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Visualizing the Electron Wind Force in the Elastic Regime

Nano letters, 2021-12, Vol.21 (24), p.10172-10177

2021

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Orientation‐Controlled Selective‐Area Epitaxy of III–V Nanowires on (001) Silicon for Silicon Photonics

Advanced functional materials, 2020-07, Vol.30 (30), p.n/a

2020

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Differential electron yield imaging with STXM

Ultramicroscopy, 2021-03, Vol.222 (C), p.113198-113198, Article 113198

2021

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Mapping Electronic State Changes with STEM EBIC

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.1396-1397

2019

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Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.1618-1619

2019

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Planarization and Processing of Metamorphic Buffer Layers Grown by Hydride Vapor-Phase Epitaxy

Journal of electronic materials, 2014-04, Vol.43 (4), p.873-878

2014

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Imaging Electrically-Active Defects in Gallium Arsenide and Cobalt Nanowire Devices

Zutter, Brian

2021

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ProQuest

Heavy-Ion-Induced Displacement Damage Effects on WOx ECRAM

IEEE transactions on nuclear science, 2024-04, p.1-1

2024

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IEEE_Xplore

Silicon Photonics: Orientation‐Controlled Selective‐Area Epitaxy of III–V Nanowires on (001) Silicon for Silicon Photonics (Adv. Funct. Mater. 30/2020)

Advanced functional materials, 2020-07, Vol.30 (30), p.n/a

2020

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Silicon Photonics: Orientation‐Controlled Selective‐Area Epitaxy of III–V Nanowires on

Advanced functional materials, 2020-07, Vol.30 (30)

2020

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Single-Particle Measurements Reveal the Origin of Low Solar-to-Hydrogen Efficiency of Rh-Doped SrTiO 3 Photocatalysts

ACS nano, 2023-05, Vol.17 (10), p.9405-9414

2023

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Plasmon Energy Mapping in Aluminum and Indium with Sub-Nanometer Resolution

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.378-379

2017

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Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.2068-2069

2021

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Single-Particle Measurements Reveal the Origin of Low Solar-to-Hydrogen Efficiency of Rh-Doped SrTiO3 Photocatalysts

ACS nano, 2023-05, Vol.17 (10), p.9405-9414

2023

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Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.152-154

2020

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Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.194-195

2020

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Fingerprinting the Phases of Thin Film Ge 2 Sb 2 Te 5 with EELS

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.904-905

2020

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In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.168-169

2021

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Modern STEM EBIC: Emerging Modes and Methods

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.2350-2352

2021

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Patterned Adhesion Layer Enables Rugged Pd-MIS Hydrogen Sensors

ACS applied materials & interfaces, 2023-09, Vol.15 (35), p.41598-41605

2023

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Thermometry of Silicon Nanoparticles

Physical review applied, 2018-01, Vol.9 (1), Article 014005

2018

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Differential electron yield imaging with STXM

Ultramicroscopy, 2020-12, Vol.222

2020

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Electron-Transparent Thermoelectric Coolers Demonstrated with Nanoparticle and Condensation Thermometry

ACS nano, 2020-09, Vol.14 (9), p.11510-11517

2020

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Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

Microscopy and microanalysis, 2020-08, Vol.26 (S2), p.904-905

2020

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In Situ Visualization of the Electron Wind Force in the Elastic Regime

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.106-107

2021

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Visualizing the Electron Wind Force in the Elastic Regime

Orientation‐Controlled Selective‐Area Epitaxy of III–V Nanowires on (001) Silicon for Silicon Photonics

Differential electron yield imaging with STXM

Mapping Electronic State Changes with STEM EBIC

Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam

Planarization and Processing of Metamorphic Buffer Layers Grown by Hydride Vapor-Phase Epitaxy

Imaging Electrically-Active Defects in Gallium Arsenide and Cobalt Nanowire Devices

Heavy-Ion-Induced Displacement Damage Effects on WOx ECRAM

Silicon Photonics: Orientation‐Controlled Selective‐Area Epitaxy of III–V Nanowires on (001) Silicon for Silicon Photonics (Adv. Funct. Mater. 30/2020)

Silicon Photonics: Orientation‐Controlled Selective‐Area Epitaxy of III–V Nanowires on

Single-Particle Measurements Reveal the Origin of Low Solar-to-Hydrogen Efficiency of Rh-Doped SrTiO 3 Photocatalysts

Plasmon Energy Mapping in Aluminum and Indium with Sub-Nanometer Resolution

Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)

Single-Particle Measurements Reveal the Origin of Low Solar-to-Hydrogen Efficiency of Rh-Doped SrTiO3 Photocatalysts

Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM

Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging

Fingerprinting the Phases of Thin Film Ge 2 Sb 2 Te 5 with EELS

In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress

Modern STEM EBIC: Emerging Modes and Methods

Patterned Adhesion Layer Enables Rugged Pd-MIS Hydrogen Sensors

Thermometry of Silicon Nanoparticles

Differential electron yield imaging with STXM

Electron-Transparent Thermoelectric Coolers Demonstrated with Nanoparticle and Condensation Thermometry

Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

In Situ Visualization of the Electron Wind Force in the Elastic Regime

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