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IEEE transactions on electron devices, 2001-05, Vol.48 (5), p.1006-1008
2001
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IEEE electron device letters, 1999-05, Vol.20 (5), p.238-240
1999
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Journal of allergy and clinical immunology, 1978, Vol.61 (3), p.155-155
1978
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Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 1997, p.284-289
1997
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1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460), 1999, p.20-23
1999
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Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 1997, p.92-96
1997
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Environmental research letters, 2020-12, Vol.15 (12), p.124068
2020
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Nature communications, 2015-07, Vol.6 (1), p.7870-7870, Article 7870
- Thijssen, Peter E
- Ito, Yuya
- Grillo, Giacomo
- Wang, Jun
- Velasco, Guillaume
- Nitta, Hirohisa
- Unoki, Motoko
- Yoshihara, Minako
- Suyama, Mikita
- Sun, Yu
- Lemmers, Richard J L F
- de Greef, Jessica C
- Gennery, Andrew
- Picco, Paolo
- Kloeckener-Gruissem, Barbara
- Güngör, Tayfun
- Reisli, Ismail
- Picard, Capucine
- Kebaili, Kamila
- Roquelaure, Bertrand
- Iwai, Tsuyako
- Kondo, Ikuko
- Kubota, Takeo
- van Ostaijen-Ten Dam, Monique M
- van Tol, Maarten J D
- Weemaes, Corry
- Francastel, Claire
- van der Maarel, Silvère M
- Sasaki, Hiroyuki
2015
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Environmental research letters, 2017-08, Vol.12 (8), p.84010
2017
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Annals of clinical and translational neurology, 2022-08, Vol.9 (8), p.1302-1309
- Bruels, Christine C.
- Littel, Hannah R.
- Daugherty, Audrey L.
- Stafki, Seth
- Estrella, Elicia A.
- McGaughy, Emily S.
- Truong, Don
- Badalamenti, Jonathan P.
- Pais, Lynn
- Ganesh, Vijay S.
- O'Donnell‐Luria, Anne
- Stalker, Heather J.
- Wang, Yang
- Collins, Christin
- Behlmann, Andrea
- Lemmers, Richard J. L. F.
- Maarel, Silvère M.
- Laine, Regina
- Ghosh, Partha S.
- Darras, Basil T.
- Zingariello, Carla D.
- Pacak, Christina A.
- Kunkel, Louis M.
- Kang, Peter B.
2022
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