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Intrinsic Halide Segregation at Nanometer Scale Determines the High Efficiency of Mixed Cation/Mixed Halide Perovskite Solar Cells

Journal of the American Chemical Society, 2016-12, Vol.138 (49), p.15821-15824

2016

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Correlative Microscopy Combining Secondary Ion Mass Spectrometry and Electron Microscopy: Comparison of Intensity–Hue–Saturation and Laplacian Pyramid Methods for Image Fusion

Analytical chemistry (Washington), 2017-10, Vol.89 (20), p.10702-10710

2017

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The Many Faces of Mixed Ion Perovskites: Unraveling and Understanding the Crystallization Process

ACS energy letters, 2017-12, Vol.2 (12), p.2686-2693

2017

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Analysis of hydrogen distribution and migration in fired passivating contacts (FPC)

Solar energy materials and solar cells, 2019-09, Vol.200, p.110018, Article 110018

2019

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Operando structural and chemical imaging of lithium battery interfaces

BIO web of conferences, 2024, Vol.129, p.25006

2024

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A passivating contact for silicon solar cells formed during a single firing thermal annealing

Nature energy, 2018-09, Vol.3 (9), p.800-808

2018

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In vitro exposure of a 3D-tetraculture representative for the alveolar barrier at the air-liquid interface to silver particles and nanowires

Particle and fibre toxicology, 2019-04, Vol.16 (1), p.14-21, Article 14

2019

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Reduction of Matrix Effects in Polystyrene/Poly(methylene methacrylate) Blends by Metal-Assisted Secondary Ion Mass Spectrometry

Analytical chemistry (Washington), 2012-07, Vol.84 (14), p.5920-5924

2012

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High sensitivity and high resolution element 3D analysis by a combined SIMS-SPM instrument

Beilstein journal of nanotechnology, 2015-04, Vol.6 (1), p.1091-1099

2015

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Combining SIMS elemental mapping with FIB-based imaging for multimodal analysis of biological specimen

BIO web of conferences, 2024, Vol.129, p.16010

2024

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A new Ion Microscope for high-resolution imaging and SIMS nano-analytics

BIO web of conferences, 2024, Vol.129, p.5005

2024

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Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

Beilstein journal of nanotechnology, 2016-08, Vol.7 (1), p.1113-1128

2016

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Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

Beilstein journal of nanotechnology, 2020-12, Vol.11 (1), p.1854-1864

2020

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Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

Beilstein journal of nanotechnology, 2016-11, Vol.7 (1), p.1749-1760

2016

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5D-ToF-STIM Hyperspectral Imaging with a keV He+ Focused Ion Beam

BIO web of conferences, 2024, Vol.129, p.6006

2024

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Correlative Microscopy in 3D: Helium Ion Microscopy-Based Photogrammetric Topography Reconstruction Combined with in situ Secondary Ion Mass Spectrometry

Analytical chemistry (Washington), 2018-10, Vol.90 (20), p.11989-11995

2018

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Nanoanalytics for materials science

Beilstein journal of nanotechnology, 2016, Vol.7 (1), p.1674-1675

2016

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Ultrastructural and chemical analysis of human Locus coeruleus using correlative microscopy and mass spectrometry

BIO web of conferences, 2024, Vol.129, p.15009

2024

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High-Resolution Topographic and Chemical Surface Imaging of Chalk for Oil Recovery Improvement Applications

Minerals (Basel), 2022-03, Vol.12 (3), p.356

2022

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Scanning-assisted focal plane-detection system for a sector-field mass spectrometer - Part-I: Simulation and data processing

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2024-08, Vol.1065, p.169535, Article 169535

2024

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CPOpt: A modular framework for genetic algorithm optimization and post-optimization analysis in complex charged particle optical design

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2024-10, Vol.1067, p.169702, Article 169702

2024

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Stationary beam full-field transmission helium ion microscopy using sub-50 keV He + : Projected images and intensity patterns

Beilstein journal of nanotechnology, 2019, Vol.10 (1), p.1648-1657

2019

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Defect formation in multiwalled carbon nanotubes under low-energy He and Ne ion irradiation

Beilstein journal of nanotechnology, 2018, Vol.9 (1), p.1951-1963

2018

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Scanning-Assisted Focal Plane-Detection System for a sector-field mass spectrometer - Part-II: Experimental findings

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2024-12, Vol.1069, p.169842, Article 169842

2024

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Ion beam processing with an ultra-low energy Ar+ micro-polisher: From fundamental understanding to process optimisation

Applied surface science, 2023-12, Vol.639, p.158172, Article 158172

2023

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Intrinsic Halide Segregation at Nanometer Scale Determines the High Efficiency of Mixed Cation/Mixed Halide Perovskite Solar Cells

Correlative Microscopy Combining Secondary Ion Mass Spectrometry and Electron Microscopy: Comparison of Intensity–Hue–Saturation and Laplacian Pyramid Methods for Image Fusion

The Many Faces of Mixed Ion Perovskites: Unraveling and Understanding the Crystallization Process

Analysis of hydrogen distribution and migration in fired passivating contacts (FPC)

Operando structural and chemical imaging of lithium battery interfaces

A passivating contact for silicon solar cells formed during a single firing thermal annealing

In vitro exposure of a 3D-tetraculture representative for the alveolar barrier at the air-liquid interface to silver particles and nanowires

Reduction of Matrix Effects in Polystyrene/Poly(methylene methacrylate) Blends by Metal-Assisted Secondary Ion Mass Spectrometry

High sensitivity and high resolution element 3D analysis by a combined SIMS-SPM instrument

Combining SIMS elemental mapping with FIB-based imaging for multimodal analysis of biological specimen

A new Ion Microscope for high-resolution imaging and SIMS nano-analytics

Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

5D-ToF-STIM Hyperspectral Imaging with a keV He+ Focused Ion Beam

Correlative Microscopy in 3D: Helium Ion Microscopy-Based Photogrammetric Topography Reconstruction Combined with in situ Secondary Ion Mass Spectrometry

Nanoanalytics for materials science

Ultrastructural and chemical analysis of human Locus coeruleus using correlative microscopy and mass spectrometry

High-Resolution Topographic and Chemical Surface Imaging of Chalk for Oil Recovery Improvement Applications

Scanning-assisted focal plane-detection system for a sector-field mass spectrometer - Part-I: Simulation and data processing

CPOpt: A modular framework for genetic algorithm optimization and post-optimization analysis in complex charged particle optical design

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He + : Projected images and intensity patterns

Defect formation in multiwalled carbon nanotubes under low-energy He and Ne ion irradiation

Scanning-Assisted Focal Plane-Detection System for a sector-field mass spectrometer - Part-II: Experimental findings

Ion beam processing with an ultra-low energy Ar+ micro-polisher: From fundamental understanding to process optimisation

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