UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 83

Sortiert nach

Dynamics of Au-adsorption-induced step bunching on a Si(001) vicinal surface studied by reflection electron microscopy

Physical review. B, Condensed matter, 1999-07, Vol.60 (4), p.2715-2719

1999

Volltextzugriff (PDF)

Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces

Japanese Journal of Applied Physics, 1999, Vol.38 (3B), p.L308

1999

Volltextzugriff (PDF)

Growth mechanism of 7×7 domains from the ‘1×1’ phase on a quenched Si(111) surface studied by high temperature STM

Surface science, 1999-03, Vol.423 (1), p.L236-L243

1999

Volltextzugriff (PDF)

Step bunching, step wandering and faceting: self-organization at Si surfaces

Surface science reports, 2001-07, Vol.43 (2), p.45-126

2001

Volltextzugriff (PDF)

REM Observation on Conversion between Single-Domain Surfaces of Si(001) 2×1 and 1×2 Induced by Specimen Heating Current

Japanese Journal of Applied Physics, 1989-05, Vol.28 (5A), p.L858

1989

Volltextzugriff (PDF)

Time evolution of DC heating-induced in-phase step wandering on Si(1 1 1) vicinal surfaces

Surface science, 2001-11, Vol.493 (1-3), p.487-493

2001

Volltextzugriff (PDF)

Formation of anomalously wide Si(111)× clean surface and its stability

Surface science, 2001-11, Vol.493 (1-3), p.157-165

2001

Volltextzugriff (PDF)

DC heating-induced step instability on Si(001) vicinal surfaces

Surface science, 1999-11, Vol.442 (2), p.L1006-L1012

1999

Volltextzugriff (PDF)

Current effects on Si(111) surfaces at the phase transition between the 7 × 7 and the 1 × 1 structures

Surface science, 1993-05, Vol.287, p.820-825

1993

Volltextzugriff (PDF)

Reflection electron microscopy: studies of surface structures and surface dynamic processes

Surface science reports, 1993, Vol.17 (6), p.307-362

Yagi, Katsumichi

1993

Volltextzugriff (PDF)

Competing effects of current and strain on step structures on Si(001)2 × 1 studied by REM

Surface science, 1997-06, Vol.382 (1), p.310-319

1997

Volltextzugriff (PDF)

Preferential diffusion of vacancies perpendicular to the dimers on Si(001)2×1 surfaces studied by UHV REM

Japanese Journal of Applied Physics, 1989-06, Vol.28 (6), p.L1042-L1044

1989

Volltextzugriff (PDF)

Current effects on Si(111) surfaces at the phase transition between the 7 × 7 and the 1 × 1 structures. II

Surface science, 1993-12, Vol.298 (2), p.408-414

1993

Volltextzugriff (PDF)

Quantitative studies of step bunching dynamics on Si(111) induced by a current effect

Surface science, 1996-06, Vol.357, p.518-521

1996

Volltextzugriff (PDF)

REM studies of surface dynamics: growth of Ge on Au-deposited Si(111) surfaces

Ultramicroscopy, 1993-04, Vol.48 (4), p.371-375

1993

Volltextzugriff (PDF)

Energy-filtered Electron Interferometry in Reflection Electron Microscopy

Japanese Journal of Applied Physics, 2001, Vol.40 (4R), p.2527

2001

Volltextzugriff (PDF)

Surface electromigration of metals on Si surfaces studied by UHV-REM

Surface science, 1993-03, Vol.283 (1), p.300-308

1993

Volltextzugriff (PDF)

Direct-current-induced drift direction of silicon adatoms on Si(111)-(1×1) surfaces

Surface science, 2000-08, Vol.461 (1), p.L528-L536

2000

Volltextzugriff (PDF)

Surface electromigration of metal atoms on Si(111) surfaces studied by UHV reflection electron microscopy

Ultramicroscopy, 1989-05, Vol.29 (1), p.161-167

1989

Volltextzugriff (PDF)

Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy

Japanese Journal of Applied Physics, 1999, Vol.38 (11R), p.6540

1999

Volltextzugriff (PDF)

Reflection electron microscopy study of thin film growth

Thin solid films, 1993-01, Vol.228 (1), p.12-17

1993

Volltextzugriff (PDF)

Growth of Si on Si(111) [formula omitted]-In surfaces studied by UHV-REM

Surface science, 1993-05, Vol.287, p.915-920

1993

Volltextzugriff (PDF)

UHV-REM study of changes in the step structures on clean (100) silicon surfaces by annealing

Japanese Journal of Applied Physics, 1987-04, Vol.26 (4), p.L293-L295

1987

Volltextzugriff (PDF)

REM study of surface electromigration of Ge, Au Cu and Ag on Si(111) surfaces

Applied surface science, 1992, Vol.60, p.79-84

1992

Volltextzugriff (PDF)

Ultra high vacuum reflection electron microscopy study of step-dislocation interaction on Si(111) surface

JPN J APPL PHYS PART 1 REGUL PAP SHORT NOTE REV PAP, 1995, Vol.34 (10), p.5768-5773

1995

Volltextzugriff (PDF)

1 – 25 von 83

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(67)
Mit Volltextzugriff
(80)

Publikationsform

Artikel
(77)
Tagungsberichte
(6)

Sprache

Englisch
(81)
Japanisch
(42)

Erscheinungsjahr

n.n

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Dynamics of Au-adsorption-induced step bunching on a Si(001) vicinal surface studied by reflection electron microscopy

Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces

Growth mechanism of 7×7 domains from the ‘1×1’ phase on a quenched Si(111) surface studied by high temperature STM

Step bunching, step wandering and faceting: self-organization at Si surfaces

REM Observation on Conversion between Single-Domain Surfaces of Si(001) 2×1 and 1×2 Induced by Specimen Heating Current

Time evolution of DC heating-induced in-phase step wandering on Si(1 1 1) vicinal surfaces

Formation of anomalously wide Si(111)× clean surface and its stability

DC heating-induced step instability on Si(001) vicinal surfaces

Current effects on Si(111) surfaces at the phase transition between the 7 × 7 and the 1 × 1 structures

Reflection electron microscopy: studies of surface structures and surface dynamic processes

Competing effects of current and strain on step structures on Si(001)2 × 1 studied by REM

Preferential diffusion of vacancies perpendicular to the dimers on Si(001)2×1 surfaces studied by UHV REM

Current effects on Si(111) surfaces at the phase transition between the 7 × 7 and the 1 × 1 structures. II

Quantitative studies of step bunching dynamics on Si(111) induced by a current effect

REM studies of surface dynamics: growth of Ge on Au-deposited Si(111) surfaces

Energy-filtered Electron Interferometry in Reflection Electron Microscopy

Surface electromigration of metals on Si surfaces studied by UHV-REM

Direct-current-induced drift direction of silicon adatoms on Si(111)-(1×1) surfaces

Surface electromigration of metal atoms on Si(111) surfaces studied by UHV reflection electron microscopy

Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy

Reflection electron microscopy study of thin film growth

Growth of Si on Si(111) [formula omitted]-In surfaces studied by UHV-REM

UHV-REM study of changes in the step structures on clean (100) silicon surfaces by annealing

REM study of surface electromigration of Ge, Au Cu and Ag on Si(111) surfaces

Ultra high vacuum reflection electron microscopy study of step-dislocation interaction on Si(111) surface

Suchergebnisse filtern