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Unified model of hole trapping, 1/f noise, and thermally stimulated current in MOS devices

IEEE transactions on nuclear science, 2002-12, Vol.49 (6), p.2674-2683

2002

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Characterization of electrically active defects in high-k gate dielectrics by using low frequency noise and charge pumping measurements

Microelectronic engineering, 2007-09, Vol.84 (9), p.2230-2234

2007

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Temperature dependence and irradiation response of 1/f-noise in MOSFETs

IEEE transactions on nuclear science, 2002-12, Vol.49 (6), p.2718-2723

2002

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Total dose effects on double gate fully depleted SOI MOSFETs

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3767-3772

2004

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Charge trapping and low frequency noise in SOI buried oxides

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3238-3242

2004

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Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast [Formula Omitted]-[Formula Omitted] Techniques

IEEE transactions on electron devices, 2008-08, Vol.55 (8), p.2004-2012

2008

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Generation of metastable electron traps in the near interfacial region of SOI buried oxides by ion implantation and their effect on device properties

Microelectronic engineering, 2004-04, Vol.72 (1), p.362-366

2004

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Spatial Probing of Traps in nMOSFET with ALD HfO2/SiO2 Stacks Using Low Frequency Noise Characteristics

2006 IEEE International Integrated Reliability Workshop Final Report, 2006, p.111-115

2006

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Stress-induced defect generation in HfO2/SiO2 stacks observed by using charge pumping and low frequency noise measurements

2008 IEEE International Reliability Physics Symposium, 2008, p.319-323

2008

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Interface trapping properties of nMOSFETs with Al2O3/SiOxNy/Si(100) gate dielectric stacks after exposure to ionizing radiation

Microelectronic engineering, 2004-04, Vol.72 (1-4), p.50-54

2004

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Interface trapping properties of nMOSFETs with Al 2O 3/SiO xN y/Si(1 0 0) gate dielectric stacks after exposure to ionizing radiation

Microelectronic engineering, 2004, Vol.72 (1), p.50-54

2004

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Characterization of interface and bulk oxide traps in SiC MOSFETs with epitaxialy grown and implanted channels

2007 IEEE International Integrated Reliability Workshop Final Report, 2007, p.111-113

2007

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Measurements for the reliability and electrical characterization of semiconductor nanowires

2008 IEEE International Reliability Physics Symposium, 2008, p.39-45

2008

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Design, Fabrication and Characterization of High-Performance Silicon Nanowire Transistor

2008 8th IEEE Conference on Nanotechnology, 2008, p.526-529

2008

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Nanowire electromechanical logic switch

2007 7th IEEE Conference on Nanotechnology (IEEE NANO), 2007, p.141-145

2007

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Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors

IEE proceedings. Circuits, devices, and systems, 2004-04, Vol.151 (2), p.118

2004

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A new ultra-fast charge pumping measurement technique for NIT characterization without relaxation

2007 International Semiconductor Device Research Symposium, 2007, p.1-2

2007

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Random Telegraph Signals and 1/f Noise in ZnO Nanowire Field Effect Transistors

2007 7th IEEE Conference on Nanotechnology (IEEE NANO), 2007, p.1139-1143

2007

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Silicon nanowire memory application using hafnium oxide charge storage layer

2007 International Semiconductor Device Research Symposium, 2007, p.1-2

2007

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Convolution Neural Network-Based Automatic Scoring of Coronary Artery Calcification and Its Value to Identify the Risk of Radiation-Induced Cardiac Toxicity on Radiotherapy Planning CT Scans in Breast Cancer Patients

International journal of radiation oncology, biology, physics, 2023-10, Vol.117 (2), p.e214-e215

2023

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Structures of the Escherichia coli ribosome with antibiotics bound near the peptidyl transferase center explain spectra of drug action

Proceedings of the National Academy of Sciences - PNAS, 2010-10, Vol.107 (40), p.17152-17157

2010

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The proteome and phosphoproteome of Neurospora crassa in response to cellulose, sucrose and carbon starvation

Fungal genetics and biology, 2014-11, Vol.72 (C), p.21-33

2014

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XRD and Raman study of vanadium oxide thin films deposited on fused silica substrates by RF magnetron sputtering

Applied surface science, 2001-06, Vol.177 (1), p.8-14

2001

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P.228 The polypharmacological profile of psilocybin and potential behavioural effects of very low doses

European neuropsychopharmacology, 2019-12, Vol.29, p.S175-S176

2019

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Medium density fibreboard production by hot pressing without adhesive using Triarrhena sacchariflora residue bio‐pretreated by white‐rot fungus Coriolus versicolor

Journal of applied microbiology, 2016-08, Vol.121 (2), p.415-421

2016

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Unified model of hole trapping, 1/f noise, and thermally stimulated current in MOS devices

Characterization of electrically active defects in high-k gate dielectrics by using low frequency noise and charge pumping measurements

Temperature dependence and irradiation response of 1/f-noise in MOSFETs

Total dose effects on double gate fully depleted SOI MOSFETs

Charge trapping and low frequency noise in SOI buried oxides

Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast [Formula Omitted]-[Formula Omitted] Techniques

Generation of metastable electron traps in the near interfacial region of SOI buried oxides by ion implantation and their effect on device properties

Spatial Probing of Traps in nMOSFET with ALD HfO2/SiO2 Stacks Using Low Frequency Noise Characteristics

Stress-induced defect generation in HfO2/SiO2 stacks observed by using charge pumping and low frequency noise measurements

Interface trapping properties of nMOSFETs with Al2O3/SiOxNy/Si(100) gate dielectric stacks after exposure to ionizing radiation

Interface trapping properties of nMOSFETs with Al 2O 3/SiO xN y/Si(1 0 0) gate dielectric stacks after exposure to ionizing radiation

Characterization of interface and bulk oxide traps in SiC MOSFETs with epitaxialy grown and implanted channels

Measurements for the reliability and electrical characterization of semiconductor nanowires

Design, Fabrication and Characterization of High-Performance Silicon Nanowire Transistor

Nanowire electromechanical logic switch

Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors

A new ultra-fast charge pumping measurement technique for NIT characterization without relaxation

Random Telegraph Signals and 1/f Noise in ZnO Nanowire Field Effect Transistors

Silicon nanowire memory application using hafnium oxide charge storage layer

Convolution Neural Network-Based Automatic Scoring of Coronary Artery Calcification and Its Value to Identify the Risk of Radiation-Induced Cardiac Toxicity on Radiotherapy Planning CT Scans in Breast Cancer Patients

Structures of the Escherichia coli ribosome with antibiotics bound near the peptidyl transferase center explain spectra of drug action

The proteome and phosphoproteome of Neurospora crassa in response to cellulose, sucrose and carbon starvation

XRD and Raman study of vanadium oxide thin films deposited on fused silica substrates by RF magnetron sputtering

P.228 The polypharmacological profile of psilocybin and potential behavioural effects of very low doses

Medium density fibreboard production by hot pressing without adhesive using Triarrhena sacchariflora residue bio‐pretreated by white‐rot fungus Coriolus versicolor

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