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New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate

IEEE transactions on electron devices, 2009-08, Vol.56 (8), p.1618-1623

2009

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Investigation and Modeling of Hot Carrier Effects on Performance of 45- and 55-nm NMOSFETs With RF Automatic Measurement

IEEE transactions on electron devices, 2008-06, Vol.55 (6), p.1541-1546

2008

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Impact of Uniaxial Strain on Random Telegraph Noise in High- k /Metal Gate pMOSFETs

IEEE transactions on electron devices, 2015-03, Vol.62 (3), p.988-993

2015

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Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain

IEEE transactions on electron devices, 2009-04, Vol.56 (4), p.678-682

2009

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Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis

Applied physics letters, 2014-08, Vol.105 (6)

2014

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The Geometry Effect of Contact Etch Stop Layer Impact on Device Performance and Reliability for 90-nm SOI nMOSFETs

IEEE transactions on electron devices, 2006-11, Vol.53 (11), p.2779-2785

2006

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Preparation and Characterizations of the High UV Sensitivity Porous Diamond-Like Carbon Thin Film MSM Photodiodes

IEEE sensors journal, 2012-05, Vol.12 (5), p.978-983

2012

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N-SiCN/P-Silicon Heterojunction With Porous Silicon Buffer Layer for Low-Cost and High-Temperature Ultraviolet (UV) Detecting Applications

IEEE sensors journal, 2009-07, Vol.9 (7), p.849-853

2009

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The low temperature polysilicon (LTPS) thin film MOS Schottky diode on glass substrate for low cost and high performance CO sensing applications

Sensors and actuators. B, Chemical, 2011-08, Vol.156 (1), p.338-342

2011

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Comparative Study of Carbon Monoxide Gas Sensing Mechanism for the LTPS MOS Schottky Diodes With Various Metal Oxides

IEEE sensors journal, 2011-05, Vol.11 (5), p.1227-1232

2011

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The IGZO fully transparent oxide thin film transistor on glass substrate

International journal of nanotechnology., 2015-01, Vol.12 (1/2), p.3

2015

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A High-Performance n-i-p SiCN Homojunction for Low-Cost and High-Temperature Ultraviolet Detecting Applications

IEEE sensors journal, 2011-01, Vol.11 (1), p.150-154

2011

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A Low-Flicker Noise Gate-Controlled Lateral-Vertical Bipolar Junction Transistor Array With 55-nm CMOS Technology

IEEE transactions on electron devices, 2011-10, Vol.58 (10), p.3276-3282

2011

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A Novel Method to Improve Laser Anneal Worsened Negative Bias Temperature Instability in 40-nm CMOS Technology

IEEE transactions on electron devices, 2011-03, Vol.58 (3), p.901-905

2011

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The Poly-SiC MSM Photodiode on Ceramic SiC Substrate for Low-Cost Ultraviolet Light Sensing Applications

IEEE sensors journal, 2011-12, Vol.11 (12), p.3446-3450

2011

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Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure

IEEE transactions on electron devices, 2010-06, Vol.57 (6), p.1355-1361

2010

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The hetero-epitaxial SiCN/Si MSM photodetector for high-temperature deep-UV detecting applications

IEEE electron device letters, 2003-09, Vol.24 (9), p.565-567

2003

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Effect of extrinsic impedance and parasitic capacitance on figure of merit of RF MOSFET

IEEE transactions on electron devices, 2005-09, Vol.52 (9), p.2054-2060

2005

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Substrate noise-coupling characterization and efficient suppression in CMOS technology

IEEE transactions on electron devices, 2004-05, Vol.51 (5), p.817-819

2004

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Impacts of Notched-Gate Structure on Contact Etch Stop Layer (CESL) Stressed 90-nm nMOSFET

IEEE electron device letters, 2007-05, Vol.28 (5), p.376-378

2007

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GaN on Silicon Substrate With Various SiC Buffer Layer for UV Detecting Applications

IEEE sensors journal, 2010-08, Vol.10 (8), p.1291-1296

2010

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Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain

Journal of nanomaterials, 2014-01, Vol.2014 (2014), p.1-6

2014

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Investigation of Bulk Traps Enhanced Gate-Induced Leakage Current in Hf-Based MOSFETs

IEEE electron device letters, 2008-05, Vol.29 (5), p.509-511

2008

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Ultra high performance planar InGaAs PIN photodiodes for high speed optical fiber communication

Sensors and actuators. A. Physical., 2007-01, Vol.133 (1), p.9-12

2007

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Studies of the new findings in preparing a scaled amorphous silicon thin-film transistor

Applied physics. A, Materials science & processing, 2014, Vol.116 (4), p.1655-1660

2014

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New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate

Investigation and Modeling of Hot Carrier Effects on Performance of 45- and 55-nm NMOSFETs With RF Automatic Measurement

Impact of Uniaxial Strain on Random Telegraph Noise in High- k /Metal Gate pMOSFETs

Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain

Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis

The Geometry Effect of Contact Etch Stop Layer Impact on Device Performance and Reliability for 90-nm SOI nMOSFETs

Preparation and Characterizations of the High UV Sensitivity Porous Diamond-Like Carbon Thin Film MSM Photodiodes

N-SiCN/P-Silicon Heterojunction With Porous Silicon Buffer Layer for Low-Cost and High-Temperature Ultraviolet (UV) Detecting Applications

The low temperature polysilicon (LTPS) thin film MOS Schottky diode on glass substrate for low cost and high performance CO sensing applications

Comparative Study of Carbon Monoxide Gas Sensing Mechanism for the LTPS MOS Schottky Diodes With Various Metal Oxides

The IGZO fully transparent oxide thin film transistor on glass substrate

A High-Performance n-i-p SiCN Homojunction for Low-Cost and High-Temperature Ultraviolet Detecting Applications

A Low-Flicker Noise Gate-Controlled Lateral-Vertical Bipolar Junction Transistor Array With 55-nm CMOS Technology

A Novel Method to Improve Laser Anneal Worsened Negative Bias Temperature Instability in 40-nm CMOS Technology

The Poly-SiC MSM Photodiode on Ceramic SiC Substrate for Low-Cost Ultraviolet Light Sensing Applications

Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure

The hetero-epitaxial SiCN/Si MSM photodetector for high-temperature deep-UV detecting applications

Effect of extrinsic impedance and parasitic capacitance on figure of merit of RF MOSFET

Substrate noise-coupling characterization and efficient suppression in CMOS technology

Impacts of Notched-Gate Structure on Contact Etch Stop Layer (CESL) Stressed 90-nm nMOSFET

GaN on Silicon Substrate With Various SiC Buffer Layer for UV Detecting Applications

Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain

Investigation of Bulk Traps Enhanced Gate-Induced Leakage Current in Hf-Based MOSFETs

Ultra high performance planar InGaAs PIN photodiodes for high speed optical fiber communication

Studies of the new findings in preparing a scaled amorphous silicon thin-film transistor

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