UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

Anderson localization of graphene by helium ion irradiation

Applied physics letters, 2016-04, Vol.108 (17)

2016

Volltextzugriff (PDF)

Direct nano-patterning of graphene with helium ion beams

Applied physics letters, 2015-01, Vol.106 (3)

2015

Volltextzugriff (PDF)

Rectification of force-distance curve using capacitance measurement

Applied physics letters, 2009-02, Vol.94 (8), p.083104-083104-3

2009

Volltextzugriff (PDF)

An analytical model for the capacitance between probe tip and dielectric film deduced by high-frequency electromagnetic-field simulations

Journal of applied physics, 2009-02, Vol.105 (4), p.044311-044311-6

2009

Volltextzugriff (PDF)

Investigation of local charged defects within high-temperature annealed HfSiON∕SiO2 gate stacks by scanning capacitance spectroscopy

Journal of applied physics, 2007-04, Vol.101 (8)

2007

Volltextzugriff (PDF)

Charge trapping properties in TiO2∕HfSiO∕SiO2 gate stacks probed by scanning capacitance microscopy

Applied physics letters, 2008-01, Vol.92 (1)

2008

Volltextzugriff (PDF)

Spatial fluctuation of dielectric properties in Hf-based high- k gate films studied by scanning capacitance microscopy

Applied physics letters, 2005-12, Vol.87 (25), p.252908-252908-3

2005

Volltextzugriff (PDF)

Study on channel depletion in metal-oxide-semiconductor field effect transistor using top-view imaging through scanning capacitance microscopy

Surface and interface analysis, 2009-01, Vol.41 (1), p.34-37

2009

Volltextzugriff (PDF)

Scanning capacitance microscopy study of carrier depletion within grains of n-type polycrystalline silicon

Surface and interface analysis, 2008-06, Vol.40 (6-7), p.1117-1121

2008

Volltextzugriff (PDF)

Measurement of Deuteron Induced Thick Target Neutron Yields at 9 MeV

Journal of the Korean Physical Society, 2011, 59(23), , pp.1725-1728

2011

Volltextzugriff (PDF)

Light-Ion Production from a Thin Silicon Target Bombarded by 175 MeV Quasi Monoenergetic Neutrons

Journal of the Korean Physical Society, 2011, 59(23), , pp.1447-1450

2011

Volltextzugriff (PDF)

Characterization of ANITA and QMN Neutron Beams at TSL Using Proton Recoil Techniques

Journal of the Korean Physical Society, 2011, 59(23), , pp.1439-1442

2011

Volltextzugriff (PDF)

Light-Ion Production in 175 MeV Neutron-Induced Reactions on Oxygen

Journal of the Korean Physical Society, 2011, 59(23), , pp.1979-1982

2011

Volltextzugriff (PDF)

Delineation of a p-n junction using dC/ dX imagery produced by shear-mode scanning capacitance microscopy

Applied physics. A, Materials science & processing, 2002-02, Vol.74 (2), p.261-263

2002

Volltextzugriff (PDF)

Light-Ion Production in The Interaction of 175 MeV Neutrons with Iron and Bismuth

Journal of the Korean Physical Society, 2011, 59(23), , pp.1701-1704

2011

Volltextzugriff (PDF)

Phase relations, dielectric and piezoelectric properties of ceramics in the system (Bi0.5Na0.5)TiO3-PbTiO3

Ferroelectrics, 1992-06, Vol.131 (1), p.219-226

1992

Volltextzugriff (PDF)

A Medley with over ten years of (mostly) light-ion production measurements at The Svedberg Laboratory

EPJ Web of conferences, 2010, Vol.8, p.7013

2010

Volltextzugriff (PDF)

High-spatial-resolution scanning capacitance microscope using all-metal probe with quartz tuning fork

Applied physics letters, 2004-09, Vol.85 (11), p.2131-2133

2004

Volltextzugriff (PDF)

Native Graphene Oxides at Graphene Edges

IEEE transactions on instrumentation and measurement, 2013-06, Vol.62 (6), p.1461-1466

2013

Volltextzugriff (PDF)

Medley spectrometer for light ions in neutron-induced reactions at 175 MeV

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2011-08, Vol.646 (1), p.100-107

2011

Volltextzugriff (PDF)

Characterization of intracavernous pressure increase induced by Ym348, a novel 5-HT2c receptor agonist, in anesthetized rats

The Journal of urology, 2006-05, Vol.175 (5), p.1953-1957

2006

Volltextzugriff (PDF)

Pharmacological profile of YM348, a novel, potent and orally active 5-HT2C receptor agonist

European journal of pharmacology, 2004-01, Vol.483 (1), p.37-43

2004

Volltextzugriff (PDF)

A randomized phase III trial of adjuvant chemotherapy with UFT for completely resected pathological stage I non-small-cell lung cancer: the West Japan Study Group for Lung Cancer Surgery (WJSG)—the 4th study

Annals of oncology, 2005-01, Vol.16 (1), p.75-80

2005

Volltextzugriff (PDF)

Application of a self-sensing conductive probe for Si device imaging

Applied surface science, 2005-08, Vol.250 (1-4), p.209-215

2005

Volltextzugriff (PDF)

Native graphene oxides at graphene edges

2012 Conference on Precision electromagnetic Measurements, 2012, p.518-519

2012

Volltextzugriff (PDF)

1 – 25 von 177

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(126)
Mit Volltextzugriff
(130)

Publikationsform

Sprache

Englisch
(152)
Japanisch
(30)

Erscheinungsjahr

n.n

Thema

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Anderson localization of graphene by helium ion irradiation

Direct nano-patterning of graphene with helium ion beams

Rectification of force-distance curve using capacitance measurement

An analytical model for the capacitance between probe tip and dielectric film deduced by high-frequency electromagnetic-field simulations

Investigation of local charged defects within high-temperature annealed HfSiON∕SiO2 gate stacks by scanning capacitance spectroscopy

Charge trapping properties in TiO2∕HfSiO∕SiO2 gate stacks probed by scanning capacitance microscopy

Spatial fluctuation of dielectric properties in Hf-based high- k gate films studied by scanning capacitance microscopy

Study on channel depletion in metal-oxide-semiconductor field effect transistor using top-view imaging through scanning capacitance microscopy

Scanning capacitance microscopy study of carrier depletion within grains of n-type polycrystalline silicon

Measurement of Deuteron Induced Thick Target Neutron Yields at 9 MeV

Light-Ion Production from a Thin Silicon Target Bombarded by 175 MeV Quasi Monoenergetic Neutrons

Characterization of ANITA and QMN Neutron Beams at TSL Using Proton Recoil Techniques

Light-Ion Production in 175 MeV Neutron-Induced Reactions on Oxygen

Delineation of a p-n junction using dC/ dX imagery produced by shear-mode scanning capacitance microscopy

Light-Ion Production in The Interaction of 175 MeV Neutrons with Iron and Bismuth

Phase relations, dielectric and piezoelectric properties of ceramics in the system (Bi0.5Na0.5)TiO3-PbTiO3

A Medley with over ten years of (mostly) light-ion production measurements at The Svedberg Laboratory

High-spatial-resolution scanning capacitance microscope using all-metal probe with quartz tuning fork

Native Graphene Oxides at Graphene Edges

Medley spectrometer for light ions in neutron-induced reactions at 175 MeV

Characterization of intracavernous pressure increase induced by Ym348, a novel 5-HT2c receptor agonist, in anesthetized rats

Pharmacological profile of YM348, a novel, potent and orally active 5-HT2C receptor agonist

A randomized phase III trial of adjuvant chemotherapy with UFT for completely resected pathological stage I non-small-cell lung cancer: the West Japan Study Group for Lung Cancer Surgery (WJSG)—the 4th study

Application of a self-sensing conductive probe for Si device imaging

Native graphene oxides at graphene edges

Suchergebnisse filtern