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Water effect on adsorption carbon capture in metal-organic framework: A molecular simulation

Carbon Capture Science & Technology, 2022-09, Vol.4, p.100061, Article 100061

2022

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On the Weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination. Part I: theory, methodology, experimental techniques

IEEE transactions on electron devices, 2002-12, Vol.49 (12), p.2131-2140

2002

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Analytical Cell-Based Model for the Breakdown Statistics of Multilayer Insulator Stacks

IEEE electron device letters, 2009-12, Vol.30 (12), p.1359-1361

2009

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On the Weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination. Part II: experimental results and the effects of stress conditions

IEEE transactions on electron devices, 2002-12, Vol.49 (12), p.2141-2150

2002

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IgG Fc Receptor Activity in vivo is Under Complement Control

Journal of allergy and clinical immunology, 2012-02, Vol.129 (2), p.AB217-AB217

2012

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On Voltage Acceleration Models of Time to Breakdown-Part I: Experimental and Analysis Methodologies

IEEE transactions on electron devices, 2009-07, Vol.56 (7), p.1433-1441

2009

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Statistics of successive breakdown events in gate oxides

IEEE electron device letters, 2003-04, Vol.24 (4), p.272-274

2003

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On Voltage Acceleration Models of Time to Breakdown-Part II: Experimental Results and Voltage Dependence of Weibull Slope in the FN Regime

IEEE transactions on electron devices, 2009-07, Vol.56 (7), p.1442-1450

2009

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A Compact Model for Oxide Breakdown Failure Distribution in Ultrathin Oxides Showing Progressive Breakdown

IEEE electron device letters, 2008-08, Vol.29 (8), p.949-951

2008

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Diagnosis and Treatment of an American Cohort of Patients with Hereditary Angioedema (HAE) Type III

Journal of allergy and clinical immunology, 2011-02, Vol.127 (2), p.AB102-AB102

2011

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EE308 Estimated Annual Costs Among Patients with Activated PI3K Delta Syndrome

Value in health, 2023-06, Vol.26 (6), p.S115-S115

2023

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ART-MMAP: a neural network approach to subpixel classification

IEEE transactions on geoscience and remote sensing, 2004-09, Vol.42 (9), p.1976-1983

2004

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Statistics of competing post-breakdown failure modes in ultrathin MOS devices

IEEE transactions on electron devices, 2006-02, Vol.53 (2), p.224-234

2006

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Weibull breakdown characteristics and oxide thickness uniformity

IEEE transactions on electron devices, 2000-12, Vol.47 (12), p.2301-2309

2000

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Successive oxide breakdown statistics: correlation effects, reliability methodologies, and their limits

IEEE transactions on electron devices, 2004-10, Vol.51 (10), p.1584-1592

2004

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The effects of device dimensions on the post-breakdown characteristics of ultrathin gate oxides

IEEE electron device letters, 2005-06, Vol.26 (6), p.401-403

2005

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Successive breakdown events and their relation with soft and hard breakdown modes

IEEE electron device letters, 2003-11, Vol.24 (11), p.692-694

2003

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PP01.48 Efficacy and Safety of Patritumab Deruxtecan (HER3-DXd) in Locally Advanced/Metastatic Non-Small Cell Lung Cancer (NSCLC) without EGFR-Activating Mutations

Journal of thoracic oncology, 2023-03, Vol.18 (3), p.e30-e31

2023

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Critical reliability challenges in scaling SiO2-based dielectric to its limit

Microelectronics and reliability, 2003-08, Vol.43 (8), p.1175-1184

2003

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The effect of change of voltage acceleration on temperature activation of oxide breakdown for ultrathin oxides

IEEE electron device letters, 2001-12, Vol.22 (12), p.603-605

2001

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Interrelationship of voltage and temperature dependence of oxide breakdown for ultrathin oxides

IEEE electron device letters, 2000-07, Vol.21 (7), p.362-364

2000

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Pain associated with intravascular instrumentation reduces orthostatic tolerance and predisposes to vasovagal reactions in healthy young adults without needle phobia: a randomised controlled study

Clinical autonomic research, 2023-12, Vol.33 (6), p.673-689

2023

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Experimental evidence of TBD power-law for voltage dependence of oxide breakdown in ultrathin gate oxides

IEEE transactions on electron devices, 2002-12, Vol.49 (12), p.2244

2002

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Faintly tired: a systematic review of fatigue in patients with orthostatic syncope

Clinical autonomic research, 2022-06, Vol.32 (3), p.185-203

2022

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Can macroscopic oxide thickness uniformity improve oxide reliability?

IEEE electron device letters, 2000-08, Vol.21 (8), p.402-404

2000

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Water effect on adsorption carbon capture in metal-organic framework: A molecular simulation

On the Weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination. Part I: theory, methodology, experimental techniques

Analytical Cell-Based Model for the Breakdown Statistics of Multilayer Insulator Stacks

On the Weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination. Part II: experimental results and the effects of stress conditions

IgG Fc Receptor Activity in vivo is Under Complement Control

On Voltage Acceleration Models of Time to Breakdown-Part I: Experimental and Analysis Methodologies

Statistics of successive breakdown events in gate oxides

On Voltage Acceleration Models of Time to Breakdown-Part II: Experimental Results and Voltage Dependence of Weibull Slope in the FN Regime

A Compact Model for Oxide Breakdown Failure Distribution in Ultrathin Oxides Showing Progressive Breakdown

Diagnosis and Treatment of an American Cohort of Patients with Hereditary Angioedema (HAE) Type III

EE308 Estimated Annual Costs Among Patients with Activated PI3K Delta Syndrome

ART-MMAP: a neural network approach to subpixel classification

Statistics of competing post-breakdown failure modes in ultrathin MOS devices

Weibull breakdown characteristics and oxide thickness uniformity

Successive oxide breakdown statistics: correlation effects, reliability methodologies, and their limits

The effects of device dimensions on the post-breakdown characteristics of ultrathin gate oxides

Successive breakdown events and their relation with soft and hard breakdown modes

PP01.48 Efficacy and Safety of Patritumab Deruxtecan (HER3-DXd) in Locally Advanced/Metastatic Non-Small Cell Lung Cancer (NSCLC) without EGFR-Activating Mutations

Critical reliability challenges in scaling SiO2-based dielectric to its limit

The effect of change of voltage acceleration on temperature activation of oxide breakdown for ultrathin oxides

Interrelationship of voltage and temperature dependence of oxide breakdown for ultrathin oxides

Pain associated with intravascular instrumentation reduces orthostatic tolerance and predisposes to vasovagal reactions in healthy young adults without needle phobia: a randomised controlled study

Experimental evidence of TBD power-law for voltage dependence of oxide breakdown in ultrathin gate oxides

Faintly tired: a systematic review of fatigue in patients with orthostatic syncope

Can macroscopic oxide thickness uniformity improve oxide reliability?

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