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A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometry

Rapid communications in mass spectrometry, 2014-02, Vol.28 (4), p.396-400

2014

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A simple erosion dynamics model of molecular sputter depth profiling

Surface and interface analysis, 2008-12, Vol.40 (12), p.1545-1551

Wucher, Andreas

2008

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Ionization Probability in Molecular Secondary Ion Mass Spectrometry: Protonation Efficiency of Sputtered Guanine Molecules Studied by Laser Postionization

Journal of physical chemistry. C, 2017-04, Vol.121 (16), p.8931-8937

2017

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On the SIMS Ionization Probability of Organic Molecules

Journal of the American Society for Mass Spectrometry, 2017-06, Vol.28 (6), p.1182-1191

2017

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Generation of ultrashort keV Ar + ion pulses via femtosecond laser photoionization

New journal of physics, 2021-03, Vol.23 (3), p.33023

2021

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Molecular sputter depth profiling using carbon cluster beams

Analytical and bioanalytical chemistry, 2010-01, Vol.396 (1), p.105-114

2010

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Molecular ionization probability in cluster-SIMS

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2018-05, Vol.36 (3)

Wucher, Andreas

2018

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Depth Resolution During C60 + Profiling of Multilayer Molecular Films

Analytical chemistry (Washington), 2008-10, Vol.80 (19), p.7363-7371

2008

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Secondary ion formation on indium under nuclear and electronic sputtering conditions

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2018-05, Vol.36 (3)

2018

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Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

The journal of physical chemistry. B, 2015-08, Vol.119 (33), p.10784-10797

2015

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Reduce the matrix effect in biological tissue imaging using dynamic reactive ionization and gas cluster ion beams

Biointerphases, 2016-06, Vol.11 (2), p.02A320-02A320

2016

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Molecular Depth Profiling Using a C60 Cluster Beam: The Role of Impact Energy

Journal of physical chemistry. C, 2008-10, Vol.112 (42), p.16550-16555

2008

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Molecular Depth Profiling of Histamine in Ice Using a Buckminsterfullerene Probe

Analytical chemistry (Washington), 2004-12, Vol.76 (24), p.7234-7242

2004

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Three-dimensional molecular imaging using mass spectrometry and atomic force microscopy

Applied surface science, 2008-12, Vol.255 (4), p.984-986

2008

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Molecular Depth Profiling with Argon Gas Cluster Ion Beams

Journal of physical chemistry. C, 2015-07, Vol.119 (27), p.15316-15324

2015

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Characterization of a supersonic gas jet via laser-induced photoelectron ionization

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2020-10, Vol.480, p.1-9

2020

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Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive Ionization

Journal of the American Society for Mass Spectrometry, 2016-12, Vol.27 (12), p.2014-2024

2016

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Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles

International journal of mass spectrometry, 2019-04, Vol.438, p.13-21

2019

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Dynamic Reactive Ionization with Cluster Secondary Ion Mass Spectrometry

Journal of the American Society for Mass Spectrometry, 2016-02, Vol.27 (2), p.285-292

2016

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Molecular SIMS Ionization Probability Studied with Laser Postionization: Influence of the Projectile Cluster

Journal of physical chemistry. C, 2019-01, Vol.123 (1), p.565-574

2019

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Nonequilibrium Dynamics of Electron Emission from Cold and Hot Graphene under Proton Irradiation

Nano letters, 2024-05, Vol.24 (17), p.5174-5181

2024

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Strong Field Ionization of β‑Estradiol in the IR: Strategies To Optimize Molecular Postionization in Secondary Neutral Mass Spectrometry

Journal of physical chemistry. C, 2014-11, Vol.118 (44), p.25534-25544

2014

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The influence of internal and external electric fields on the transport of energetic electrons in nanostructures

Journal of electron spectroscopy and related phenomena, 2018-08, Vol.227, p.51-68

2018

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Molecular Depth Profiling with Cluster Ion Beams

The journal of physical chemistry. B, 2006-04, Vol.110 (16), p.8329-8336

2006

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Transport of 75–1000 eV electrons in metal–insulator–metal devices

Journal of electron spectroscopy and related phenomena, 2018-02, Vol.223, p.37-52

2018

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A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometry

A simple erosion dynamics model of molecular sputter depth profiling

Ionization Probability in Molecular Secondary Ion Mass Spectrometry: Protonation Efficiency of Sputtered Guanine Molecules Studied by Laser Postionization

On the SIMS Ionization Probability of Organic Molecules

Generation of ultrashort keV Ar + ion pulses via femtosecond laser photoionization

Molecular sputter depth profiling using carbon cluster beams

Molecular ionization probability in cluster-SIMS

Depth Resolution During C60 + Profiling of Multilayer Molecular Films

Secondary ion formation on indium under nuclear and electronic sputtering conditions

Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Reduce the matrix effect in biological tissue imaging using dynamic reactive ionization and gas cluster ion beams

Molecular Depth Profiling Using a C60 Cluster Beam: The Role of Impact Energy

Molecular Depth Profiling of Histamine in Ice Using a Buckminsterfullerene Probe

Three-dimensional molecular imaging using mass spectrometry and atomic force microscopy

Molecular Depth Profiling with Argon Gas Cluster Ion Beams

Characterization of a supersonic gas jet via laser-induced photoelectron ionization

Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive Ionization

Ionization probability of sputtered indium under irradiation with 20-keV fullerene and argon gas cluster projectiles

Dynamic Reactive Ionization with Cluster Secondary Ion Mass Spectrometry

Molecular SIMS Ionization Probability Studied with Laser Postionization: Influence of the Projectile Cluster

Nonequilibrium Dynamics of Electron Emission from Cold and Hot Graphene under Proton Irradiation

Strong Field Ionization of β‑Estradiol in the IR: Strategies To Optimize Molecular Postionization in Secondary Neutral Mass Spectrometry

The influence of internal and external electric fields on the transport of energetic electrons in nanostructures

Molecular Depth Profiling with Cluster Ion Beams

Transport of 75–1000 eV electrons in metal–insulator–metal devices

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