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Guest Editorial Special Section on the 2012 International Conference on Microelectronic Test Structures

IEEE transactions on semiconductor manufacturing, 2013-08, Vol.26 (3), p.261-261

Weiland, Larg H.

2013

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Extraction of wafer-level defect density distributions to improve yield prediction

IEEE transactions on semiconductor manufacturing, 1999-05, Vol.12 (2), p.175-183

1999

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Passive multiplexer test structure for fast and accurate contact and via fail-rate evaluation

IEEE transactions on semiconductor manufacturing, 2003-05, Vol.16 (2), p.259-265

2003

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Fast extraction of defect size distribution using a single layer short flow NEST structure

IEEE transactions on semiconductor manufacturing, 2001-11, Vol.14 (4), p.330-337

2001

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Evaluation of Truly Passive Crossbar Memory Arrays on Short Flow Characterization Vehicle Test Chips

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), 2019, p.80-84

2019

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Addressable failure site test structures (AFS-TS) for CMOS processes: Design guidelines, fault simulation, and implementation

IEEE transactions on semiconductor manufacturing, 2001-11, Vol.14 (4), p.338-355

2001

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Passive multiplexer test structure for fast and accurate contact and via fail rate evaluation

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002, 2002, p.163-167

2002

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Test structure for the detection, localization and identification of short circuits with a high speed digital tester

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures, 1992, p.139-144

1992

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Harp test structure to electrically determine size distributions of killer defects

IEEE transactions on semiconductor manufacturing, 1998-05, Vol.11 (2), p.194-203

1998

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Influence of short circuits on data of contact and via open circuits determined by a novel weave test structure

IEEE transactions on semiconductor manufacturing, 1996-02, Vol.9 (1), p.27-34

1996

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Logic characterization vehicle to determine process variation impact on yield and performance of digital circuits

Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002, 2002, p.189-196

2002

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Guest Editorial Special Section on the 2012 International Conference on Microelectronic Test Structures

Extraction of wafer-level defect density distributions to improve yield prediction

Passive multiplexer test structure for fast and accurate contact and via fail-rate evaluation

Fast extraction of defect size distribution using a single layer short flow NEST structure

Evaluation of Truly Passive Crossbar Memory Arrays on Short Flow Characterization Vehicle Test Chips

Addressable failure site test structures (AFS-TS) for CMOS processes: Design guidelines, fault simulation, and implementation

Passive multiplexer test structure for fast and accurate contact and via fail rate evaluation

Test structure for the detection, localization and identification of short circuits with a high speed digital tester

Harp test structure to electrically determine size distributions of killer defects

Influence of short circuits on data of contact and via open circuits determined by a novel weave test structure

Logic characterization vehicle to determine process variation impact on yield and performance of digital circuits

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