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Structural, electronic and optical properties of AB bilayer graphene intercalated by Sr atom: A first principles study

Diamond and related materials, 2022-06, Vol.126, p.109082, Article 109082

2022

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XPS study of amorphous carbon nitride (a-C:N) thin films deposited by reactive RF sputtering

Solar energy materials and solar cells, 2006-06, Vol.90 (10), p.1420-1423

2006

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Déposition par pulvérisation cathodique radio fréquence et caractérisation électronique, structurale et optique de couches minces du dioxyde de titane

Active and passive electronic components, 2004, Vol.27 (3), p.169-181

2004

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Optical characterization of a-C:N thin films deposited by RF sputtering

Solar energy materials and solar cells, 2006-06, Vol.90 (10), p.1424-1428

2006

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Controlling optical properties of small SWCNT using new N-doping chains method: A first-principles study

Physica. E, Low-dimensional systems & nanostructures, 2023-04, Vol.148, p.115627, Article 115627

2023

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Intercalation of Sr in AA stacked bilayer graphene : DFT study of the electronic structure and optical properties

Materials today communications, 2022-12, Vol.33, p.104714, Article 104714

2022

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First-principles investigation of the structural, electronic and optical properties of Zn2NbN3

Revista mexicana de física, 2023-07, Vol.69 (4 Jul-Aug)

2023

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DFT investigation of optoelectronic properties of ultra-small C, CN and SiC nanotubes

2022 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), 2022, p.127-128

2022

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Structural Characterization of RF-Sputtered a-C:N Thin Films by Raman, IR, and X-ray Reflectometry Spectroscopies

Spectroscopy letters, 2008-04, Vol.41 (3), p.136-143

2008

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Annealing Effects on RF Sputter Deposited a-Si/a-C Multilayers

Journal of nano research, 2009-01, Vol.4, p.103-106

2009

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Optical Properties of Amorphous Silicon–Carbon Alloys (a-SixC1-x) Deposited by RF Co-Sputtering

Arabian Journal for Science and Engineering, 2014-07, Vol.39 (7), p.5771-5776

2014

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Déposition par Pulvé Risation Cathodique Radio Fréquence et Caracté Risation Électronique, Structurale et Optique de Couches Minces du Dioxyde de Titane

Active and passive electronic components, 2004-01, Vol.27 (3), p.169-181

2004

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Water pumping using a photovoltaic d.c. solar pump without energy storage

Renewable energy, 1994-10, Vol.4 (7), p.847-854

1994

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Grazing incidence X-ray reflectometry studies of CdTe(1 1 1) surfaces and a-Si thin films

Solar energy materials and solar cells, 1998-03, Vol.52 (1-2), p.27-36

1998

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Interaction of oxygen with (Er + Si) : formation of erbium pyrosilicate Er2Si2O7

Applied surface science, 1997-02, Vol.108 (2), p.251-256

1997

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Ètude des interfaces SiO 2 /TiO 2 et TiO 2 /SiO 2 dans la structure SiO 2 /TiO 2 /SiO 2 /c-Si préparée par pulvérisation cathodique radio fréquence

Canadian journal of physics, 2007-07, Vol.85 (7), p.763-776

2007

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The formation of sputtered Ta/a-Si and a-Si/Ta interfaces in a-Si/Ta/a-Si/c-Si structure

Thin solid films, 1995-10, Vol.266 (2), p.224-228

1995

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On the formation of molybdenum silicides in MoSi multilayers: the effect of Mo thickness and annealing temperature

Applied surface science, 1992-02, Vol.55 (2-3), p.165-171

1992

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On the formation of erbium silicide in a-Si/Er/a-Si/c-Si structures

Applied surface science, 1993-01, Vol.70 (1-4), p.447-451

1993

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DEPOSITION PAR PULVERISATION CATHODIQUE RADIO FREQUENCE ET CARACTERISATION ELECTRONIQUE, STRUCTURALE ET OPTIQUE DE COUCHES MINCES DU DIOXYDE DE TITANE

Active and Passive Electronic Components, 2004-12, Vol.2004, p.169-181

2004

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RADIO FREQUENCY AND ELECTRONIC, STRUCTURAL CHARACTERISATION AND OPTICS OF THIN LAYERS OF THE TITANIUM DIOXIDE

Active and passive electronic components, 2004-09, Vol.27 (3), p.169-181

2004

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Détermination du coefficient d'absorption des rayons X à partir des mesures de réflectométrie X

Canadian journal of physics, 2004-01, Vol.82 (1), p.75-79

2004

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Grazing incidence X-ray reflectometry studies of [formula omitted] surfaces and a-Si thin films

Solar energy materials and solar cells, 1998, Vol.52 (1), p.27-36

1998

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Interaction of oxygen with (Er + Si): formation of erbium pyrosilicate Er 2Si 2O 7

Applied surface science, 1997, Vol.108 (2), p.251-256

1997

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Controlling Electronic and Optical Properties of Small Swcnt Using New N-Doping Chains Method: A First-Principles Study

SSRN Electronic Journal

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Structural, electronic and optical properties of AB bilayer graphene intercalated by Sr atom: A first principles study

XPS study of amorphous carbon nitride (a-C:N) thin films deposited by reactive RF sputtering

Déposition par pulvérisation cathodique radio fréquence et caractérisation électronique, structurale et optique de couches minces du dioxyde de titane

Optical characterization of a-C:N thin films deposited by RF sputtering

Controlling optical properties of small SWCNT using new N-doping chains method: A first-principles study

Intercalation of Sr in AA stacked bilayer graphene : DFT study of the electronic structure and optical properties

First-principles investigation of the structural, electronic and optical properties of Zn2NbN3

DFT investigation of optoelectronic properties of ultra-small C, CN and SiC nanotubes

Structural Characterization of RF-Sputtered a-C:N Thin Films by Raman, IR, and X-ray Reflectometry Spectroscopies

Annealing Effects on RF Sputter Deposited a-Si/a-C Multilayers

Optical Properties of Amorphous Silicon–Carbon Alloys (a-SixC1-x) Deposited by RF Co-Sputtering

Déposition par Pulvé Risation Cathodique Radio Fréquence et Caracté Risation Électronique, Structurale et Optique de Couches Minces du Dioxyde de Titane

Water pumping using a photovoltaic d.c. solar pump without energy storage

Grazing incidence X-ray reflectometry studies of CdTe(1 1 1) surfaces and a-Si thin films

Interaction of oxygen with (Er + Si) : formation of erbium pyrosilicate Er2Si2O7

Ètude des interfaces SiO 2 /TiO 2 et TiO 2 /SiO 2 dans la structure SiO 2 /TiO 2 /SiO 2 /c-Si préparée par pulvérisation cathodique radio fréquence

The formation of sputtered Ta/a-Si and a-Si/Ta interfaces in a-Si/Ta/a-Si/c-Si structure

On the formation of molybdenum silicides in MoSi multilayers: the effect of Mo thickness and annealing temperature

On the formation of erbium silicide in a-Si/Er/a-Si/c-Si structures

DEPOSITION PAR PULVERISATION CATHODIQUE RADIO FREQUENCE ET CARACTERISATION ELECTRONIQUE, STRUCTURALE ET OPTIQUE DE COUCHES MINCES DU DIOXYDE DE TITANE

RADIO FREQUENCY AND ELECTRONIC, STRUCTURAL CHARACTERISATION AND OPTICS OF THIN LAYERS OF THE TITANIUM DIOXIDE

Détermination du coefficient d'absorption des rayons X à partir des mesures de réflectométrie X

Grazing incidence X-ray reflectometry studies of [formula omitted] surfaces and a-Si thin films

Interaction of oxygen with (Er + Si): formation of erbium pyrosilicate Er 2Si 2O 7

Controlling Electronic and Optical Properties of Small Swcnt Using New N-Doping Chains Method: A First-Principles Study

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