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Effects of Gamma Irradiation on Magnetic Properties of Double-Interface CoFeB/MgO Multifilms

IEEE transactions on nuclear science, 2019-01, Vol.66 (1), p.77-81

2019

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Development and Challenges of Reliability Modeling from Transistors to Circuits

IEEE journal of the Electron Devices Society, 2023-01, Vol.11, p.1-1

2023

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Radiation impact of swift heavy ion beams on double-interface CoFeB/MgO magnetic tunnel junctions

Applied physics letters, 2020-04, Vol.116 (17)

2020

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A Fast Template Matching Scheme of Visible and Infrared Image under Occluded Scenarios

IEEE access, 2022, Vol.10, p.1-1

2022

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SiC Planar MOSFETs With Built-In Reverse MOS-Channel Diode for Enhanced Performance

IEEE journal of the Electron Devices Society, 2020, Vol.8, p.619-625

2020

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SEU and SET of 65 Bulk CMOS Flip-flops and Their Implications for RHBD

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2666-2672

2015

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A Novel Split-Gate-Trench MOSFET Integrated With Normal Gate and Built-In Channel Diode

IEEE journal of the Electron Devices Society, 2021, Vol.9, p.839-845

2021

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Radiation hardening design for spin-orbit torque magnetic random access memory

2018 IEEE International Symposium on Circuits and Systems (ISCAS), 2018, p.1-4

2018

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High energy proton and heavy ion induced single event transient in 65-nm CMOS technology

Science China. Information sciences, 2017-12, Vol.60 (12), p.119-121, Article 120405

2017

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Experimental Demonstration of Dual-Mode PUF/Memory Based on SOT-MRAM Array

IEEE electron device letters, 2024-10, p.1-1

2024

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SiC Trench MOSFET With Embedded Schottky Super Barrier Rectifier for High Temperature Ruggedness

IEEE transactions on electron devices, 2023-11, Vol.70 (11), p.5786-5794

2023

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SiC Double-Trench MOSFETs With Embedded MOS-Channel Diode

IEEE transactions on electron devices, 2020-02, Vol.67 (2), p.582-587

2020

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A high-efficiency aging test with new data processing method for semiconductor device

Microelectronics and reliability, 2023-04, Vol.143, p.114940, Article 114940

2023

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Multi-bits error detection and fast recovery in RISC cores

Journal of semiconductors, 2015-11, Vol.36 (11), p.106-113

王晶杨星赵元富张伟功申娇邱柯妮

2015

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Degradation of VDMOS Under Simultaneous and Sequential Stress of Gamma Ray Irradiation and Annealing Process

IEEE transactions on electron devices, 2023-06, Vol.70 (6), p.1-9

2023

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Total-Ionizing-Dose Irradiation-Induced Dielectric Field Enhancement for High-Voltage SOI LDMOS

IEEE electron device letters, 2019-04, Vol.40 (4), p.593-596

2019

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22nm FDSOI SRAM single event upset simulation analysis

Journal of physics. Conference series, 2021-05, Vol.1920 (1), p.12069

2021

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Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory

IEEE transactions on circuits and systems. I, Regular papers, 2019-05, Vol.66 (5), p.1853-1862

2019

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An aging simulation method based on the change of input vector inside the critical path

Journal of physics. Conference series, 2024-07, Vol.2791 (1), p.12059

2024

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Radiation Hardened 12T SRAM With Crossbar-Based Peripheral Circuit in 28nm CMOS Technology

IEEE transactions on circuits and systems. I, Regular papers, 2021-07, Vol.68 (7), p.2962-2975

2021

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A multi-parameter fitting method based on matrix transformation for device aging modeling

Microelectronics and reliability, 2023-03, Vol.142, p.114913, Article 114913

2023

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Radiation-Hardening Techniques for Spin Orbit Torque-MRAM Peripheral Circuitry

IEEE transactions on magnetics, 2018-11, Vol.54 (11), p.1-5

2018

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Degradation of Radiation-Hardened Vertical Double-Diffused Metal-Oxide-Semiconductor Field-Effect Transistor During Gamma Ray Irradiation Performed After Heavy Ion Striking

IEEE electron device letters, 2020-02, Vol.41 (2), p.216-219

2020

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Fast template matching in multi-modal image under pixel distribution mapping

Infrared physics & technology, 2022-12, Vol.127, p.104454, Article 104454

2022

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Investigation on Transient Ionizing Radiation Effects in a 4-Mb SRAM With Dual Supply Voltages

IEEE transactions on nuclear science, 2022-03, Vol.69 (3), p.340-348

2022

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Effects of Gamma Irradiation on Magnetic Properties of Double-Interface CoFeB/MgO Multifilms

Development and Challenges of Reliability Modeling from Transistors to Circuits

Radiation impact of swift heavy ion beams on double-interface CoFeB/MgO magnetic tunnel junctions

A Fast Template Matching Scheme of Visible and Infrared Image under Occluded Scenarios

SiC Planar MOSFETs With Built-In Reverse MOS-Channel Diode for Enhanced Performance

SEU and SET of 65 Bulk CMOS Flip-flops and Their Implications for RHBD

A Novel Split-Gate-Trench MOSFET Integrated With Normal Gate and Built-In Channel Diode

Radiation hardening design for spin-orbit torque magnetic random access memory

High energy proton and heavy ion induced single event transient in 65-nm CMOS technology

Experimental Demonstration of Dual-Mode PUF/Memory Based on SOT-MRAM Array

SiC Trench MOSFET With Embedded Schottky Super Barrier Rectifier for High Temperature Ruggedness

SiC Double-Trench MOSFETs With Embedded MOS-Channel Diode

A high-efficiency aging test with new data processing method for semiconductor device

Multi-bits error detection and fast recovery in RISC cores

Degradation of VDMOS Under Simultaneous and Sequential Stress of Gamma Ray Irradiation and Annealing Process

Total-Ionizing-Dose Irradiation-Induced Dielectric Field Enhancement for High-Voltage SOI LDMOS

22nm FDSOI SRAM single event upset simulation analysis

Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin-Orbit Torque Magnetic Random Access Memory

An aging simulation method based on the change of input vector inside the critical path

Radiation Hardened 12T SRAM With Crossbar-Based Peripheral Circuit in 28nm CMOS Technology

A multi-parameter fitting method based on matrix transformation for device aging modeling

Radiation-Hardening Techniques for Spin Orbit Torque-MRAM Peripheral Circuitry

Degradation of Radiation-Hardened Vertical Double-Diffused Metal-Oxide-Semiconductor Field-Effect Transistor During Gamma Ray Irradiation Performed After Heavy Ion Striking

Fast template matching in multi-modal image under pixel distribution mapping

Investigation on Transient Ionizing Radiation Effects in a 4-Mb SRAM With Dual Supply Voltages

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