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Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.835-841

2021

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Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories

2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023, p.1-6

2023

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A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash

2019 IEEE Radiation Effects Data Workshop, 2019, p.1-7

2019

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Single-Event Transient Case Study for System-Level Radiation Effects Analysis

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.1002-1007

2021

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Schottky Diode Derating for Survivability in a Heavy Ion Environment

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2482-2489

2015

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Failure Analysis of Heavy Ion-Irradiated Schottky Diodes

IEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.269-279

2018

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NASA Goddard Space Flight Center's Current Radiation Effects Test Results

2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023, p.1-13

2023

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NASA Goddard Space Flight Center's Recent Radiation Effects Test Results

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC), 2022, p.1-7

2022

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NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020, p.1-12

2020

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NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results

2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018, p.1-7

2018

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NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), 2018, p.1-8

2018

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Investigation of Low Dose Rate and Bias Conditions on the Total Dose Tolerance of a CMOS Flash-Based FPGA

IEEE transactions on nuclear science, 2012-02, Vol.59 (1), p.134-143

2012

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Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3366-3372

2010

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Single Event Transient Hardness of a New Complementary (npn + pnp) SiGe HBT Technology on Thick-Film SOI

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3293-3297

2010

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Non-TMR SEU-Hardening Techniques for SiGe HBT Shift Registers and Clock Buffers

IEEE transactions on nuclear science, 2010-08, Vol.57 (4), p.2119-2123

2010

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Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2021, p.1-5

2021

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Room Temperature Radiation Testing of a 500 °C Durable 4H-SiC JFET Integrated Circuit Technology

2019 IEEE Radiation Effects Data Workshop, 2019, p.1-7

2019

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NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

2019 IEEE Radiation Effects Data Workshop, 2019, p.1-10

2019

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An Improved SEL Test of the ADV212 Video Codec

2017 IEEE Radiation Effects Data Workshop (REDW), 2017, p.1-4

2017

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Recent Radiation Test Results for Trench Power MOSFETs

2017 IEEE Radiation Effects Data Workshop (REDW), 2017, p.1-8

2017

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The Enhanced Role of Shallow-Trench Isolation in Ionizing Radiation Damage of 65 nm RF-CMOS on SOI

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3256-3261

2009

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Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

2017 IEEE Radiation Effects Data Workshop (REDW), 2017, p.1-9

2017

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Single Event Response of the Samsung 16G NAND Flash

2013 IEEE Radiation Effects Data Workshop (REDW), 2013, p.1-5

2013

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Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

2015 IEEE Radiation Effects Data Workshop (REDW), 2015, p.1-9

2015

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Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

2017 IEEE Radiation Effects Data Workshop (REDW), 2017, p.1-11

2017

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Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories

A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash

Single-Event Transient Case Study for System-Level Radiation Effects Analysis

Schottky Diode Derating for Survivability in a Heavy Ion Environment

Failure Analysis of Heavy Ion-Irradiated Schottky Diodes

NASA Goddard Space Flight Center's Current Radiation Effects Test Results

NASA Goddard Space Flight Center's Recent Radiation Effects Test Results

NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results

NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Investigation of Low Dose Rate and Bias Conditions on the Total Dose Tolerance of a CMOS Flash-Based FPGA

Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS

Single Event Transient Hardness of a New Complementary (npn + pnp) SiGe HBT Technology on Thick-Film SOI

Non-TMR SEU-Hardening Techniques for SiGe HBT Shift Registers and Clock Buffers

Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

Room Temperature Radiation Testing of a 500 °C Durable 4H-SiC JFET Integrated Circuit Technology

NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

An Improved SEL Test of the ADV212 Video Codec

Recent Radiation Test Results for Trench Power MOSFETs

The Enhanced Role of Shallow-Trench Isolation in Ionizing Radiation Damage of 65 nm RF-CMOS on SOI

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Single Event Response of the Samsung 16G NAND Flash

Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

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