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Mouse Models for Studying Oral Cancer: Impact in the Era of Cancer Immunotherapy

Journal of Dental Research, 2018-06, Vol.97 (6), p.683-690

2018

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Texture analysis in non-contrast enhanced CT: Impact of malignancy on texture in apparently disease-free areas of the liver

European journal of radiology, 2009-04, Vol.70 (1), p.101-110

2009

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Global strain field mapping of a particle-laden interface using digital image correlation

Journal of colloid and interface science, 2018-01, Vol.509, p.94-101

2018

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Experimental Evidence of the Fast and Slow Charge Trapping/Detrapping Processes in High- k Dielectrics Subjected to PBTI Stress

IEEE electron device letters, 2008-02, Vol.29 (2), p.180-182

2008

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Anaesthetic care for surgical management of adolescent idiopathic scoliosis

BJA education, 2019-07, Vol.19 (7), p.232-237

2019

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In Search of Biologic Correlates for Liver Texture on Portal-Phase CT

Academic radiology, 2007-09, Vol.14 (9), p.1058-1068

2007

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Extraction of the Threshold-Voltage Shift by the Single-Pulse Technique

IEEE electron device letters, 2007-08, Vol.28 (8), p.734-736

2007

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Grey-matter texture abnormalities and reduced hippocampal volume are distinguishing features of schizophrenia

Psychiatry research. Neuroimaging, 2014-09, Vol.223 (3), p.179-186

2014

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Effects of ALD HfO2 thickness on charge trapping and mobility

Microelectronic engineering, 2005-06, Vol.80, p.218-221

2005

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A novel bias temperature instability characterization methodology for high-k nMOSFETs

IEEE electron device letters, 2006-10, Vol.27 (10), p.849-851

2006

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High-k gate stacks for planar, scaled CMOS integrated circuits

Microelectronic engineering, 2003-09, Vol.69 (2), p.152-167

2003

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Correcting effective mobility measurements for the presence of significant gate leakage current

IEEE electron device letters, 2003-04, Vol.24 (4), p.275-277

2003

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Investigating interface states and oxide traps in the MoS2/oxide/Si system

Solid-state electronics, 2021-12, Vol.186, p.108123, Article 108123

2021

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Decoupling of cold-carrier effects in hot-carrier reliability assessment of HfO/sub 2/ gated nMOSFETs

IEEE electron device letters, 2006-08, Vol.27 (8), p.662-664

2006

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Macrophages Promote Growth of Squamous Cancer Independent of T cells

Journal of dental research, 2019-07, Vol.98 (8), p.896-903

2019

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Spatial Distributions of Trapping Centers in \hbox/\hbox Gate Stack

IEEE transactions on electron devices, 2007-06, Vol.54 (6), p.1338-1345

2007

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Response to Letter to the Editor: “Macrophages Promote Growth of Squamous Cancer Independent of T Cells”

Journal of dental research, 2019-11, Vol.98 (12), p.1398-1398

2019

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Short communication: A reproductive tract scoring system to manage fertility in lactating dairy cows

Journal of dairy science, 2017-07, Vol.100 (7), p.5922-5927

2017

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Impact of Al2O3 deposition temperature on the performance and initial stability of nanocrystalline ZnO thin-film transistors

Microelectronic engineering, 2019-09, Vol.217, p.111114, Article 111114

2019

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Deconvolution of Hot Carrier and Cold Carrier Injection in ZnO TFTs

2020 IEEE Silicon Nanoelectronics Workshop (SNW), 2020, p.73-74

2020

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Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation

2024 IEEE International Reliability Physics Symposium (IRPS), 2024, p.1-6

2024

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Intrinsic mobility evaluation of high-/spl kappa/ gate dielectric transistors using pulsed I/sub d/-V/sub g

IEEE electron device letters, 2005-08, Vol.26 (8), p.586-589

2005

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Electrical observation of deep traps in high-/spl kappa//metal gate stack transistors

IEEE electron device letters, 2005-11, Vol.26 (11), p.839-841

2005

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Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3

2020 IEEE International Reliability Physics Symposium (IRPS), 2020, p.1-5

2020

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Mouse Models for Studying Oral Cancer: Impact in the Era of Cancer Immunotherapy

Texture analysis in non-contrast enhanced CT: Impact of malignancy on texture in apparently disease-free areas of the liver

Global strain field mapping of a particle-laden interface using digital image correlation

Experimental Evidence of the Fast and Slow Charge Trapping/Detrapping Processes in High- k Dielectrics Subjected to PBTI Stress

Anaesthetic care for surgical management of adolescent idiopathic scoliosis

In Search of Biologic Correlates for Liver Texture on Portal-Phase CT

Extraction of the Threshold-Voltage Shift by the Single-Pulse Technique

Grey-matter texture abnormalities and reduced hippocampal volume are distinguishing features of schizophrenia

Effects of ALD HfO2 thickness on charge trapping and mobility

A novel bias temperature instability characterization methodology for high-k nMOSFETs

High-k gate stacks for planar, scaled CMOS integrated circuits

Correcting effective mobility measurements for the presence of significant gate leakage current

Investigating interface states and oxide traps in the MoS2/oxide/Si system

Genomic profiling of ER + breast cancers after short-term estrogen suppression reveals alterations associated with endocrine resistance

Decoupling of cold-carrier effects in hot-carrier reliability assessment of HfO/sub 2/ gated nMOSFETs

Macrophages Promote Growth of Squamous Cancer Independent of T cells

Spatial Distributions of Trapping Centers in \hbox/\hbox Gate Stack

Response to Letter to the Editor: “Macrophages Promote Growth of Squamous Cancer Independent of T Cells”

Short communication: A reproductive tract scoring system to manage fertility in lactating dairy cows

Impact of Al2O3 deposition temperature on the performance and initial stability of nanocrystalline ZnO thin-film transistors

Deconvolution of Hot Carrier and Cold Carrier Injection in ZnO TFTs

Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation

Intrinsic mobility evaluation of high-/spl kappa/ gate dielectric transistors using pulsed I/sub d/-V/sub g

Electrical observation of deep traps in high-/spl kappa//metal gate stack transistors

Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3

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