UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Validation of Retention Modeling as a Trap-Profiling Technique for SiN-Based Charge-Trapping Memories

IEEE electron device letters, 2010-01, Vol.31 (1), p.77-79

2010

Volltextzugriff (PDF)

Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?

IEEE electron device letters, 2005-10, Vol.26 (10), p.773-775

2005

Volltextzugriff (PDF)

Effect of high temperature annealing on tunnel oxide properties in TANOS devices

Microelectronic engineering, 2011-07, Vol.88 (7), p.1155-1158

2011

Volltextzugriff (PDF)

'Holiday sickness'-reported exploratory outcome of over 500 United Kingdom holidaymakers with travellers' diarrhoea

Journal of travel medicine, 2017-01, Vol.24 (1), p.taw077

2017

Volltextzugriff (PDF)

Understanding the potential and limitations of HfAlO as interpoly dielectric in floating-gate Flash memory

Microelectronic engineering, 2009-07, Vol.86 (7), p.1807-1811

2009

Volltextzugriff (PDF)

Impact of process conditions on interface and high-κ trap density studied by variable Tcharge-Tdischarge charge pumping (VT2CP)

Microelectronic engineering, 2007-09, Vol.84 (9-10), p.1951-1955

2007

Volltextzugriff (PDF)

Properties and dynamic behavior of electron traps in HfO2/SiO2 stacks

Microelectronic engineering, 2005-06, Vol.80, p.366-369

2005

Volltextzugriff (PDF)

Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection

Microelectronic engineering, 2007-09, Vol.84 (9), p.1943-1946

2007

Volltextzugriff (PDF)

Hydrogen induced positive charge in Hf-based dielectrics

Microelectronic engineering, 2007-09, Vol.84 (9), p.2354-2357

2007

Volltextzugriff (PDF)

Electron Trap Profiling Near Al2O3/Gate Interface in TANOS Stack Using Gate-Side Trap Spectroscopy by Charge Injection and Sensing

IEEE electron device letters, 2010-10, Vol.31 (10), p.1158-1160

2010

Volltextzugriff (PDF)

An assessment of the location of as-grown electron traps in HfO2/HfSiO stacks

IEEE electron device letters, 2006-10, Vol.27 (10), p.817-820

2006

Volltextzugriff (PDF)

Electron Trap Profiling Near \hbox \hbox/Gate Interface in TANOS Stack Using Gate-Side Trap Spectroscopy by Charge Injection and Sensing

IEEE electron device letters, 2010-10, Vol.31 (10), p.1158-1160

2010

Volltextzugriff (PDF)

Impact of gate materials on positive charge formation in HfO2∕SiO2 stacks

Applied physics letters, 2006-07, Vol.89 (2)

2006

Volltextzugriff (PDF)

Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)

Microelectronic engineering, 2010-12, Vol.87 (12), p.2614-2619

2010

Volltextzugriff (PDF)

Sustaining rice productivity through weather‐resilient agricultural practices

Journal of the science of food and agriculture, 2024-03, Vol.104 (4), p.2303-2313

2024

Volltextzugriff (PDF)

Comparative performance of multiple linear regression and artificial neural network models in estimating solute-transport parameters

Sains Tanah : Jurnal ilmu Tanah dan Agroklimatologi, 2021-06, Vol.18 (1), p.27

2021

Volltextzugriff (PDF)

Optimization of the crystallization phase of Rare-Earth aluminates For blocking dielectric application in TANOS type flash memories

2010 Proceedings of the European Solid State Device Research Conference, 2010, p.440-443

2010

Volltextzugriff (PDF)

Mapping of Agricultural Drought in Bangladesh using Geographic Information System (GIS)

Earth systems and environment, 2022-09, Vol.6 (3), p.657-667

2022

Volltextzugriff (PDF)

Determination of capture cross sections for as-grown electron traps in HfO2∕HfSiO stacks

Journal of applied physics, 2006-11, Vol.100 (9)

2006

Volltextzugriff (PDF)

Evaluating the performance of Andrographis paniculata leaves extract as additive for corrosion protection of stainless steel 316L in seawater

International journal of corrosion and scale inhibition, 2020-01, Vol.9 (1)

2020

Volltextzugriff (PDF)

Relation of reactive solute-transport parameters to basic soil properties

Eurasian journal of soil science, 2018-10, Vol.7 (4), p.326-336

2018

Volltextzugriff (PDF)

First-principles modeling of intrinsic and extrinsic defects in γ-Al2O3

Applied physics letters, 2010-11, Vol.97 (21)

2010

Volltextzugriff (PDF)

Pedo-transfer functions with multiple linear regressions to predict solute-transport parameters

Eurasian journal of soil science, 2019-07, Vol.8 (3), p.196-207

2019

Volltextzugriff (PDF)

Comprehensive investigation of on-state stress on D-mode AlGaN/GaN MIS-HEMTs

2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.3C.5.1-3C.5.7

2013

Volltextzugriff (PDF)

High Performance THANVaS Memories for MLC Charge Trap NAND Flash

2011 3rd IEEE International Memory Workshop (IMW), 2011, p.1-4

2011

Volltextzugriff (PDF)

1 – 25 von 581

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(483)
Mit Volltextzugriff
(505)

Publikationsform

1 weiteren anzeigen...

Weniger anzeigen...

Sprache

2 weitere anzeigen...

Weniger anzeigen...

Erscheinungsjahr

n.n

Thema

15 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 30 Tagen
(1)
... seit 90 Tagen
(10)

Menü

Weitere Dienste

Einstellungen

Validation of Retention Modeling as a Trap-Profiling Technique for SiN-Based Charge-Trapping Memories

Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?

Effect of high temperature annealing on tunnel oxide properties in TANOS devices

'Holiday sickness'-reported exploratory outcome of over 500 United Kingdom holidaymakers with travellers' diarrhoea

Understanding the potential and limitations of HfAlO as interpoly dielectric in floating-gate Flash memory

Impact of process conditions on interface and high-κ trap density studied by variable Tcharge-Tdischarge charge pumping (VT2CP)

Properties and dynamic behavior of electron traps in HfO2/SiO2 stacks

Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection

Hydrogen induced positive charge in Hf-based dielectrics

Electron Trap Profiling Near Al2O3/Gate Interface in TANOS Stack Using Gate-Side Trap Spectroscopy by Charge Injection and Sensing

An assessment of the location of as-grown electron traps in HfO2/HfSiO stacks

Electron Trap Profiling Near \hbox \hbox/Gate Interface in TANOS Stack Using Gate-Side Trap Spectroscopy by Charge Injection and Sensing

Impact of gate materials on positive charge formation in HfO2∕SiO2 stacks

Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)

Sustaining rice productivity through weather‐resilient agricultural practices

Comparative performance of multiple linear regression and artificial neural network models in estimating solute-transport parameters

Optimization of the crystallization phase of Rare-Earth aluminates For blocking dielectric application in TANOS type flash memories

Mapping of Agricultural Drought in Bangladesh using Geographic Information System (GIS)

Determination of capture cross sections for as-grown electron traps in HfO2∕HfSiO stacks

Evaluating the performance of Andrographis paniculata leaves extract as additive for corrosion protection of stainless steel 316L in seawater

Relation of reactive solute-transport parameters to basic soil properties

First-principles modeling of intrinsic and extrinsic defects in γ-Al2O3

Pedo-transfer functions with multiple linear regressions to predict solute-transport parameters

Comprehensive investigation of on-state stress on D-mode AlGaN/GaN MIS-HEMTs

High Performance THANVaS Memories for MLC Charge Trap NAND Flash

Suchergebnisse filtern