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South Atlantic Anomaly Evolution Seen by the Proton Flux

Journal of geophysical research. Space physics, 2024-06, Vol.129 (6), p.n/a

2024

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Comparative study of LaNiO3/LaAlO3 heterostructures grown by pulsed laser deposition and oxide molecular beam epitaxy

Applied physics letters, 2017-01, Vol.110 (4)

2017

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Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

IEEE transactions on nuclear science, 2021-08, Vol.68 (8), p.1623-1632

2021

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IEEE_Xplore

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1365-1373

2020

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IEEE_Xplore

Bridging RHA Methodology From Component to System Level Applied to System-on-Modules

IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1747-1756

2022

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IEEE_Xplore

Investigation on Passive and Autonomous Mode Operation of Floating Gate Dosimeters

IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1620-1627

2019

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IEEE_Xplore

Exploiting Transistor Folding Layout as RHBD Technique Against Single-Event Transients

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1581-1589

2020

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IEEE_Xplore

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1813-1818

2014

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IEEE_Xplore

Power deposition studies for standard and crystal-assisted heavy ion collimation in the CERN Large Hadron Collider

Physical review. Accelerators and beams, 2023-09, Vol.26 (9), p.093001, Article 093001

2023

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Floating Gate Dosimeter Suitability for Accelerator-Like Environments

IEEE transactions on nuclear science, 2017-01, Vol.64 (8), p.2054-2060

2017

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IEEE_Xplore

Impact of Complex Logic Cell Layout on the Single-Event Transient Sensitivity

IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1465-1472

2019

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IEEE_Xplore

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1708-1714

2018

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IEEE_Xplore

Analysis of SET Propagation in a System in Package Point of Load Converter

IEEE transactions on nuclear science, 2020-07, Vol.67 (7), p.1494-1502

2020

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IEEE_Xplore

Multiple Cell Upset Classification in Commercial SRAMs

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1747-1754

2014

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IEEE_Xplore

Detailed history of recoiling ions induced by nucleons

Computer physics communications, 2008-01, Vol.178 (2), p.88-104

Wrobel, F.

2008

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Perovskite substrates boost the thermopower of cobaltate thin films at high temperatures

Applied physics letters, 2017-06, Vol.110 (25)

2017

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Soft errors in commercial off-the-shelf static random access memories

Semiconductor science and technology, 2017-01, Vol.32 (1), p.13006

2017

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Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

IEEE transactions on nuclear science, 2013-06, Vol.60 (3), p.1876-1911

2013

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IEEE_Xplore

Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations

IEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.262-268

2018

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IEEE_Xplore

The Power Law Shape of Heavy Ions Experimental Cross Section

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.427-433

2017

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IEEE_Xplore

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2620-2626

2015

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IEEE_Xplore

Prediction of Multiple Cell Upset Induced by Heavy Ions in a 90 nm Bulk SRAM

IEEE transactions on nuclear science, 2009-08, Vol.56 (4), p.2050-2055

2009

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IEEE_Xplore

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

IEEE transactions on nuclear science, 2013-08, Vol.60 (4), p.2617-2622

2013

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IEEE_Xplore

Dynamic Test Methods for COTS SRAMs

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3095-3102

2014

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IEEE_Xplore

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3564-3571

2014

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IEEE_Xplore

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South Atlantic Anomaly Evolution Seen by the Proton Flux

Comparative study of LaNiO3/LaAlO3 heterostructures grown by pulsed laser deposition and oxide molecular beam epitaxy

Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

Bridging RHA Methodology From Component to System Level Applied to System-on-Modules

Investigation on Passive and Autonomous Mode Operation of Floating Gate Dosimeters

Exploiting Transistor Folding Layout as RHBD Technique Against Single-Event Transients

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

Power deposition studies for standard and crystal-assisted heavy ion collimation in the CERN Large Hadron Collider

Floating Gate Dosimeter Suitability for Accelerator-Like Environments

Impact of Complex Logic Cell Layout on the Single-Event Transient Sensitivity

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Analysis of SET Propagation in a System in Package Point of Load Converter

Multiple Cell Upset Classification in Commercial SRAMs

Detailed history of recoiling ions induced by nucleons

Perovskite substrates boost the thermopower of cobaltate thin films at high temperatures

Soft errors in commercial off-the-shelf static random access memories

Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations

The Power Law Shape of Heavy Ions Experimental Cross Section

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Prediction of Multiple Cell Upset Induced by Heavy Ions in a 90 nm Bulk SRAM

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

Dynamic Test Methods for COTS SRAMs

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

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