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Upper bounds for the number of isolated critical points via the Thom–Milnor theorem

Analysis and mathematical physics, 2023-10, Vol.13 (5), Article 81

Zolotov, Vladimir

2023

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Statistical Path Selection for At-Speed Test

IEEE transactions on computer-aided design of integrated circuits and systems, 2010-05, Vol.29 (5), p.749-759

2010

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Markov type constants, flat tori and Wasserstein spaces

Geometriae dedicata, 2018-08, Vol.195 (1), p.249-263

Zolotov, Vladimir

2018

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FINITE FLAT SPACES

Mathematika, 2019, Vol.65 (4), p.1010-1017

Zolotov, Vladimir

2019

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Bipolar comparison

Geometric and functional analysis, 2019-02, Vol.29 (1), p.258-282

2019

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Self-Contracted Curves in Spaces With Weak Lower Curvature Bound

International mathematics research notices, 2021-06, Vol.2021 (11), p.8623-8656

2021

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Criticality computation in parameterized statistical timing

Annual ACM IEEE Design Automation Conference: Proceedings of the 43rd annual conference on Design automation; 24-28 July 2006, 2006, p.63-68

2006

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Statistical multilayer process space coverage for at-speed test

2009 46th ACM/IEEE Design Automation Conference, 2009, p.340-345

2009

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Robust Extraction of Spatial Correlation

IEEE transactions on computer-aided design of integrated circuits and systems, 2007-04, Vol.26 (4), p.619-631

2007

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Circuit optimization using statistical static timing analysis

Annual ACM IEEE Design Automation Conference: Proceedings of the 42nd annual conference on Design automation; 13-17 June 2005, 2005, p.321-324

2005

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Variation aware cross-talk aggressor alignment by mixed integer linear programming

2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC), 2015, p.1-6

2015

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Computation and Refinement of Statistical Bounds on Circuit Delay

Annual ACM IEEE Design Automation Conference: Proceedings of the 40th conference on Design automation; 02-06 June 2003, 2003, p.348-353

2003

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Point Charges and Polygonal Linkages

Journal of dynamical and control systems, 2017, Vol.23 (1), p.1-17

2017

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Optimal Margin Computation for At-Speed Test

2008 Design, Automation and Test in Europe, 2008, p.622-627

2008

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Testability-Driven Statistical Path Selection

IEEE transactions on computer-aided design of integrated circuits and systems, 2012-08, Vol.31 (8), p.1275-1287

2012

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Statistical timing analysis using bounds and selective enumeration

IEEE transactions on computer-aided design of integrated circuits and systems, 2003-09, Vol.22 (9), p.1243-1260

2003

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Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator

IEEE transactions on computer-aided design of integrated circuits and systems, 2012-04, Vol.31 (4), p.497-508

2012

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Order statistics for correlated random variables and its application to at-speed testing

ACM transactions on design automation of electronic systems, 2013-07, Vol.18 (3), p.1-20

2013

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Optimal statistical chip disposition

Proceedings of the International Conference on Computer-Aided Design, 2011, p.95-102

2011

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Transistor sizing of custom high-performance digital circuits with parametric yield considerations

Optimization and engineering, 2014-03, Vol.15 (1), p.217-241

2014

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Generation and use of statistical timing macro-models considering slew and load variability

2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2016, p.1-6

2016

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Parameterized block-based statistical timing analysis with non-gaussian parameters, nonlinear delay functions

Proceedings of the 42nd annual Design Automation Conference, 2005, p.71-76

2005

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Sharing and Re-use of Statistical Timing Macro-Models across Multiple Voltage Domains

2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID), 2016, p.493-498

2016

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Optimal Test Margin Computation for At-Speed Structural Test

IEEE transactions on computer-aided design of integrated circuits and systems, 2009-09, Vol.28 (9), p.1414-1423

2009

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Practical statistical static timing analysis with current source models

2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC), 2016, p.1-6

2016

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Upper bounds for the number of isolated critical points via the Thom–Milnor theorem

Statistical Path Selection for At-Speed Test

Markov type constants, flat tori and Wasserstein spaces

FINITE FLAT SPACES

Bipolar comparison

Self-Contracted Curves in Spaces With Weak Lower Curvature Bound

Criticality computation in parameterized statistical timing

Statistical multilayer process space coverage for at-speed test

Robust Extraction of Spatial Correlation

Circuit optimization using statistical static timing analysis

Variation aware cross-talk aggressor alignment by mixed integer linear programming

Computation and Refinement of Statistical Bounds on Circuit Delay

Point Charges and Polygonal Linkages

Optimal Margin Computation for At-Speed Test

Testability-Driven Statistical Path Selection

Statistical timing analysis using bounds and selective enumeration

Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator

Order statistics for correlated random variables and its application to at-speed testing

Optimal statistical chip disposition

Transistor sizing of custom high-performance digital circuits with parametric yield considerations

Generation and use of statistical timing macro-models considering slew and load variability

Parameterized block-based statistical timing analysis with non-gaussian parameters, nonlinear delay functions

Sharing and Re-use of Statistical Timing Macro-Models across Multiple Voltage Domains

Optimal Test Margin Computation for At-Speed Structural Test

Practical statistical static timing analysis with current source models

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