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The National Ballistics Imaging Comparison (NBIC) project

Forensic science international, 2012-03, Vol.216 (1), p.168-182

2012

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Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years

CIRP annals, 2001, Vol.50 (2), p.471-488

2001

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Applications of cross-correlation functions

Wear, 2011-06, Vol.271 (3), p.529-533

2011

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The effect of tip size on the measured Ra of surface roughness specimens with rectangular profiles

Precision engineering, 2014-01, Vol.38 (1), p.217-220

2014

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Applications of surface metrology in firearm identification

Surface topography metrology and properties, 2014-01, Vol.2 (1), p.14012

2014

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The Second National Ballistics Imaging Comparison (NBIC-2)

Journal of research of the National Institute of Standards and Technology, 2014, Vol.119 (1), p.644-673

2014

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Regimes of surface roughness measurable with light scattering

Applied Optics, 1993-07, Vol.32 (19), p.3401

1993

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Establishing a Traceability and Quality System for U.S. Ballistics Identification Using NIST SRM Standard Bullets and Cartridge Cases

Izvestiâ Saratovskogo universiteta. Novaâ seriâ. Seriâ Èkonomika. Upravlenie. Pravo (Online), 2012, Vol.12 (3), p.53-55

2012

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A fast algorithm for determining the Gaussian filtered mean line in surface metrology

Precision engineering, 2000, Vol.24 (1), p.62-69

2000

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Standards for bullets and casings

Materials today (Kidlington, England), 2002-11, Vol.5 (11), p.26-31

2002

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Photoelectron spectra of the decomposition of ethylene on (110) tungsten

Chemical physics letters, 1974-10, Vol.28 (4), p.510-515

1974

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Optical measurement of the roughness of sinusoidal surfaces

Wear, 1986, Vol.109 (1), p.15-27

1986

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Industrial uses of STM and AFM

Computer standards and interfaces, 1999-06, Vol.21 (2), p.196-196

1999

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Measurements of Roughness of very Smooth Surfaces 1 1Contribution of the U. S. National Bureau of Standards, not subject to copyright, except for Figures 2-10 and 15, reprinted with permission from other sources

CIRP annals, 1987, Vol.36 (2), p.503-509

1987

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Measurements of Roughness of very Smooth Surfaces 1 1 Contribution of the U. S. National Bureau of Standards, not subject to copyright, except for Figures 2-10 and 15, reprinted with permission from other sources

CIRP annals, 1987, Vol.36 (2), p.503-509

1987

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Industrial Uses of STM and AFM Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources

CIRP annals, 1997, Vol.46 (2), p.597-620

1997

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Optical techniques for on-line measurement of surface topography

Precision engineering, 1981-04, Vol.3 (2), p.61-83

1981

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Problems in surface metrology

International journal of machine tools & manufacture, 1998-05, Vol.38 (5), p.417-418

1998

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Comparison between precision roughness master specimens and their electroformed replicas

Precision engineering, 1992-04, Vol.14 (2), p.84-90

1992

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The measurement and uncertainty of a calibration standard for the scanning electron microscope

Journal of research of the National Institute of Standards and Technology, 1994-03, Vol.99 (2), p.191-199

1994

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Standard reference specimens in quality control of engineering surfaces

Journal of research of the National Institute of Standards and Technology, 1991-05, Vol.96 (3), p.271-289

1991

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Surface roughness studies with DALLAS-detector array for laser light angular scattering

Journal of research of the National Bureau of Standards (1977), 1984, Vol.89 (1), p.3-16

1984

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Microform Calibration Uncertainties of Rockwell Diamond Indenters

Journal of research of the National Institute of Standards and Technology, 1995-09, Vol.100 (5), p.543-561

1995

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Stylus-laser surface calibration system

Precision engineering, 1996, Vol.19 (2), p.157-163

1996

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Microform calibrations in surface metrology

International journal of machine tools & manufacture, 1995-02, Vol.35 (2), p.301-310

1995

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The National Ballistics Imaging Comparison (NBIC) project

Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years

Applications of cross-correlation functions

The effect of tip size on the measured Ra of surface roughness specimens with rectangular profiles

Applications of surface metrology in firearm identification

The Second National Ballistics Imaging Comparison (NBIC-2)

Regimes of surface roughness measurable with light scattering

Establishing a Traceability and Quality System for U.S. Ballistics Identification Using NIST SRM Standard Bullets and Cartridge Cases

A fast algorithm for determining the Gaussian filtered mean line in surface metrology

Standards for bullets and casings

Photoelectron spectra of the decomposition of ethylene on (110) tungsten

Optical measurement of the roughness of sinusoidal surfaces

Industrial uses of STM and AFM

Measurements of Roughness of very Smooth Surfaces 1 1Contribution of the U. S. National Bureau of Standards, not subject to copyright, except for Figures 2-10 and 15, reprinted with permission from other sources

Measurements of Roughness of very Smooth Surfaces 1 1 Contribution of the U. S. National Bureau of Standards, not subject to copyright, except for Figures 2-10 and 15, reprinted with permission from other sources

Industrial Uses of STM and AFM Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources

Optical techniques for on-line measurement of surface topography

Problems in surface metrology

Comparison between precision roughness master specimens and their electroformed replicas

The measurement and uncertainty of a calibration standard for the scanning electron microscope

Standard reference specimens in quality control of engineering surfaces

Surface roughness studies with DALLAS-detector array for laser light angular scattering

Microform Calibration Uncertainties of Rockwell Diamond Indenters

Stylus-laser surface calibration system

Microform calibrations in surface metrology

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