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Molecular secondary ion formation under cluster bombardment: A fundamental review

Applied surface science, 2006-07, Vol.252 (19), p.6482-6489

Wucher, A.

2006

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Formation of atomic secondary ions in sputtering

Applied surface science, 2008-12, Vol.255 (4), p.1194-1200

Wucher, A.

2008

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Ultrashort Ne + ion pulses for use in pump–probe experiments: numerical simulations

New journal of physics, 2023-12, Vol.25 (12), p.123015

2023

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A concept to generate ultrashort ion pulses for pump-probe experiments in the keV energy range

New journal of physics, 2019-05, Vol.21 (5), p.53017

2019

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Three-dimensional depth profiling of molecular structures

Analytical & bioanalytical chemistry (Print), 2009-04, Vol.393 (8), p.1835-1842

2009

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Kinetic excitation of metallic solids: Progress towards a microscopic model

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2011-07, Vol.269 (14), p.1655-1660

2011

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Time-of-flight secondary neutral & ion mass spectrometry using swift heavy ions

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-12, Vol.365, p.482-489

2015

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The influence of crater formation for electron excitation processes in cluster induced collision cascades

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-06, Vol.352, p.186-189

2015

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A microscopic view of secondary ion formation

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2013-05, Vol.303, p.108-111

2013

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Low-energy electronic excitation in atomic collision cascades : A nonlinear transport model

Physical review. B, Condensed matter and materials physics, 2005-10, Vol.72 (16), p.165408.1-165408.9, Article 165408

2005

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A hybrid model describing ion induced kinetic electron emission

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2015-06, Vol.352, p.18-21

2015

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Generation of large indium clusters by sputtering

Physical review. B, Condensed matter, 2002-08, Vol.66 (7), Article 075419

2002

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Predicting Kinetic Electron Emission in Molecular Dynamics Simulations of Sputtering

Journal of physical chemistry. C, 2010-04, Vol.114 (12), p.5715-5720

2010

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Photo and particle induced transport of excited carriers in thin film tunnel junctions

Physical review. B, Condensed matter and materials physics, 2007-12, Vol.76 (23), Article 235408

2007

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Electron promotion and electronic friction in atomic collision cascades

New journal of physics, 2007-02, Vol.9 (2), p.38-38

2007

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Computer simulation of cluster impact induced electronic excitation of solids

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2013-05, Vol.303, p.51-54

2013

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Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum− ion bombardment

Surface and interface analysis, 2013-01, Vol.45 (1), p.87-89

2013

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C 60 molecular depth profiling of a model polymer

Applied surface science, 2004-06, Vol.231, p.183-185

2004

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Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions

Surface and interface analysis, 2011-01, Vol.43 (1-2), p.99-102

2011

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A molecular dynamics investigation of kinetic electron emission from silver surfaces under varying angle of projectile impact

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2011-07, Vol.269 (14), p.1661-1664

2011

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The role of electron temperature dynamics for secondary ion formation

Surface and interface analysis, 2013-01, Vol.45 (1), p.72-74

2013

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Predicting secondary ion formation in molecular dynamics simulations of sputtering

Applied surface science, 2008-12, Vol.255 (4), p.813-815

2008

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Strong-Field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling

Journal of physical chemistry. C, 2010-04, Vol.114 (12), p.5391-5399

2010

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Investigations of molecular depth profiling with dual beam sputtering

Surface and interface analysis, 2013-01, Vol.45 (1), p.175-177

2013

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Influence of the projectile charge state on the ionization probability of sputtered particles

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2011-06, Vol.269 (11), p.1306-1309

2011

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Einstellungen

Molecular secondary ion formation under cluster bombardment: A fundamental review

Formation of atomic secondary ions in sputtering

Ultrashort Ne + ion pulses for use in pump–probe experiments: numerical simulations

A concept to generate ultrashort ion pulses for pump-probe experiments in the keV energy range

Three-dimensional depth profiling of molecular structures

Kinetic excitation of metallic solids: Progress towards a microscopic model

Time-of-flight secondary neutral & ion mass spectrometry using swift heavy ions

The influence of crater formation for electron excitation processes in cluster induced collision cascades

A microscopic view of secondary ion formation

Low-energy electronic excitation in atomic collision cascades : A nonlinear transport model

A hybrid model describing ion induced kinetic electron emission

Generation of large indium clusters by sputtering

Predicting Kinetic Electron Emission in Molecular Dynamics Simulations of Sputtering

Photo and particle induced transport of excited carriers in thin film tunnel junctions

Electron promotion and electronic friction in atomic collision cascades

Computer simulation of cluster impact induced electronic excitation of solids

Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum− ion bombardment

C 60 molecular depth profiling of a model polymer

Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions

A molecular dynamics investigation of kinetic electron emission from silver surfaces under varying angle of projectile impact

The role of electron temperature dynamics for secondary ion formation

Predicting secondary ion formation in molecular dynamics simulations of sputtering

Strong-Field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling

Investigations of molecular depth profiling with dual beam sputtering

Influence of the projectile charge state on the ionization probability of sputtered particles

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