UB Paderborn / Katalog / Suche / in CDI

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1988-06, Vol.269 (1), p.321-328

1988

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A new approach for mapping x‐ray rocking curves

Review of scientific instruments, 1993-07, Vol.64 (7), p.1831-1834

1993

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Microcracks in a GaAs/Si wafer studied by X-ray diffraction

Journal of crystal growth, 1993-03, Vol.129 (1-2), p.134-142

1993

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In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science

Some simple rules for contrast, signal-to-noise and resolution in in-line x-ray phase-contrast imaging

First experiments on the Australian Synchrotron Imaging and Medical beamline, including investigations of the effective source size in respect of X-ray imaging

Quantitative comparison of preparation methodologies for x-ray fluorescence microscopy of brain tissue

Analysis and interpretation of the first monochromatic X-ray tomography data collected at the Australian Synchrotron Imaging and Medical beamline

Optical phase retrieval by use of first Born- and Rytov-type approximations

A Dedicated Micro-Tomography Beamline For The Australian Synchrotron

Effects of incident illumination on in-line phase-contrast imaging

X-ray ultramicroscopy using integrated sample cells

A method for local deconvolution

A flexible configuration for a high-energy phase-contrast imaging beamline involving in-line focusing crystal optics

The role of radiographic phase-contrast imaging in the development of intracochlear electrode arrays

On the concentration, focusing, and collimation of x‐rays and neutrons using microchannel plates and configurations of holes

High resolution investigation of the rod-shaped scattering from a (111) Si surface by a synchrotron radiation source

Quantitative comparison of preparation methodologies for x-ray fluorescence microscopy of brain tissue : Imaging Techniques with Syndchrotron Radiation

X-ray characterization of the microstructure in a CdTe epitaxial layer

Phase-contrast radiography

X-ray phase-contrast microscopy of paper

Consideration of several factors in the method for mapping x‐ray rocking curves

Near-surface region characterization by extremely asymmetric Bragg reflection topography

Measurement of radii of curvature of slightly bent crystals using a one‐dimensional detector

Polarity determination of single-crystal epitaxial layers by x-ray diffraction

A class of condensing-collimating channel-cut monochromators for SAXS, XRPD, and other applications

A new approach for mapping x‐ray rocking curves

Microcracks in a GaAs/Si wafer studied by X-ray diffraction

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