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The Synergic Effect of Atomic Hydrogen Adsorption and Catalyst Spreading on Ge Nanowire Growth Orientation and Kinking

Nano letters, 2016-08, Vol.16 (8), p.4880-4886

2016

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Real-Time Observation of Collector Droplet Oscillations during Growth of Straight Nanowires

Nano letters, 2014-04, Vol.14 (4), p.1756-1761

2014

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Large area EBSD mapping using a tilt-free configuration and direct electron detection sensor

Microscopy and microanalysis, 2021-08, Vol.27 (S1), p.1832-1835

2021

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In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.548-549

2019

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Tilt-free EBSD

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.1126-1127

2018

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New approaches to in-situ heating in FIB/SEM systems

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.928-929

2017

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Sample Orientation for Electron Channeling Contrast Imaging

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.508-509

2019

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In-situ Heating in SEM and FIB/SEM Systems

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.336-337

2018

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Guided Assembly of Gold Colloidal Nanoparticles on Silicon Substrates Prepatterned by Charged Particle Beams

ACS nano, 2012-11, Vol.6 (11), p.10098-10106

2012

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Expanding Capabilities of Low-kV STEM Imaging and Transmission Electron Diffraction in FIB/SEM Systems

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.554-555

2017

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Tuneable in-situ nanoCT workflow using FIB/SEM

Ultramicroscopy, 2021-06, Vol.225, p.113283-113283, Article 113283

2021

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MEMS-based Heating Element for in-situ Dynamical Experiments on FIB/SEM Systems

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.184-185

2016

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Low energy focused ion beam milling of silicon and germanium nanostructures

Nanotechnology, 2011-03, Vol.22 (10), p.105304

2011

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Controlled faceting in 〈110〉 germanium nanowire growth by switching between vapor-liquid-solid and vapor-solid-solid growth

Applied physics letters, 2012-05, Vol.100 (20), p.203102-203102-4

2012

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The synergic effect of atomic hydrogen and catalyst spreading on Ge nanowire growth orientation and kinking

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.732-733

2016

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In-situ observation of 〈110〉 oriented Ge nanowire growth and associated collector droplet behavior

Applied physics letters, 2011-10, Vol.99 (14), p.143113-143113-3

2011

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Toward Site-Specific Dopant Contrast in Scanning Electron Microscopy

Microscopy and microanalysis, 2014-08, Vol.20 (4), p.1312-1317

2014

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Non-destructive characterization of extended crystalline defects in confined semiconductor device structures

Nanoscale, 2018-04, Vol.10 (15), p.7058-7066

2018

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Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM

Micron (Oxford, England : 1993), 2021-11, Vol.150, p.103123-103123, Article 103123

2021

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In-situ Low Energy Argon Ion Source for the Improvement of EBSD Pattern Acquisition

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.1060-1061

2018

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Enhancing the defect contrast in ECCI through angular filtering of BSEs

Ultramicroscopy, 2020-03, Vol.210, p.112922-112922, Article 112922

2020

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Applications of an in-situ Low Energy Argon Ion Source for Improvement of TEM and SEM Sample Quality

Microscopy and microanalysis, 2017-07, Vol.23 (S1), p.298-299

2017

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Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations

Ultramicroscopy, 2020-03, Vol.210, p.112928-112928, Article 112928

2020

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Control and in-situ imaging of heat & gas mediated processes in FIB/SEM system

Microscopy and microanalysis, 2018-08, Vol.24 (S1), p.808-809

2018

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Non-destructive characterization of extended crystalline defects in confined semiconductor device structuresElectronic supplementary information (ESI) available. See DOI: 10.1039/c8nr00186c

2018-04

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The Synergic Effect of Atomic Hydrogen Adsorption and Catalyst Spreading on Ge Nanowire Growth Orientation and Kinking

Real-Time Observation of Collector Droplet Oscillations during Growth of Straight Nanowires

Large area EBSD mapping using a tilt-free configuration and direct electron detection sensor

In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging

Tilt-free EBSD

New approaches to in-situ heating in FIB/SEM systems

Sample Orientation for Electron Channeling Contrast Imaging

In-situ Heating in SEM and FIB/SEM Systems

Guided Assembly of Gold Colloidal Nanoparticles on Silicon Substrates Prepatterned by Charged Particle Beams

Expanding Capabilities of Low-kV STEM Imaging and Transmission Electron Diffraction in FIB/SEM Systems

Tuneable in-situ nanoCT workflow using FIB/SEM

MEMS-based Heating Element for in-situ Dynamical Experiments on FIB/SEM Systems

Low energy focused ion beam milling of silicon and germanium nanostructures

Controlled faceting in 〈110〉 germanium nanowire growth by switching between vapor-liquid-solid and vapor-solid-solid growth

The synergic effect of atomic hydrogen and catalyst spreading on Ge nanowire growth orientation and kinking

In-situ observation of 〈110〉 oriented Ge nanowire growth and associated collector droplet behavior

Toward Site-Specific Dopant Contrast in Scanning Electron Microscopy

Non-destructive characterization of extended crystalline defects in confined semiconductor device structures

Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM

In-situ Low Energy Argon Ion Source for the Improvement of EBSD Pattern Acquisition

Enhancing the defect contrast in ECCI through angular filtering of BSEs

Applications of an in-situ Low Energy Argon Ion Source for Improvement of TEM and SEM Sample Quality

Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations

Control and in-situ imaging of heat & gas mediated processes in FIB/SEM system

Non-destructive characterization of extended crystalline defects in confined semiconductor device structuresElectronic supplementary information (ESI) available. See DOI: 10.1039/c8nr00186c

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