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Strain and composition in SiGe nanoscale islands studied by x-ray scattering

Physical review. B, Condensed matter, 2000-02, Vol.61 (8), p.5571-5578

2000

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Phonons as probes in self-organized SiGe islands

Applied physics letters, 1997-12, Vol.71 (26), p.3856-3858

1997

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Island chain formation during liquid phase epitaxy of SiGe on silicon

Applied physics letters, 2003-12, Vol.83 (24), p.4927-4929

2003

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Energetic and kinetic aspects of the growth of pseudomorphic SiGe islands

Journal of crystal growth, 2008-07, Vol.310 (14), p.3261-3267

2008

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Strain-induced island scaling during Si1−xGex heteroepitaxy

Applied physics letters, 1998-01, Vol.72 (2), p.179-181

1998

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Self-assembled semiconductor nanostructures: climbing up the ladder of order

Surface science, 2002-08, Vol.514 (1), p.10-18

2002

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Strain and composition in self-assembled SiGe islands by Raman spectroscopy

Journal of applied physics, 2002-05, Vol.91 (10), p.6772-6774

2002

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Self-organized ordering of Si1-xGex nanoscale islands studied by grazing incidence small-angle x-ray scattering

Journal of physics. D, Applied physics, 1999-05, Vol.32, p.A230

1999

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The transition from ripples to islands in strained heteroepitaxial growth under low driving forces

Journal of crystal growth, 1998, Vol.183 (3), p.305-310

1998

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SiGe/Si(001) Stranski-Krastanow islands by liquid-phase epitaxy: Diffuse x-ray scattering versus growth observations

Physical review. B, Condensed matter and materials physics, 2004-02, Vol.69 (7), Article 075317

2004

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HRTEM study of growth-correlated properties of (Si,Ge) islands

Microscopy and microanalysis, 2003-09, Vol.9 (S03), p.220-221

2003

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Structural and electrical properties of silicon epitaxial layers grown by LPE and CVD on identical polycrystalline substrates

Journal of crystal growth, 1997-04, Vol.174 (1), p.680-685

1997

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The nature of ripples and islands in strained SiGe/Si heteroepitaxy: nucleation vs. instability phenomena

MRS proceedings, 1999, Vol.570, Article 199

1999

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Properties of silicon thin films grown by the temperature difference method (TDM)

Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997, 1997, p.771-774

1997

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Investigation of crystalline structures in fats of animals by x-ray scattering (author's transl)

Zeitschrift für Naturforschung. Section C, Biosciences, 1978-01, Vol.33 (1-2), p.28

Wawra, H

1978

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Effect of annealing and deformation on elasticity in the presence of texture and without it

Metal science and heat treatment, 1978-04, Vol.20 (4), p.331-332

Wawra, H.

1978

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On the Role of Grüneisen's Elastic Parameters in the Theory of Polycrystal Elasticity. A Critical Assessment

Physica status solidi. A, Applied research, 1979-07, Vol.54 (1), p.291-296

Wawra†, H. H.

1979

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Schrumpfverbindungen unter Berücksichtigung des Kriechens

Zeitschrift für angewandte Mathematik und Mechanik, 1976-01, Vol.56 (S1)

Wawra, H.

1976

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Röntgenkleinwinkeluntersuchung von Apoferritin in Lösung

Tetrahedron letters, 1964, Vol.5 (38), p.2701-2705

1964

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Coincidence of bounds for some elastic moduli of polycrystals with fibre texture

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1978-10, Vol.38 (4), p.433-437

1978

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Spannungsrißkorrosion in α-Messing in Abhängigkeit von der Anlaßtemperatur und ihr Zusammenhang mit anderen Größen - Teil II

Materials and corrosion, 1973-03, Vol.24 (3), p.210-217

Wawra, H.

1973

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Spannungsrißkorrosion in α-Messing in Abhängigkeit vom Kaltwalzgrad und ihr Zusammenhang mit anderen mechanischen Größen

Materials and corrosion, 1973-01, Vol.24 (1), p.32-38

Wawra, H.

1973

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Self-organized ordering of Si 1- x Ge x nanoscale islands studied by grazing incidence small-angle x-ray scattering

Journal of physics. D, Applied physics, 1999-05, Vol.32 (10A), p.A230-A233

1999

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Self-organized ordering of Si1-xGex nanoscale islands studied by grazing incidence small-angle x-ray scattering: Special issue on high resolution x-ray diffraction and topography

Journal of physics. D, Applied physics, 1999, Vol.32 (10A), p.A230-A233

1999

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A small-angle-scattering camera of medium resolution without slithigh-error (author's transl)

Zeitschrift für Naturforschung. Section C, Biosciences, 1976-11, Vol.31 (11-12), p.635

Wawra, H

1976

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Strain and composition in SiGe nanoscale islands studied by x-ray scattering

Phonons as probes in self-organized SiGe islands

Island chain formation during liquid phase epitaxy of SiGe on silicon

Energetic and kinetic aspects of the growth of pseudomorphic SiGe islands

Strain-induced island scaling during Si1−xGex heteroepitaxy

Self-assembled semiconductor nanostructures: climbing up the ladder of order

Strain and composition in self-assembled SiGe islands by Raman spectroscopy

Self-organized ordering of Si1-xGex nanoscale islands studied by grazing incidence small-angle x-ray scattering

The transition from ripples to islands in strained heteroepitaxial growth under low driving forces

SiGe/Si(001) Stranski-Krastanow islands by liquid-phase epitaxy: Diffuse x-ray scattering versus growth observations

HRTEM study of growth-correlated properties of (Si,Ge) islands

Structural and electrical properties of silicon epitaxial layers grown by LPE and CVD on identical polycrystalline substrates

The nature of ripples and islands in strained SiGe/Si heteroepitaxy: nucleation vs. instability phenomena

Properties of silicon thin films grown by the temperature difference method (TDM)

Investigation of crystalline structures in fats of animals by x-ray scattering (author's transl)

Effect of annealing and deformation on elasticity in the presence of texture and without it

On the Role of Grüneisen's Elastic Parameters in the Theory of Polycrystal Elasticity. A Critical Assessment

Schrumpfverbindungen unter Berücksichtigung des Kriechens

Röntgenkleinwinkeluntersuchung von Apoferritin in Lösung

Coincidence of bounds for some elastic moduli of polycrystals with fibre texture

Spannungsrißkorrosion in α-Messing in Abhängigkeit von der Anlaßtemperatur und ihr Zusammenhang mit anderen Größen - Teil II

Spannungsrißkorrosion in α-Messing in Abhängigkeit vom Kaltwalzgrad und ihr Zusammenhang mit anderen mechanischen Größen

Self-organized ordering of Si 1- x Ge x nanoscale islands studied by grazing incidence small-angle x-ray scattering

Self-organized ordering of Si1-xGex nanoscale islands studied by grazing incidence small-angle x-ray scattering: Special issue on high resolution x-ray diffraction and topography

A small-angle-scattering camera of medium resolution without slithigh-error (author's transl)

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