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IEEE transactions on very large scale integration (VLSI) systems, 2013-02, Vol.21 (2), p.306-319
2013
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Electronics (Basel), 2021-09, Vol.10 (18), p.2222
2021
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IEEE transactions on very large scale integration (VLSI) systems, 2013-05, Vol.21 (5), p.958-970
2013
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Proceedings of the IEEE, 2020-12, Vol.108 (12), p.2178-2194
2020
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Proceedings of the IEEE, 2021-02, Vol.109 (2), p.149-169
2021
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Microelectronics and reliability, 2022-08, Vol.135, p.114595, Article 114595
2022
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IEEE transactions on very large scale integration (VLSI) systems, 2021-06, Vol.29 (6), p.1122-1131
2021
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IEEE transactions on nanotechnology, 2019, Vol.18, p.849-857
2019
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Microelectronics and reliability, 2023-08, Vol.147, p.115029, Article 115029
2023
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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, p.810-815
2020
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2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021, p.1580-1585
2021
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2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021, Vol.126, p.1877-1880
2021
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2022 IEEE International Test Conference (ITC), 2022, p.484-488
2022
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2020 IEEE International Test Conference (ITC), 2020, p.1-10
2020
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Journal of electronic testing, 2020-02, Vol.36 (1), p.33-46
2020
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2021 IEEE International Test Conference (ITC), 2021, p.1-9
2021
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IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1747-1754
2014
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IEEE transactions on very large scale integration (VLSI) systems, 2014-10, Vol.22 (10), p.2131-2144
2014
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IEEE transactions on nuclear science, 2013-08, Vol.60 (4), p.2617-2622
2013
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IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3095-3102
2014
- Link zum Volltext
2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2018, p.1-6
2018
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IEEE transactions on very large scale integration (VLSI) systems, 2014-11, Vol.22 (11), p.2326-2335
2014
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IEEE transactions on electron devices, 2014-11, Vol.61 (11), p.3877-3882
2014
- Link zum Volltext
2018 IEEE International Test Conference (ITC), 2018, p.1-8
2018
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IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1663-1670
2014
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