UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

A Study of Tapered 3-D TSVs for Power and Thermal Integrity

IEEE transactions on very large scale integration (VLSI) systems, 2013-02, Vol.21 (2), p.306-319

2013

Volltextzugriff (PDF)

Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

IEEE transactions on very large scale integration (VLSI) systems, 2013-05, Vol.21 (5), p.958-970

2013

Volltextzugriff (PDF)

A Survey of Testing Techniques for Approximate Integrated Circuits

Proceedings of the IEEE, 2020-12, Vol.108 (12), p.2178-2194

2020

Volltextzugriff (PDF)

A Survey of Test and Reliability Solutions for Magnetic Random Access Memories

Proceedings of the IEEE, 2021-02, Vol.109 (2), p.149-169

2021

Volltextzugriff (PDF)

A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure

IEEE transactions on nanotechnology, 2019, Vol.18, p.849-857

2019

Volltextzugriff (PDF)

A comprehensive framework for cell-aware diagnosis of customer returns

Microelectronics and reliability, 2022-08, Vol.135, p.114595, Article 114595

2022

Volltextzugriff (PDF)

Improving TID Radiation Robustness of a CMOS OxRAM-Based Neuron Circuit by Using Enclosed Layout Transistors

IEEE transactions on very large scale integration (VLSI) systems, 2021-06, Vol.29 (6), p.1122-1131

2021

Volltextzugriff (PDF)

Analysis of resistive defects on a foundry 8T SRAM-based IMC architecture

Microelectronics and reliability, 2023-08, Vol.147, p.115029, Article 115029

2023

Volltextzugriff (PDF)

Maximizing Yield for Approximate Integrated Circuits

2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020, p.810-815

2020

Volltextzugriff (PDF)

A Novel March Test Algorithm for Testing 8T SRAM-Based IMC Architectures

2024 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024, p.1-6

2024

Volltextzugriff (PDF)

Maximizing yield for approximate integrated circuits

Proceedings of the 23rd Conference on Design, Automation and Test in Europe, 2020, p.810-815

2020

Volltextzugriff (PDF)

A Comprehensive Learning-Based Flow for Cell-Aware Model Generation

2022 IEEE International Test Conference (ITC), 2022, p.484-488

2022

Volltextzugriff (PDF)

A Learning-Based Methodology for Accelerating Cell-Aware Model Generation

2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021, p.1580-1585

2021

Volltextzugriff (PDF)

A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns

2020 IEEE International Test Conference (ITC), 2020, p.1-10

2020

Volltextzugriff (PDF)

On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits

Journal of electronic testing, 2020-02, Vol.36 (1), p.33-46

2020

Volltextzugriff (PDF)

Multiple Cell Upset Classification in Commercial SRAMs

IEEE transactions on nuclear science, 2014-08, Vol.61 (4), p.1747-1754

2014

Volltextzugriff (PDF)

Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation

2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021, Vol.126, p.1877-1880

2021

Volltextzugriff (PDF)

A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors

2021 IEEE International Test Conference (ITC), 2021, p.1-9

2021

Volltextzugriff (PDF)

Multi-Level Control of Resistive RAM (RRAM) Using a Write Termination to Achieve 4 Bits/Cell in High Resistance State

Electronics (Basel), 2021-09, Vol.10 (18), p.2222

2021

Volltextzugriff (PDF)

Globally Constrained Locally Optimized 3-D Power Delivery Networks

IEEE transactions on very large scale integration (VLSI) systems, 2014-10, Vol.22 (10), p.2131-2144

2014

Volltextzugriff (PDF)

HPET: An Efficient Hybrid Power Estimation Technique to Improve High-Level Power Characterization

Journal of circuits, systems, and computers, 2017-08, Vol.26 (8), p.1740004

2017

Volltextzugriff (PDF)

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

IEEE transactions on nuclear science, 2013-08, Vol.60 (4), p.2617-2622

2013

Volltextzugriff (PDF)

Dynamic Test Methods for COTS SRAMs

IEEE transactions on nuclear science, 2014-12, Vol.61 (6), p.3095-3102

2014

Volltextzugriff (PDF)

Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits

2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2018, p.1-6

2018

Volltextzugriff (PDF)

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

IEEE transactions on very large scale integration (VLSI) systems, 2014-11, Vol.22 (11), p.2326-2335

2014

Volltextzugriff (PDF)

1 – 25 von 188

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(48)
Mit Volltextzugriff
(164)

Publikationsform

Sprache

Englisch
(188)

Erscheinungsjahr

n.n

Thema

Engineering Sciences
(176)
Micro And Nanotechnologies
(153)
Microelectronics
(153)
Science & Technology
(132)
Technology
(132)
Engineering
(120)
Engineering, Electrical & Electronic
(120)
Computer Science
(82)
Computer Science, Hardware & Architecture
(66)
Circuit Faults
(62)
Random Access Memory
(41)
Testing
(33)
Electronics
(32)
Integrated Circuits
(25)
Logic Gates
(23)
Transistors
(23)
Power Demand
(22)
Integrated Circuit Modeling
(20)
Computer Science, Theory & Methods
(19)
Fault Tolerance
(19)

15 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

A Study of Tapered 3-D TSVs for Power and Thermal Integrity

Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

A Survey of Testing Techniques for Approximate Integrated Circuits

A Survey of Test and Reliability Solutions for Magnetic Random Access Memories

A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure

A comprehensive framework for cell-aware diagnosis of customer returns

Improving TID Radiation Robustness of a CMOS OxRAM-Based Neuron Circuit by Using Enclosed Layout Transistors

Analysis of resistive defects on a foundry 8T SRAM-based IMC architecture

Maximizing Yield for Approximate Integrated Circuits

A Novel March Test Algorithm for Testing 8T SRAM-Based IMC Architectures

Maximizing yield for approximate integrated circuits

A Comprehensive Learning-Based Flow for Cell-Aware Model Generation

A Learning-Based Methodology for Accelerating Cell-Aware Model Generation

A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns

On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits

Multiple Cell Upset Classification in Commercial SRAMs

Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation

A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors

Multi-Level Control of Resistive RAM (RRAM) Using a Write Termination to Achieve 4 Bits/Cell in High Resistance State

Globally Constrained Locally Optimized 3-D Power Delivery Networks

HPET: An Efficient Hybrid Power Estimation Technique to Improve High-Level Power Characterization

Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode

Dynamic Test Methods for COTS SRAMs

Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Suchergebnisse filtern