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Above-Threshold 1\!/\!f Noise Expression for Amorphous InGaZnO Thin-Film Transistors Considering Series Resistance Noise

IEEE electron device letters, 2015-10, Vol.36 (10), p.1056-1059

2015

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Analytical Drain Current Model for Organic Thin-Film Transistors at Different Temperatures Considering Both Deep and Tail Trap States

IEEE transactions on electron devices, 2016-11, Vol.63 (11), p.4423-4431

2016

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Analytical Drain Current Model for Amorphous InGaZnO Thin-Film Transistors at Different Temperatures Considering Both Deep and Tail Trap States

IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3654-3660

2017

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1/f Noise Expressions for Amorphous InGaZnO TFTs Considering Mobility Power-Law Parameter in Above-Threshold Regime

IEEE electron device letters, 2015-02, Vol.36 (2), p.156-158

2015

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Analytical Model of Undoped Polycrystalline Silicon Thin-Film Transistors Consistent With Pao-Sah Model

IEEE transactions on electron devices, 2011-04, Vol.58 (4), p.1102-1107

2011

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Analytical Expressions for Doped Polycrystalline Silicon Thin-Film Transistors in Above-Threshold Regime Consistent With Pao-Sah Model Considering Trapped Charge Effect

IEEE transactions on electron devices, 2011-12, Vol.58 (12), p.4324-4332

2011

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Trapped-Charge-Effect-Based Above-Threshold Current Expressions for Amorphous Silicon TFTs Consistent With Pao-Sah Model

IEEE transactions on electron devices, 2014-11, Vol.61 (11), p.3744-3750

2014

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Polynomial-Effective-Channel-Mobility-Based Above-Threshold Current Model for Undoped Polycrystalline-Silicon Thin-Film Transistors Consistent With Pao-Sah Model

IEEE transactions on electron devices, 2012-11, Vol.59 (11), p.3130-3132

2012

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A Compact Model for Undoped Symmetric Double-Gate Polysilicon Thin-Film Transistors

IEEE transactions on electron devices, 2010-10, Vol.57 (10), p.2607-2615

2010

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Modeling of kink effect in polycrystalline silicon thin-film transistors

Solid-state electronics, 2009-06, Vol.53 (6), p.669-673

2009

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Subthreshold characteristics of polysilicon TFTs

Solid-state electronics, 2008-05, Vol.52 (5), p.695-703

2008

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A new analytical threshold voltage model for the doped polysilicon thin-film transistors

Solid-state electronics, 2009-06, Vol.53 (6), p.607-612

2009

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A physics-based analytical solution to the surface potential of polysilicon thin film transistors using the Lambert W function

Solid-state electronics, 2007-06, Vol.51 (6), p.975-981

2007

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Analytical drain current model for amorphous IGZO thin-film transistors in above-threshold regime

Journal of semiconductors, 2011-07, Vol.32 (7), p.34-37

何红宇郑学仁

2011

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Modeling of self-heating effects in polycrystalline silicon thin film transistors

Journal of semiconductors, 2009-07, Vol.30 (7), p.44-47

邓婉玲郑学仁

2009

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Above-Threshold [Formula Omitted] Noise Expression for Amorphous InGaZnO Thin-Film Transistors Considering Series Resistance Noise

IEEE electron device letters, 2015-10, Vol.36 (10), p.1056

2015

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Leakage Current Model of Polycrystalline Silicon Thin-Film Transistors for Device Characterization and Circuit Simulation

Japanese Journal of Applied Physics, 2007-12, Vol.46 (12R), p.7626

2007

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Drain current model based on the Meyer-Neldel Rule for polycrystalline ZnO thin-film transistors at different temperatures

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2017, p.1-4

2017

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Simple leakage current and 1/f noise expressions for polycrystalline silicon thin-film transistors

2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 2016, p.307-309

2016

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Model of n-type polycrystalline silicon thin film transistors under DC bias stress

2010 11th International Conference on Electronic Packaging Technology & High Density Packaging, 2010, p.949-952

2010

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A two-dimensional flow sensor using integrated silicon spreading-resistance temperature detectors

Review of scientific instruments, 1997-10, Vol.68 (10), p.3785-3789

1997

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On the grain boundary barrier height and threshold voltage of undoped polycrystalline silicon thin-film transistors

2012 12th International Workshop on Junction Technology, 2012, p.160-163

2012

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Grain boundary barrier height and threshold voltage model of polycrystalline silicon thin film transistors

2010 International Workshop on Junction Technology Extended Abstracts, 2010, p.1-4

2010

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A simple leakage current model for polycrystalline silicon nanowire thin-film transistors

2013 IEEE International Conference of Electron Devices and Solid-state Circuits, 2013, p.1-2

2013

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Monolithic integrated spreading-resistance silicon flow sensor

Sensors and actuators. A. Physical., 1997, Vol.58 (1), p.85-88

1997

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Above-Threshold 1\!/\!f Noise Expression for Amorphous InGaZnO Thin-Film Transistors Considering Series Resistance Noise

Analytical Drain Current Model for Organic Thin-Film Transistors at Different Temperatures Considering Both Deep and Tail Trap States

Analytical Drain Current Model for Amorphous InGaZnO Thin-Film Transistors at Different Temperatures Considering Both Deep and Tail Trap States

1/f Noise Expressions for Amorphous InGaZnO TFTs Considering Mobility Power-Law Parameter in Above-Threshold Regime

Analytical Model of Undoped Polycrystalline Silicon Thin-Film Transistors Consistent With Pao-Sah Model

Analytical Expressions for Doped Polycrystalline Silicon Thin-Film Transistors in Above-Threshold Regime Consistent With Pao-Sah Model Considering Trapped Charge Effect

Trapped-Charge-Effect-Based Above-Threshold Current Expressions for Amorphous Silicon TFTs Consistent With Pao-Sah Model

Polynomial-Effective-Channel-Mobility-Based Above-Threshold Current Model for Undoped Polycrystalline-Silicon Thin-Film Transistors Consistent With Pao-Sah Model

A Compact Model for Undoped Symmetric Double-Gate Polysilicon Thin-Film Transistors

Modeling of kink effect in polycrystalline silicon thin-film transistors

Subthreshold characteristics of polysilicon TFTs

A new analytical threshold voltage model for the doped polysilicon thin-film transistors

A physics-based analytical solution to the surface potential of polysilicon thin film transistors using the Lambert W function

Analytical drain current model for amorphous IGZO thin-film transistors in above-threshold regime

Modeling of self-heating effects in polycrystalline silicon thin film transistors

Above-Threshold [Formula Omitted] Noise Expression for Amorphous InGaZnO Thin-Film Transistors Considering Series Resistance Noise

Leakage Current Model of Polycrystalline Silicon Thin-Film Transistors for Device Characterization and Circuit Simulation

Drain current model based on the Meyer-Neldel Rule for polycrystalline ZnO thin-film transistors at different temperatures

Simple leakage current and 1/f noise expressions for polycrystalline silicon thin-film transistors

Model of n-type polycrystalline silicon thin film transistors under DC bias stress

A two-dimensional flow sensor using integrated silicon spreading-resistance temperature detectors

On the grain boundary barrier height and threshold voltage of undoped polycrystalline silicon thin-film transistors

Grain boundary barrier height and threshold voltage model of polycrystalline silicon thin film transistors

A simple leakage current model for polycrystalline silicon nanowire thin-film transistors

Monolithic integrated spreading-resistance silicon flow sensor

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