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Step structure transformation of Si(001) surface induced by current

Japanese Journal of Applied Physics, 1992-04, Vol.31 (4), p.1164-1169

1992

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Hetero-electromigration on semiconductor surfaces

Surface science, 1991-02, Vol.242 (1), p.171-180

Yasunaga, Hitoshi

1991

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Driving Force of Electromigration on Semiconductor Surfaces for Ag/Si(111)

Japanese Journal of Applied Physics, 1991-08, Vol.30 (8R), p.1822

1991

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Surface electromigration and diffusion of Ag on Ge(111)

JPN J APPL PHYS PART 1 REGUL PAP SHORT NOTE, 1992, Vol.31 (10), p.3440-3445

1992

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Novel Transition Mechanism of Surface Electromigration Induced Step Structure on Vicinal Si(111) Surfaces

Japanese Journal of Applied Physics, 2000-07, Vol.39 (7S), p.4412

2000

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Quantum Computer Using Coupled-Quantum-Dot Molecules

Japanese Journal of Applied Physics, 2000-07, Vol.39 (7S), p.4642

2000

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Frustrated Nanodomains on O/Cu(100)

Japanese Journal of Applied Physics, 2000-07, Vol.39 (7S), p.4417

2000

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Analog Computation Using Quantum-Dot Cell Network

Japanese Journal of Applied Physics, 2001, Vol.40 (4S), p.2792

2001

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Surface electromigration and diffusion of Au on Si(111)7 × 7

Surface science, 1990-05, Vol.231 (3), p.263-270

1990

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Surface electromigration of metal atoms on Si(111) surfaces studied by UHV reflection electron microscopy

Ultramicroscopy, 1989-05, Vol.29 (1), p.161-167

1989

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Method for Determining Weight Coefficients for Quantum Boltzmann Machine Neuron Devices

Japanese Journal of Applied Physics, 1999-01, Vol.38 (1S), p.439

1999

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Electromigration of in ultrathin film on Si(111)

Japanese Journal of Applied Physics, 1986-05, Vol.25 (5), p.L400-L402

1986

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Restoration process of a crater on a metal surface

Surface science, 1990-12, Vol.239 (3), p.363-373

1990

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Electromigration on Semiconductor Surface

Butsuri, 1990/07/05, Vol.45(7), pp.476-482

Yasunaga, Hitoshi

1990

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Surface Electromigration of Metal-Covered Semiconductor

Hyomen Kagaku, 1988/04/20, Vol.9(3), pp.190-199

YASUNAGA, Hitoshi

1988

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Effect of Cs adsorption on surface impedance of thermally-cleaned Si(111)7×7 wafer

Japanese Journal of Applied Physics, 1985-08, Vol.24 (8), p.928-933

1985

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Electromigration of Ag ultrathin films on Si (111) 7×7

Japanese Journal of Applied Physics, 1988-09, Vol.27 (9), p.L1603-L1605

1988

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Calibrated source of atomic cesium beams

Review of scientific instruments, 1976-06, Vol.47 (6), p.726-729

Yasunaga, Hitoshi

1976

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Effect of Schottky barrier on alternating current response of lead phthalocyanine

Journal of applied physics, 1980-04, Vol.51 (4), p.2149-2152

1980

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Electronic properties of Cs-covered surfaces of graphite (0001)

Japanese Journal of Applied Physics, 1986-02, Vol.25 (2), p.178-182

1986

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Formation of MIS Structure in Organic Cell Al/Pb-Phthalocyanine/ITO

Japanese Journal of Applied Physics, 1983-01, Vol.22 (2R), p.348

1983

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Surface Electromigration of Cu Overlayer on Si

Hyomen Kagaku, 1989/06/20, Vol.10(5), pp.364-368

1989

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Photovoltaic Properties of Lead Phthalocyanine Contacts

Japanese Journal of Applied Physics, 1981-01, Vol.20 (S2), p.141

1981

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Dependence of the Resistance on Pressure in the c Direction of Pyrolytic and Natural Graphite

Japanese Journal of Applied Physics, 1971-01, Vol.10 (11), p.1645

1971

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Growth of metallic intermediate layer on Si(111) by surface electro-migration

Superlattices and microstructures, 1990, Vol.8 (2), p.145-150

1990

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Step structure transformation of Si(001) surface induced by current

Hetero-electromigration on semiconductor surfaces

Driving Force of Electromigration on Semiconductor Surfaces for Ag/Si(111)

Surface electromigration and diffusion of Ag on Ge(111)

Novel Transition Mechanism of Surface Electromigration Induced Step Structure on Vicinal Si(111) Surfaces

Quantum Computer Using Coupled-Quantum-Dot Molecules

Frustrated Nanodomains on O/Cu(100)

Analog Computation Using Quantum-Dot Cell Network

Surface electromigration and diffusion of Au on Si(111)7 × 7

Surface electromigration of metal atoms on Si(111) surfaces studied by UHV reflection electron microscopy

Method for Determining Weight Coefficients for Quantum Boltzmann Machine Neuron Devices

Electromigration of in ultrathin film on Si(111)

Restoration process of a crater on a metal surface

Electromigration on Semiconductor Surface

Surface Electromigration of Metal-Covered Semiconductor

Effect of Cs adsorption on surface impedance of thermally-cleaned Si(111)7×7 wafer

Electromigration of Ag ultrathin films on Si (111) 7×7

Calibrated source of atomic cesium beams

Effect of Schottky barrier on alternating current response of lead phthalocyanine

Electronic properties of Cs-covered surfaces of graphite (0001)

Formation of MIS Structure in Organic Cell Al/Pb-Phthalocyanine/ITO

Surface Electromigration of Cu Overlayer on Si

Photovoltaic Properties of Lead Phthalocyanine Contacts

Dependence of the Resistance on Pressure in the c Direction of Pyrolytic and Natural Graphite

Growth of metallic intermediate layer on Si(111) by surface electro-migration

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