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The Magic of Cluster SIMS

Analytical chemistry (Washington), 2005-04, Vol.77 (7), p.142 A-149 A

Winograd, Nicholas

2005

Volltextzugriff (PDF)

Strong-field ionization of sputtered molecules for biomolecular imaging

Chemical physics letters, 2009-01, Vol.468 (4), p.264-269

2009

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Three-dimensional depth profiling of molecular structures

Analytical & bioanalytical chemistry (Print), 2009-04, Vol.393 (8), p.1835-1842

2009

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Prospects for imaging TOF-SIMS: from fundamentals to biotechnology

Applied surface science, 2003-01, Vol.203, p.13-19

Winograd, N.

2003

Volltextzugriff (PDF)

Imaging with Mass Spectrometry

Chemical reviews, 1999-10, Vol.99 (10), p.2977-3006

1999

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Characterizing in situ Glycerophospholipids with SIMS and MALDI Methodologies

Surface and interface analysis, 2011-01, Vol.43 (1-2), p.269-271

2011

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Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization

Applied surface science, 2008-12, Vol.255 (4), p.831-833

2008

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Depth profiling by cluster projectiles as seen by computer simulations

Surface and interface analysis, 2011-01, Vol.43 (1-2), p.12-15

2011

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C 60 molecular depth profiling of a model polymer

Applied surface science, 2004-06, Vol.231, p.183-185

2004

Volltextzugriff (PDF)

Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions

Surface and interface analysis, 2011-01, Vol.43 (1-2), p.99-102

2011

Volltextzugriff (PDF)

Strong-Field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling

Journal of physical chemistry. C, 2010-04, Vol.114 (12), p.5391-5399

2010

Volltextzugriff (PDF)

Investigations of molecular depth profiling with dual beam sputtering

Surface and interface analysis, 2013-01, Vol.45 (1), p.175-177

2013

Volltextzugriff (PDF)

Interaction of vapor-deposited Ti and Au with molecular wires

Applied physics letters, 2004-05, Vol.84 (20), p.4008-4010

2004

Volltextzugriff (PDF)

Molecular dynamics simulations of sputtering of organic overlayers by slow, large clusters

Applied surface science, 2008-12, Vol.255 (4), p.841-843

2008

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Chemical Effects of Methyl and Methyl Ester Groups on the Nucleation and Growth of Vapor-Deposited Aluminum Films

Journal of the American Chemical Society, 1999-09, Vol.121 (35), p.8052-8064

1999

Volltextzugriff (PDF)

Fundamental studies of molecular depth profiling using organic delta layers as model systems

Surface and interface analysis, 2011-01, Vol.43 (1-2), p.81-83

2011

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A statistical interpretation of molecular delta layer depth profiles

Surface and interface analysis, 2013-01, Vol.45 (1), p.39-41

2013

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Use of C60 cluster projectiles for sputter depth profiling of polycrystalline metals

Surface and interface analysis, 2004-10, Vol.36 (10), p.1367-1372

2004

Volltextzugriff (PDF)

Cluster SIMS with a hybrid quadrupole time-of-flight mass spectrometer

Applied surface science, 2008-12, Vol.255 (4), p.1610-1613

2008

Volltextzugriff (PDF)

Biological tissue imaging with a hybrid cluster SIMS quadrupole time-of-flight mass spectrometer

Applied surface science, 2008-12, Vol.255 (4), p.1572-1575

2008

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Chemistry of metal atoms reacting with alkanethiol self-assembled monolayers

Applied surface science, 2006-07, Vol.252 (19), p.6686-6688

2006

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Depth profiling studies of multilayer films with a C 60+ ion source

Applied surface science, 2004-06, Vol.231, p.179-182

2004

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Single-Cell Lipidomics: Characterizing and Imaging Lipids on the Surface of Individual Aplysia californica Neurons with Cluster Secondary Ion Mass Spectrometry

Analytical chemistry (Washington), 2013-02, Vol.85 (4), p.2231-2238

2013

Volltextzugriff (PDF)

Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals

Surface and interface analysis, 2011-01, Vol.43 (1-2), p.45-48

2011

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Improving basal reading instruction

1989

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The Magic of Cluster SIMS

Strong-field ionization of sputtered molecules for biomolecular imaging

Three-dimensional depth profiling of molecular structures

Prospects for imaging TOF-SIMS: from fundamentals to biotechnology

Imaging with Mass Spectrometry

Characterizing in situ Glycerophospholipids with SIMS and MALDI Methodologies

Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization

Depth profiling by cluster projectiles as seen by computer simulations

C 60 molecular depth profiling of a model polymer

Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions

Strong-Field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling

Investigations of molecular depth profiling with dual beam sputtering

Interaction of vapor-deposited Ti and Au with molecular wires

Molecular dynamics simulations of sputtering of organic overlayers by slow, large clusters

Chemical Effects of Methyl and Methyl Ester Groups on the Nucleation and Growth of Vapor-Deposited Aluminum Films

Fundamental studies of molecular depth profiling using organic delta layers as model systems

A statistical interpretation of molecular delta layer depth profiles

Use of C60 cluster projectiles for sputter depth profiling of polycrystalline metals

Cluster SIMS with a hybrid quadrupole time-of-flight mass spectrometer

Biological tissue imaging with a hybrid cluster SIMS quadrupole time-of-flight mass spectrometer

Chemistry of metal atoms reacting with alkanethiol self-assembled monolayers

Depth profiling studies of multilayer films with a C 60+ ion source

Single-Cell Lipidomics: Characterizing and Imaging Lipids on the Surface of Individual Aplysia californica Neurons with Cluster Secondary Ion Mass Spectrometry

Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals

Improving basal reading instruction

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