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Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library

Ultramicroscopy, 2015-07, Vol.154 (C), p.15-28

2015

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Modeling the Point-Spread Function in Helium-Ion Lithography

Scanning, 2012-03, Vol.34 (2), p.121-128

2012

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Research Update: Electron beam-based metrology after CMOS

APL materials, 2018-07, Vol.6 (7), p.070701-070701-14

2018

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Simulated SEM images for resolution measurement

Scanning, 2008-09, Vol.30 (5), p.381-391

2008

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Scanning electron microscope measurement of width and shape of 10nm patterned lines using a JMONSEL-modeled library

Ultramicroscopy, 2015-07, Vol.154, p.15-28

2015

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Sample preparation protocols for realization of reproducible characterization of single-wall carbon nanotubes

Metrologia, 2009-12, Vol.46 (6), p.682-692

2009

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Understanding Surface Modification of Silicon-based Materials using Gas Field Ion Source FIB for Nano-Machining Applications

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.830-831

2012

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Silicon nanostructures fabricated by scanning probe oxidation and tetra-methyl ammonium hydroxide etching

Journal of applied physics, 2002-06, Vol.91 (12), p.10044-10050

2002

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Widening the Window of Particle Beam Technology: Helium Ion Microscopy

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.802-803

2012

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Scanning electron microscope dimensional metrology using a model-based library

Surface and interface analysis, 2005-11, Vol.37 (11), p.951-958

2005

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He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.1186-1187

2008

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Progression of Focused Helium Ion Beam Milling in Gold Substrates

Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.1979-1980

2015

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Electron beam-based metrology after CMOS

APL materials, 2018, Vol.6

2018

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Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates

Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.336-337

2014

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Helium Ion Nanomachining in Membranes and Bulk Substrates

Microscopy and microanalysis, 2013-08, Vol.19 (S2), p.910-911

2013

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A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes

Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.808-809

2012

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Electron Beam-Induced Sample Contamination in the SEM

Microscopy and microanalysis, 2005-08, Vol.11 (S02), p.764-765

2005

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Computation of Current Density in Particle Beams

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.936-937

2008

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Image sharpness measurement in the scanning electron microscope-Part III

Scanning, 1999-07, Vol.21 (4), p.246-252

1999

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639 Regulatory function of TRPV4 on the dermal component of inflammatory skin conditions

Journal of investigative dermatology, 2019-09, Vol.139 (9), p.S324-S324

2019

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401 Pruriceptive role of TRPM3

Journal of investigative dermatology, 2019-09, Vol.139 (9), p.S283-S283

2019

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Nanostructure Fabrication by Ultra-high Resolution Environmental Scanning Electron Microscopy

Microscopy and microanalysis, 2007-08, Vol.13 (S02), p.1470-1471

2007

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Reference Material (RM) 8820: A New Scanning Electron Microscope Scale Calibration Artifact

Microscopy and microanalysis, 2009-07, Vol.15 (S2), p.668-669

2009

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The Diffusion of Mobile Data Services in the United States and Korea

2008 7th International Conference on Mobile Business, 2008, p.112-125

2008

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IEEE_Xplore

Nano-tip Electron Gun for the Scanning Electron Microscope

Microscopy and microanalysis, 2005-08, Vol.11 (S02), p.766-767

2005

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Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library

Modeling the Point-Spread Function in Helium-Ion Lithography

Research Update: Electron beam-based metrology after CMOS

Simulated SEM images for resolution measurement

Scanning electron microscope measurement of width and shape of 10nm patterned lines using a JMONSEL-modeled library

Sample preparation protocols for realization of reproducible characterization of single-wall carbon nanotubes

Understanding Surface Modification of Silicon-based Materials using Gas Field Ion Source FIB for Nano-Machining Applications

Silicon nanostructures fabricated by scanning probe oxidation and tetra-methyl ammonium hydroxide etching

Widening the Window of Particle Beam Technology: Helium Ion Microscopy

Scanning electron microscope dimensional metrology using a model-based library

He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images

Progression of Focused Helium Ion Beam Milling in Gold Substrates

Electron beam-based metrology after CMOS

Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates

Helium Ion Nanomachining in Membranes and Bulk Substrates

A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes

Electron Beam-Induced Sample Contamination in the SEM

Computation of Current Density in Particle Beams

Image sharpness measurement in the scanning electron microscope-Part III

639 Regulatory function of TRPV4 on the dermal component of inflammatory skin conditions

401 Pruriceptive role of TRPM3

Nanostructure Fabrication by Ultra-high Resolution Environmental Scanning Electron Microscopy

Reference Material (RM) 8820: A New Scanning Electron Microscope Scale Calibration Artifact

The Diffusion of Mobile Data Services in the United States and Korea

Nano-tip Electron Gun for the Scanning Electron Microscope

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