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Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells

Thin solid films, 2010-01, Vol.518 (7), p.1830-1834

2010

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Semiconductor Materials Analysis and Fabrication Process Control

2012

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UV–vis–infrared optical and AFM study of spin-cast chitosan films

Colloids and surfaces, B, Biointerfaces, 2005-07, Vol.43 (3), p.131-137

2005

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Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

Applied surface science, 2017-11, Vol.421 (B), p.508-512

2017

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Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry

Applied surface science, 2017-11, Vol.421, p.513-517

2017

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Terahertz ellipsometry and terahertz optical-Hall effect

Thin solid films, 2011-02, Vol.519 (9), p.2593-2600

2011

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The Origin of the Berreman Effect in SiC Homostructures

Physica status solidi. B. Basic research, 1998-07, Vol.208 (1), p.R3-R4

1998

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Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry

Thin solid films, 1998-02, Vol.313 (1-2), p.692-696

1998

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In Situ Ellipsometry in Microelectronics

MRS bulletin, 1995-05, Vol.20 (5), p.24-28

1995

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Optical properties of RuO2 films deposited by reactive sputtering

Thin solid films, 1992-01, Vol.207 (1-2), p.242-247

1992

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Spectroscopic ellipsometry characterization of SiN x antireflection films on textured multicrystalline and monocrystalline silicon solar cells

Thin solid films, 2010, Vol.518 (7), p.1830-1834

2010

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Metal slanted columnar thin film THz optical sensors

MRS proceedings, 2012, Vol.1409 (1), p.61-66, Article mrsf11-1409-cc13-31

2012

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Infrared optical properties and AFM of spin-cast chitosan films chemically modified with 1,2 Epoxy-3-phenoxy-propane

Colloids and surfaces, B, Biointerfaces, 2005-11, Vol.46 (1), p.26-31

2005

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Anisotropy and magneto-optical properties of sputtered Co/Ni multilayer thin films

IEEE transactions on magnetics, 1994-11, Vol.30 (6), p.4440-4442

1994

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Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV

Thin solid films, 2001-06, Vol.388 (1), p.283-289

2001

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Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices

Surface & coatings technology, 2002-03, Vol.151, p.285-288

2002

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Semiconductor Materials Analysis and Fabrication Process Control

1, 1993

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Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry

Physica status solidi. A, Applications and materials science, 2005-06, Vol.202 (8), p.1688-1692

2005

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Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example

Physical review. B, Condensed matter, 1997-11, Vol.56 (20), p.13306-13313

1997

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Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry

2009 34th IEEE Photovoltaic Specialists Conference (PVSC), 2009, p.001407-001411

2009

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Interfacial electrical properties of ion-beam sputter deposited amorphous carbon on silicon

IEEE electron device letters, 1983-05, Vol.4 (5), p.146-149

1983

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Infrared Ellipsometry - a Novel Tool for Characterization of Group-III Nitride Heterostructures for Optoelectronic Device Applications

Physica status solidi. B. Basic research, 2001-11, Vol.228 (2), p.437-440

2001

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Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range

Journal of applied physics, 1997-09, Vol.82 (6), p.2906-2911

1997

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OPTICAL AND MAGNETO-OPTICAL PERFORMANCE OF OPTIMIZED DISK STRUCTURES

Journal of the Magnetics Society of Japan, 1991, Vol.15(S_1_MORIS_91), pp.S1_361-364

1991

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Quantitative oscillator analysis of IR‐optical spectra on spin‐cast chitosan films

Journal of spectroscopy (Hindawi), 2005-01, Vol.19 (5-6), p.267-274

2005

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Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells

Semiconductor Materials Analysis and Fabrication Process Control

UV–vis–infrared optical and AFM study of spin-cast chitosan films

Determining thickness and refractive index from free-standing ultra-thin polymer films with spectroscopic ellipsometry

Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry

Terahertz ellipsometry and terahertz optical-Hall effect

The Origin of the Berreman Effect in SiC Homostructures

Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry

In Situ Ellipsometry in Microelectronics

Optical properties of RuO2 films deposited by reactive sputtering

Spectroscopic ellipsometry characterization of SiN x antireflection films on textured multicrystalline and monocrystalline silicon solar cells

Metal slanted columnar thin film THz optical sensors

Infrared optical properties and AFM of spin-cast chitosan films chemically modified with 1,2 Epoxy-3-phenoxy-propane

Anisotropy and magneto-optical properties of sputtered Co/Ni multilayer thin films

Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV

Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices

Semiconductor Materials Analysis and Fabrication Process Control

Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry

Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example

Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry

Interfacial electrical properties of ion-beam sputter deposited amorphous carbon on silicon

Infrared Ellipsometry - a Novel Tool for Characterization of Group-III Nitride Heterostructures for Optoelectronic Device Applications

Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range

OPTICAL AND MAGNETO-OPTICAL PERFORMANCE OF OPTIMIZED DISK STRUCTURES

Quantitative oscillator analysis of IR‐optical spectra on spin‐cast chitosan films

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