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Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting

IEEE transactions on computer-aided design of integrated circuits and systems, 2013-05, Vol.32 (5), p.723-736

2013

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TSV open defects in 3D integrated circuits: characterization, test, and optimal spare allocation

DAC Design Automation Conference 2012, 2012, p.1024-1030

2012

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Knowledge-Driven Board-Level Functional Fault Diagnosis

1, 2016

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Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning

IEEE transactions on computer-aided design of integrated circuits and systems, 2014-02, Vol.33 (2), p.279-290

2014

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Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes

IEEE transactions on computer-aided design of integrated circuits and systems, 2016-06, Vol.35 (6), p.985-998

2016

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Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees

IEEE transactions on computer-aided design of integrated circuits and systems, 2016-02, Vol.35 (2), p.323-336

2016

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On-Chip Droop-Induced Circuit Delay Prediction Based on Support-Vector Machines

IEEE transactions on computer-aided design of integrated circuits and systems, 2016-04, Vol.35 (4), p.665-678

2016

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Super‐heating degree responsive control strategy of variable refrigerant flow air conditioning system for energy saving and stable operation

Energy science & engineering, 2023-09, Vol.11 (9), p.3215-3231

2023

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Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis

IEEE transactions on computer-aided design of integrated circuits and systems, 2015-06, Vol.34 (6), p.1014-1026

2015

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TSV defects and TSV-induced circuit failures: The third dimension in test and design-for-test

2012 IEEE International Reliability Physics Symposium (IRPS), 2012, p.5F.1.1-5F.1.12

2012

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Representative critical-path selection for aging-induced delay monitoring

2013 IEEE International Test Conference (ITC), 2013, p.1-10

2013

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On effective and efficient in-field TSV repair for stacked 3D ICs

2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 2013, p.1-6

2013

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Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees

2012 IEEE 21st Asian Test Symposium, 2012, p.202-207

2012

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Board-Level Functional Fault Identification Using Streaming Data

IEEE transactions on computer-aided design of integrated circuits and systems, 2021-09, Vol.40 (9), p.1920-1933

2021

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Test and Design-for-Testability Solutions for 3D Integrated Circuits

IPSJ Transactions on System LSI Design Methodology, 2014, Vol.7, pp.56-73

2014

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On-chip voltage-droop prediction using support-vector machines

2014 IEEE 32nd VLSI Test Symposium (VTS), 2014, p.1-6

2014

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Knowledge discovery and knowledge transfer in board-level functional fault diagnosis

2014 International Test Conference, 2014, p.1-10

2014

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Adaptive Mitigation of Parameter Variations

2014 IEEE 23rd Asian Test Symposium, 2014, p.51-56

2014

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Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines

2012 IEEE 21st Asian Test Symposium, 2012, p.208-213

2012

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Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis

2013 22nd Asian Test Symposium, 2013, p.73-78

2013

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Fine-grained Adaptive Testing Based on Quality Prediction

ACM transactions on design automation of electronic systems, 2020-10, Vol.25 (5), p.1-25

2020

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Design and Optimization of Thermoelectric Cooling System Under Natural Convection Condition

Journal of thermal science and engineering applications, 2018-10, Vol.10 (5)

2018

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Board-Level Functional Fault Identification using Streaming Data

2019 IEEE 37th VLSI Test Symposium (VTS), 2019, p.1-6

2019

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Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path Selection

ACM transactions on design automation of electronic systems, 2015-06, Vol.20 (3), p.1-23

2015

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Fine-Grained Adaptive Testing Based on Quality Prediction

2018 IEEE International Test Conference (ITC), 2018, p.1-10

2018

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Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting

TSV open defects in 3D integrated circuits: characterization, test, and optimal spare allocation

Knowledge-Driven Board-Level Functional Fault Diagnosis

Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning

Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes

Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees

On-Chip Droop-Induced Circuit Delay Prediction Based on Support-Vector Machines

Super‐heating degree responsive control strategy of variable refrigerant flow air conditioning system for energy saving and stable operation

Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis

TSV defects and TSV-induced circuit failures: The third dimension in test and design-for-test

Representative critical-path selection for aging-induced delay monitoring

On effective and efficient in-field TSV repair for stacked 3D ICs

Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees

Board-Level Functional Fault Identification Using Streaming Data

Test and Design-for-Testability Solutions for 3D Integrated Circuits

On-chip voltage-droop prediction using support-vector machines

Knowledge discovery and knowledge transfer in board-level functional fault diagnosis

Adaptive Mitigation of Parameter Variations

Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines

Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis

Fine-grained Adaptive Testing Based on Quality Prediction

Design and Optimization of Thermoelectric Cooling System Under Natural Convection Condition

Board-Level Functional Fault Identification using Streaming Data

Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path Selection

Fine-Grained Adaptive Testing Based on Quality Prediction

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