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Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm

Surface and interface analysis, 2013-05, Vol.45 (5), p.873-894

2013

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Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core–Shell Nanoparticles by X‑ray Photoelectron Spectroscopy

Journal of physical chemistry. C, 2018-02, Vol.122 (7), p.4073-4082

2018

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Evaluating the Internal Structure of Core–Shell Nanoparticles Using X‑ray Photoelectron Intensities and Simulated Spectra

Journal of physical chemistry. C, 2015-08, Vol.119 (31), p.17687-17696

2015

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Evaluation of Two Methods for Determining Shell Thicknesses of Core–Shell Nanoparticles by X‑ray Photoelectron Spectroscopy

Journal of physical chemistry. C, 2016-10, Vol.120 (39), p.22730-22738

2016

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Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on silicon

Surface and interface analysis, 2013-02, Vol.45 (2), p.628-638

2013

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Tribological properties of additives for water-based lubricants

Wear, 2010-10, Vol.269 (11), p.804-810

2010

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Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data

Surface and interface analysis, 2011-07, Vol.43 (7), p.1046-1056

2011

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Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations

Surface and interface analysis, 2011-06, Vol.43 (6), p.934-939

2011

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Physics-based simulation models for EBSD: advances and challenges

IOP conference series. Materials Science and Engineering, 2016-02, Vol.109 (1), p.12018-12030

2016

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Energy dependence of electron energy loss processes in Ge 2s photoemission

Surface science, 2007-06, Vol.601 (11), p.2344-2351

2007

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Angular-resolved elastic peak electron spectroscopy: experiment and Monte Carlo calculations

Surface and interface analysis, 2006-04, Vol.38 (4), p.615-619

2006

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Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric

Applied surface science, 2012-02, Vol.258 (8), p.3444-3449

2012

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Correction to “Evaluating the Internal Structure of Core–Shell Nanoparticles Using X‑ray Photoelectron Intensities and Simulated Spectra”

Journal of physical chemistry. C, 2016-02, Vol.120 (4), p.2484-2484

2016

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Interlaboratory study comparing analyses of simulated angle-resolved X-ray photoelectron spectroscopy data

Surface and interface analysis, 2014-05, Vol.46 (5), p.321-332

2014

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Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge

Surface and interface analysis, 2006-04, Vol.38 (4), p.569-573

2006

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Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing

Surface and interface analysis, 2015-01, Vol.47 (1), p.15-21

2015

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Measurement of the differential electron surface and volume excitation probability in Cu, CuO and Cu2O

Surface and interface analysis, 2006-04, Vol.38 (4), p.628-631

2006

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Extracting the Ag surface and volume loss functions from reflection electron energy loss spectra

Surface science, 2008-06, Vol.602 (12), p.2069-2077

2008

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Angular-resolved photoelectron spectroscopy of corrugated surfaces

Surface science, 2005-12, Vol.595 (1), p.212-222

2005

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Reflection electron energy loss spectroscopy of aluminum

Surface science, 2010-06, Vol.604 (11), p.1006-1009

2010

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Effect of surface roughness on angle-resolved XPS

Surface and interface analysis, 2012-08, Vol.44 (8), p.1119-1123

2012

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Behaviour of Corrosion Inhibitors Under Different Tribological Contact

Tribology letters, 2012-03, Vol.45 (3), p.397-409

2012

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Report on the 47th IUVSTA Workshop 'Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films'

Surface and interface analysis, 2009-11, Vol.41 (11), p.840-857

2009

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SiON metrology using angular and energy distributions of photoelectrons

Journal of physics. Conference series, 2013-01, Vol.439 (1), p.12005-9

2013

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Distinguishability of N composition profiles in SiON films on Si by angle-resolved x-ray photoelectron spectroscopy

Applied physics letters, 2006-10, Vol.89 (17)

2006

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Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm

Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core–Shell Nanoparticles by X‑ray Photoelectron Spectroscopy

Evaluating the Internal Structure of Core–Shell Nanoparticles Using X‑ray Photoelectron Intensities and Simulated Spectra

Evaluation of Two Methods for Determining Shell Thicknesses of Core–Shell Nanoparticles by X‑ray Photoelectron Spectroscopy

Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on silicon

Tribological properties of additives for water-based lubricants

Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data

Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations

Physics-based simulation models for EBSD: advances and challenges

Energy dependence of electron energy loss processes in Ge 2s photoemission

Angular-resolved elastic peak electron spectroscopy: experiment and Monte Carlo calculations

Stability of La2O3 and GeO2 passivated Ge surfaces during ALD of ZrO2 high-k dielectric

Correction to “Evaluating the Internal Structure of Core–Shell Nanoparticles Using X‑ray Photoelectron Intensities and Simulated Spectra”

Interlaboratory study comparing analyses of simulated angle-resolved X-ray photoelectron spectroscopy data

Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge

Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing

Measurement of the differential electron surface and volume excitation probability in Cu, CuO and Cu2O

Extracting the Ag surface and volume loss functions from reflection electron energy loss spectra

Angular-resolved photoelectron spectroscopy of corrugated surfaces

Reflection electron energy loss spectroscopy of aluminum

Effect of surface roughness on angle-resolved XPS

Behaviour of Corrosion Inhibitors Under Different Tribological Contact

Report on the 47th IUVSTA Workshop 'Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films'

SiON metrology using angular and energy distributions of photoelectrons

Distinguishability of N composition profiles in SiON films on Si by angle-resolved x-ray photoelectron spectroscopy

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