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Fatigue crack growth anisotropy, texture and residual stress in austenitic steel made by wire and arc additive manufacturing

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2018-05, Vol.724, p.431-438

2018

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Metalorganic Vapor Phase Epitaxy of III-Nitride Light-Emitting Diodes on Nanopatterned AGOG Sapphire Substrate by Abbreviated Growth Mode

IEEE journal of selected topics in quantum electronics, 2009-07, Vol.15 (4), p.1066-1072

2009

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IEEE_Xplore

Direct correlations between fracture toughness and grain boundary segregation behavior in ytterbium-doped magnesium aluminate spinel

Scripta materialia, 2013-07, Vol.69 (1), p.81-84

2013

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Anelastic Stress Relaxation in Gold Films and Its Impact on Restoring Forces in MEMS Devices

Journal of microelectromechanical systems, 2009-06, Vol.18 (3), p.570-576

2009

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IEEE_Xplore

Mechanical Properties of Intermetallic Compounds in the Au–Sn System

Journal of materials research, 2005-08, Vol.20 (8), p.2161-2172

2005

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Development of shear band structure during deformation of a Zr57Ti5cu20Ni8Al10 bulk metallic glass

Scripta materialia, 2000-11, Vol.43 (12), p.1071-1075

2000

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Thermal strain and stress in copper thin films

Thin solid films, 1995-06, Vol.262 (1), p.142-153

1995

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The effects of solid solution and oxide dispersion alloying on the viscoelastic behavior of Au alloy thin films

Acta materialia, 2019-04, Vol.168, p.275-286

2019

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The Role of Grain Boundary Dislocations in the Segregation-Induced Grain Boundary Embrittlement of Copper by Bismuth

Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.1264-1265

2016

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Comparison of electrical and microtensile evaluations of mechanical properties of an aluminum film

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2007-09, Vol.38 (13), p.2160-2167

2007

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Photoinduced changes in the surface morphology of As50Se50 chalcogenide glass films

Optical materials, 2001-09, Vol.17 (4), p.453-458

2001

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The influence of strain energy on abnormal grain growth in copper thin films

Applied physics letters, 1995-08, Vol.67 (8), p.1078-1080

1995

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Development of shear band structure during deformation of a Zr 57Ti 5Cu 20Ni 8Al 10 bulk metallic glass

Scripta materialia, 2000, Vol.43 (12), p.1071-1075

2000

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Growths of InGaN quantum wells light-emitting diodes on nano-patterned AGOG sapphire substrate using abbreviated growth mode

2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum electronics and Laser Science Conference, 2009, p.1-2

2009

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IEEE_Xplore

Thin Films: Texture Effects on Mechanical Properties

Encyclopedia of Materials: Science and Technology, 2011, p.9283-9285

Vinci, R.P.

2011

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Photoinduced changes in the surface morphology of As 50Se 50 chalcogenide glass films

Optical materials, 2001, Vol.17 (4), p.453-458

2001

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Observations of Low Cycle Fatigue of Al Thin Films for Mems Applications

MRS proceedings, 1998, Vol.518, Article 81

1998

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Effects of barrier layer and processing conditions on thin film Cu microstructure

Journal of electronic materials, 1995-10, Vol.24 (10), p.1485-1492

1995

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Thermal Stresses in Passivated Copper Interconnects Determined by X-Ray Analysis and Finite Element Modeling

MRS proceedings, 1994, Vol.338, Article 289

1994

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The Effects of Processing on the Microstructure of Copper Thin Films on Tantalum Barrier Layers

MRS proceedings, 1995, Vol.391, Article 303

1995

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Influence of Film Thickness and Capping Layer on the Mechanical Properties of Copper Films

MRS proceedings, 1995, Vol.391, Article 309

1995

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A Simple Analysis of Average Mechanical Behavior and Strain Energy Density of Misoriented Grains in a Textured Film

MRS proceedings, 1995, Vol.391, Article 97

1995

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Improved Photoluminescence of InGaN Quantum Wells Grown on Nano-Patterned AGOG Sapphire Substrate by Metalorganic Vapor Phase Epitaxy

LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings, 2007, p.902-903

2007

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IEEE_Xplore

Mechanical testing of thin films

TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers, 1991, p.943-948

1991

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IEEE_Xplore

Femtosecond-irradiation-induced refractive-index changes and channel waveguiding in bulk Ti{sup 3+}:Sapphire

Applied physics letters, 2004-08, Vol.85 (7)

2004

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Fatigue crack growth anisotropy, texture and residual stress in austenitic steel made by wire and arc additive manufacturing

Metalorganic Vapor Phase Epitaxy of III-Nitride Light-Emitting Diodes on Nanopatterned AGOG Sapphire Substrate by Abbreviated Growth Mode

Direct correlations between fracture toughness and grain boundary segregation behavior in ytterbium-doped magnesium aluminate spinel

Anelastic Stress Relaxation in Gold Films and Its Impact on Restoring Forces in MEMS Devices

Mechanical Properties of Intermetallic Compounds in the Au–Sn System

Development of shear band structure during deformation of a Zr57Ti5cu20Ni8Al10 bulk metallic glass

Thermal strain and stress in copper thin films

The effects of solid solution and oxide dispersion alloying on the viscoelastic behavior of Au alloy thin films

The Role of Grain Boundary Dislocations in the Segregation-Induced Grain Boundary Embrittlement of Copper by Bismuth

Comparison of electrical and microtensile evaluations of mechanical properties of an aluminum film

Photoinduced changes in the surface morphology of As50Se50 chalcogenide glass films

The influence of strain energy on abnormal grain growth in copper thin films

Development of shear band structure during deformation of a Zr 57Ti 5Cu 20Ni 8Al 10 bulk metallic glass

Growths of InGaN quantum wells light-emitting diodes on nano-patterned AGOG sapphire substrate using abbreviated growth mode

Thin Films: Texture Effects on Mechanical Properties

Photoinduced changes in the surface morphology of As 50Se 50 chalcogenide glass films

Observations of Low Cycle Fatigue of Al Thin Films for Mems Applications

Effects of barrier layer and processing conditions on thin film Cu microstructure

Thermal Stresses in Passivated Copper Interconnects Determined by X-Ray Analysis and Finite Element Modeling

The Effects of Processing on the Microstructure of Copper Thin Films on Tantalum Barrier Layers

Influence of Film Thickness and Capping Layer on the Mechanical Properties of Copper Films

A Simple Analysis of Average Mechanical Behavior and Strain Energy Density of Misoriented Grains in a Textured Film

Improved Photoluminescence of InGaN Quantum Wells Grown on Nano-Patterned AGOG Sapphire Substrate by Metalorganic Vapor Phase Epitaxy

Mechanical testing of thin films

Femtosecond-irradiation-induced refractive-index changes and channel waveguiding in bulk Ti{sup 3+}:Sapphire

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