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Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier

Applied physics letters, 2020-07, Vol.117 (1)

2020

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Oxide thickness-dependent resistive switching characteristics of Cu/HfO2/Pt ECM devices

Applied physics letters, 2023-01, Vol.122 (2)

2023

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Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices

Advanced electronic materials, 2019-10, Vol.5 (10), p.n/a

2019

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Enabling nanoscale flexoelectricity at extreme temperature by tuning cation diffusion

Nature communications, 2018-10, Vol.9 (1), p.4445-8, Article 4445

2018

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Piezoelectricity and rotostriction through polar and non-polar coupled instabilities in bismuth-based piezoceramics

Scientific reports, 2016-07, Vol.6 (1), p.28742-28742, Article 28742

2016

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Controlling the Formation of Conductive Pathways in Memristive Devices

Advanced science, 2022-11, Vol.9 (33), p.e2201806-n/a

2022

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Enhanced Conductivity and Microstructure in Highly Textured TiN1–x /c‑Al2O3 Thin Films

ACS omega, 2022-01, Vol.7 (2), p.2041-2048

2022

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Operando two-terminal devices inside a transmission electron microscope

Communications engineering, 2023-11, Vol.2 (1), p.83-8, Article 83

2023

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Defect-Stabilized Substoichiometric Polymorphs of Hafnium Oxide with Semiconducting Properties

ACS applied materials & interfaces, 2022-01, Vol.14 (1), p.1290-1303

2022

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Inkjet‐Printed Tungsten Oxide Memristor Displaying Non‐Volatile Memory and Neuromorphic Properties (Adv. Funct. Mater. 20/2024)

Advanced functional materials, 2024-05, Vol.34 (20), p.n/a

2024

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Inkjet‐Printed Tungsten Oxide Memristor Displaying Non‐Volatile Memory and Neuromorphic Properties

Advanced functional materials, 2024-05, Vol.34 (20), p.n/a

2024

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Photothermal catalytic properties of layered titanium chalcogenide nanomaterials

Dalton transactions : an international journal of inorganic chemistry, 2020-01, Vol.49 (4), p.132-147

2020

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Ferromagnetic Mn–Al–C L1 0 Formation by Electric Current Assisted Annealing

Advanced engineering materials, 2023-09, Vol.25 (18)

2023

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Sol–gel based synthesis and enhanced processability of MAX phase Cr2GaC

Journal of materials chemistry. C, Materials for optical and electronic devices, 2019, Vol.7 (20)

2019

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Translational Antiphase Boundaries in NaNbO 3 Antiferroelectrics

ACS applied materials & interfaces, 2023-12, Vol.15 (51), p.59964-59972

2023

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Temperature-Dependent Evolution of Crystallographic and Domain Structures in (K,Na,Li)(Ta,Nb)O 3 Piezoelectric Single Crystals

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2018-09, Vol.65 (9), p.1508-1516

2018

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Texture Transfer in Dielectric Layers via Nanocrystalline Networks: Insights from in Situ 4D-STEM

Nano letters, 2024-03, Vol.24 (10), p.2998-3004

2024

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Temperature-Dependent Evolution of Crystallographic and Domain Structures in (K,Na,Li)(Ta,Nb)O3 Piezoelectric Single Crystals

IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2018-09, Vol.65 (9), p.1508-1516

2018

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Gradual reset and set characteristics in yttrium oxide based resistive random access memory

Semiconductor science and technology, 2019-07, Vol.34 (7), p.75008

2019

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Conformal Solution Deposition of Pt-Pd Titania Nanocomposite Coatings for Light-Assisted Formic Acid Electro-Oxidation

ACS applied materials & interfaces, 2019-11, Vol.11 (46), p.43081-43092

2019

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Weld-free mounting of lamellae for electrical biasing operando TEM

Ultramicroscopy, 2024-06, Vol.260, p.113939-113939, Article 113939

2024

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Translational Antiphase Boundaries in NaNbO3 Antiferroelectrics

ACS applied materials & interfaces, 2023-12, Vol.15 (51), p.59964-59972

2023

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In Situ Study of the Activation Process of MOF-74 Using Three-Dimensional Electron Diffraction

Chemistry of materials, 2024-08, Vol.36 (15), p.7274-7282

2024

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Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO 2 Based Memristors

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.1238-1239

2021

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Martensitic phase transformation in short-range ordered Fe50Rh50 system induced by thermal stress and mechanical deformation

Acta materialia, 2024-01, Vol.264, p.119577, Article 119577

2024

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Enhanced thermal stability of yttrium oxide-based RRAM devices with inhomogeneous Schottky-barrier

Oxide thickness-dependent resistive switching characteristics of Cu/HfO2/Pt ECM devices

Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices

Enabling nanoscale flexoelectricity at extreme temperature by tuning cation diffusion

Piezoelectricity and rotostriction through polar and non-polar coupled instabilities in bismuth-based piezoceramics

Controlling the Formation of Conductive Pathways in Memristive Devices

Enhanced Conductivity and Microstructure in Highly Textured TiN1–x /c‑Al2O3 Thin Films

Operando two-terminal devices inside a transmission electron microscope

Defect-Stabilized Substoichiometric Polymorphs of Hafnium Oxide with Semiconducting Properties

Inkjet‐Printed Tungsten Oxide Memristor Displaying Non‐Volatile Memory and Neuromorphic Properties (Adv. Funct. Mater. 20/2024)

Inkjet‐Printed Tungsten Oxide Memristor Displaying Non‐Volatile Memory and Neuromorphic Properties

Photothermal catalytic properties of layered titanium chalcogenide nanomaterials

Ferromagnetic Mn–Al–C L1 0 Formation by Electric Current Assisted Annealing

Sol–gel based synthesis and enhanced processability of MAX phase Cr2GaC

Translational Antiphase Boundaries in NaNbO 3 Antiferroelectrics

Temperature-Dependent Evolution of Crystallographic and Domain Structures in (K,Na,Li)(Ta,Nb)O 3 Piezoelectric Single Crystals

Texture Transfer in Dielectric Layers via Nanocrystalline Networks: Insights from in Situ 4D-STEM

Temperature-Dependent Evolution of Crystallographic and Domain Structures in (K,Na,Li)(Ta,Nb)O3 Piezoelectric Single Crystals

Gradual reset and set characteristics in yttrium oxide based resistive random access memory

Conformal Solution Deposition of Pt-Pd Titania Nanocomposite Coatings for Light-Assisted Formic Acid Electro-Oxidation

Weld-free mounting of lamellae for electrical biasing operando TEM

Translational Antiphase Boundaries in NaNbO3 Antiferroelectrics

In Situ Study of the Activation Process of MOF-74 Using Three-Dimensional Electron Diffraction

Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO 2 Based Memristors

Martensitic phase transformation in short-range ordered Fe50Rh50 system induced by thermal stress and mechanical deformation

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