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All Silicon Microdisplay Fabricated Utilizing 0.18 μm CMOS-IC With Monolithic Integration

IEEE photonics journal, 2022-04, Vol.14 (2), p.1-5

2022

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Novel Low-Loss Reverse-Conducting Insulated-Gate Bipolar Transitor with Collector-Side Injection-Enhanced Structure

Electronics (Basel), 2024-01, Vol.13 (1), p.23

2024

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Ultra-Low On-Resistance LDMOS With Multi-Plane Electron Accumulation Layers

IEEE electron device letters, 2017-07, Vol.38 (7), p.910-913

2017

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IEEE_Xplore

Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate Irradiation

IEEE access, 2024, Vol.12, p.35410-35416

2024

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RNA-seq of hypo- and hyper-salinity stress-response transcriptome in the liver of greater amberjack (Seriola dumerili) juveniles

Aquaculture reports, 2023-04, Vol.29, p.101498, Article 101498

2023

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New Insights Into Noise Characteristics of Hot Carrier Induced Defects in Polysilicon Emitter Bipolar Junction Transistors and SiGe HBTs

IEEE journal of the Electron Devices Society, 2023, Vol.11, p.30-35

2023

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Identification and expression analysis of thyroid-stimulating hormone β subunit, and effects of T3 on gonadal differentiation-related gene expression in rice field eel, Monopterus albus

Comparative Biochemistry and Physiology Part B: Biochemistry and Molecular Biology, 2022-02, Vol.258, p.110681-110681, Article 110681

2022

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Construction optimization and settlement analysis of Pile Beam Arc method in subway station

Waves in random and complex media, 2022-05, Vol.ahead-of-print (ahead-of-print), p.1-19

2022

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Anomalous TID Susceptibility on Collector Bias for SOI High-Voltage Polysilicon Emitter Bipolar Transistors

IEEE transactions on electron devices, 2024-07, Vol.71 (7), p.4033-4038

2024

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IEEE_Xplore

Ultrafast and Low-Turn-OFF Loss Lateral IEGT With a MOS-Controlled Shorted Anode

IEEE transactions on electron devices, 2019-01, Vol.66 (1), p.533-538

2019

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IEEE_Xplore

Impact of Ring-Shaped Collector Contact on Total Ionizing Dose Susceptibility of Vertical n-p-n Bipolar Transistors

IEEE transactions on nuclear science, 2022-11, Vol.69 (11), p.2222-2228

2022

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A Carrier Stored SOI LIGBT With Ultralow ON-State Voltage and High Current Capability

IEEE transactions on electron devices, 2018-08, Vol.65 (8), p.3365-3370

2018

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IEEE_Xplore

Impact of Ring-shaped Collector Contact on Total Ionizing Dose Susceptibility of Vertical NPN Bipolar Transistors

IEEE transactions on nuclear science, 2022, p.1-1

2022

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IEEE_Xplore

Time-Dependent Hot Carrier Degradation in Polysilicon Emitter Bipolar Transistors Under High Current and Radiation Combined Stress

IEEE transactions on electron devices, 2021-09, Vol.68 (9), p.4208-4213

2021

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IEEE_Xplore

A dependency of emission efficiency of poly-silicon light-emitting device on avalanching current

Optical materials, 2019-02, Vol.88, p.711-717

2019

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A comparison of the effects of cobalt-60 γ ray irradiation on DPSA bipolar transistors at high and low injection levels

Microelectronics and reliability, 2017-04, Vol.71, p.86-90

2017

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Radiated reliability for 0.35μm SiGe BiCMOS technology

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2017, p.1-4

2017

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IEEE_Xplore

Novel fast-switching P-poly trench collector reverse conducting IGBT with different N-buffer position

Microelectronics, 2024-05, Vol.147, p.106190, Article 106190

2024

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Research on Filling Technology of Long Distance Pipeline Casing

Proceedings of 2021 China-Europe International Conference on Pipelines and Trenchless Technology, p.251-257

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A Novel SIT and VDMOS SEB Effects Contrastive Analysis by Numerical Simulation

2018 International Conference on Radiation Effects of Electronic Devices (ICREED), 2018, p.1-4

2018

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Temperature Dependent Reliability of Polysilicon Emitter Bipolar Transistors Under High Current Stress

IEEE transactions on device and materials reliability, 2020-09, Vol.20 (3), p.548-554

2020

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IEEE_Xplore

Impact of Electrical Stress on \gamma Ray Irradiated Double Polysilicon Self-Aligned (DPSA) PNP Bipolar Transistors

IEEE transactions on device and materials reliability, 2019-09, Vol.19 (3), p.494-500

2019

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IEEE_Xplore

Impact of Electrical Stress on [Formula Omitted] Ray Irradiated Double Polysilicon Self-Aligned (DPSA) PNP Bipolar Transistors

IEEE transactions on device and materials reliability, 2019-01, Vol.19 (3), p.494

2019

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State of the Art in Crystallization of LiNbO3 and Their Applications

Molecules (Basel, Switzerland), 2021-11, Vol.26 (22), p.7044

2021

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Solitary solid pulmonary nodules: a CT-based deep learning nomogram helps differentiate tuberculosis granulomas from lung adenocarcinomas

European radiology, 2020-12, Vol.30 (12), p.6497-6507

2020

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All Silicon Microdisplay Fabricated Utilizing 0.18 μm CMOS-IC With Monolithic Integration

Novel Low-Loss Reverse-Conducting Insulated-Gate Bipolar Transitor with Collector-Side Injection-Enhanced Structure

Ultra-Low On-Resistance LDMOS With Multi-Plane Electron Accumulation Layers

Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate Irradiation

RNA-seq of hypo- and hyper-salinity stress-response transcriptome in the liver of greater amberjack (Seriola dumerili) juveniles

New Insights Into Noise Characteristics of Hot Carrier Induced Defects in Polysilicon Emitter Bipolar Junction Transistors and SiGe HBTs

Identification and expression analysis of thyroid-stimulating hormone β subunit, and effects of T3 on gonadal differentiation-related gene expression in rice field eel, Monopterus albus

Construction optimization and settlement analysis of Pile Beam Arc method in subway station

Anomalous TID Susceptibility on Collector Bias for SOI High-Voltage Polysilicon Emitter Bipolar Transistors

Ultrafast and Low-Turn-OFF Loss Lateral IEGT With a MOS-Controlled Shorted Anode

Impact of Ring-Shaped Collector Contact on Total Ionizing Dose Susceptibility of Vertical n-p-n Bipolar Transistors

A Carrier Stored SOI LIGBT With Ultralow ON-State Voltage and High Current Capability

Impact of Ring-shaped Collector Contact on Total Ionizing Dose Susceptibility of Vertical NPN Bipolar Transistors

Time-Dependent Hot Carrier Degradation in Polysilicon Emitter Bipolar Transistors Under High Current and Radiation Combined Stress

A dependency of emission efficiency of poly-silicon light-emitting device on avalanching current

A comparison of the effects of cobalt-60 γ ray irradiation on DPSA bipolar transistors at high and low injection levels

Radiated reliability for 0.35μm SiGe BiCMOS technology

Novel fast-switching P-poly trench collector reverse conducting IGBT with different N-buffer position

Research on Filling Technology of Long Distance Pipeline Casing

A Novel SIT and VDMOS SEB Effects Contrastive Analysis by Numerical Simulation

Temperature Dependent Reliability of Polysilicon Emitter Bipolar Transistors Under High Current Stress

Impact of Electrical Stress on \gamma Ray Irradiated Double Polysilicon Self-Aligned (DPSA) PNP Bipolar Transistors

Impact of Electrical Stress on [Formula Omitted] Ray Irradiated Double Polysilicon Self-Aligned (DPSA) PNP Bipolar Transistors

State of the Art in Crystallization of LiNbO3 and Their Applications

Solitary solid pulmonary nodules: a CT-based deep learning nomogram helps differentiate tuberculosis granulomas from lung adenocarcinomas

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