formation in silicon studied by in situ electron irradiation in a high resolution electron microscope

Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques

Nanocrystalline diamond films: transmission electron microscopy and Raman spectroscopy characterization

Gallium colloid formation during ion implantation of glass

The formation of 3C-SiC in crystalline Si by carbon implantation at 950°C and annealing — a structural study

Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer

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