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Hallmark of quantum skipping in energy filtered lensless scanning electron microscopy

Applied physics letters, 2022-01, Vol.120 (5)

2022

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Theory Experiment Comparison of the Electron Backscattering Factor from Solids at Low Electron Energy (250-5,000 eV)

Scanning, 2008-01, Vol.30 (1), p.2-15

2008

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The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000 ev: a theory/experiment comparison

Scanning, 2008-09, Vol.30 (5), p.365-380

2008

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The role of oxygen in secondary electron contrast in doped semiconductors using low voltage scanning electron microscopy

Journal of applied physics, 2008-12, Vol.104 (12), p.123713-123713-6

2008

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The sensitivity of backscattering coefficients to elastic scattering cross-sections and electron stopping powers

Scanning, 2014-03, Vol.36 (2), p.241-245

2014

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Benzenethiol adsorption on Au(111) studied by synchrotron ARUPS, HREELS and XPS

Surface science, 1999-04, Vol.425 (2-3), p.195-211

1999

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Quantitative comparison of simulated and measured signals in the STEM mode of a SEM

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2018-01, Vol.415, p.17-24

2018

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The chemisorption of oxygen and its effect on the secondary electron emission from doped semiconductors

Journal of physics. Conference series, 2010-02, Vol.209 (1), p.012055

2010

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Auger parameter studies of amorphous NbSi

Journal of physics. D, Applied physics, 1995-08, Vol.28 (8), p.1702-1706

1995

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Monte Carlo Simulation of Free-standing Thin Films under Low Energy Electron Bombardment: Electron Inelastic Mean Free Path (IMFP) Determination Using Elastic Peak of the Transmitted Electrons

Jordan journal of physics, 2023-10, Vol.16 (4), p.381-393

2023

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A parallel acquisition charged particle energy analyser using a magnetic field

Surface and interface analysis, 2017-01, Vol.49 (1), p.34-46

2017

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Scanning Field Emission Microscopy with Spin and Energy Analysis

2021 34th International Vacuum Nanoelectronics Conference (IVNC), 2021, p.1-2

2021

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Towards quantitative scanning electron microscopy: Applications to nano-scale analysis

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2011-07, Vol.645 (1), p.68-73

2011

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Imaging with STEM Detector, Experiments vs. Simulation

Microscopy and microanalysis, 2015-06, Vol.21 (S4), p.66-71

2015

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A magnetic electron energy analyser for fast data acquisition

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2011-07, Vol.645 (1), p.257-259

2011

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Analysis of Multispectral Microscope Images Using Neural Networks

Surface and interface analysis, 1996-03, Vol.24 (3), p.173-180

Walker, C. G. H.

1996

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The composition dependence of the electronic properties of CuHf and CuZr amorphous metals

Journal of physics. Condensed matter, 1997-10, Vol.9 (41), p.8601-8616

1997

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A third-generation Auger microscope using parallel multispectral data acquisition and analysis

Surface and interface analysis, 1991-02, Vol.17 (2), p.71-84

1991

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Partial densities of states in amorphous alloys from resonant photoemission and Cooper minima

Solid state communications, 1992-05, Vol.82 (7), p.573-577

1992

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The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000ev: a theory/experiment comparison

Scanning, 2008-09, Vol.30 (5), p.365-380

2008

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The role of zirconium and sulphur in the adherence of oxides on superalloys

Applied surface science, 1988-10, Vol.35 (1), p.164-172

1988

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Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer

2021 34th International Vacuum Nanoelectronics Conference (IVNC), 2021, p.1-2

2021

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An estimate of the electron effective mass in titanium nitride using UPS and EELS

Surface science, 1998-09, Vol.412, p.405-414

1998

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An investigation of surface segregation in magnetron-sputtered NbSi using UPS and AES

Surface and interface analysis, 1992-06, Vol.19 (1-12), p.23-26

1992

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Electron energy analysis at the nanometer scale using a near field emission scanning electron microscope (NFESEM)

2018 31st International Vacuum Nanoelectronics Conference (IVNC), 2018, p.1-2

2018

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Hallmark of quantum skipping in energy filtered lensless scanning electron microscopy

Theory Experiment Comparison of the Electron Backscattering Factor from Solids at Low Electron Energy (250-5,000 eV)

The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000 ev: a theory/experiment comparison

The role of oxygen in secondary electron contrast in doped semiconductors using low voltage scanning electron microscopy

The sensitivity of backscattering coefficients to elastic scattering cross-sections and electron stopping powers

Benzenethiol adsorption on Au(111) studied by synchrotron ARUPS, HREELS and XPS

Quantitative comparison of simulated and measured signals in the STEM mode of a SEM

The chemisorption of oxygen and its effect on the secondary electron emission from doped semiconductors

Auger parameter studies of amorphous NbSi

Monte Carlo Simulation of Free-standing Thin Films under Low Energy Electron Bombardment: Electron Inelastic Mean Free Path (IMFP) Determination Using Elastic Peak of the Transmitted Electrons

A parallel acquisition charged particle energy analyser using a magnetic field

Scanning Field Emission Microscopy with Spin and Energy Analysis

Towards quantitative scanning electron microscopy: Applications to nano-scale analysis

Imaging with STEM Detector, Experiments vs. Simulation

A magnetic electron energy analyser for fast data acquisition

Analysis of Multispectral Microscope Images Using Neural Networks

The composition dependence of the electronic properties of CuHf and CuZr amorphous metals

A third-generation Auger microscope using parallel multispectral data acquisition and analysis

Partial densities of states in amorphous alloys from resonant photoemission and Cooper minima

The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250-5000ev: a theory/experiment comparison

The role of zirconium and sulphur in the adherence of oxides on superalloys

Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer

An estimate of the electron effective mass in titanium nitride using UPS and EELS

An investigation of surface segregation in magnetron-sputtered NbSi using UPS and AES

Electron energy analysis at the nanometer scale using a near field emission scanning electron microscope (NFESEM)

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