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The European physical journal. A, Hadrons and nuclei, 2005-09, Vol.25 (S1), p.287-288
- Pollacco, E.
- Beaumel, D.
- Roussel-Chomaz, P.
- Atkin, E.
- Baron, P.
- Baronick, J. P.
- Becheva, E.
- Blumenfeld, Y.
- Boujrad, A.
- Drouart, A.
- Druillole, F.
- Edelbruck, P.
- Gelin, M.
- Gillibert, A.
- Houarner, Ch
- Lapoux, V.
- Lavergne, L.
- Leberthe, G.
- Leterrier, L.
- Le Ven, V.
- Lugiez, F.
- Nalpas, L.
- Olivier, L.
- Paul, B.
- Raine, B.
- Richard, A.
- Rouger, M.
- Saillant, F.
- Skaza, F.
- Tripon, M.
- Vilmay, M.
- Wanlin, E.
- Wittwer, M.
2005
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Microelectronic engineering, 2008-10, Vol.85 (10), p.2075-2078
2008
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Microelectronic engineering, 2008-10, Vol.85 (10), p.2098-2101
2008
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Microelectronic engineering, 2008-10, Vol.85 (10), p.2075-2078
2008
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2009 IEEE International Reliability Physics Symposium, 2009, p.606-612
2009
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Physical review. C, Nuclear physics, 2008-04, Vol.77 (4)
2008
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2009 IEEE International Integrated Reliability Workshop Final Report, 2009, p.106-110
2009
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The European physical journal. A, Hadrons and nuclei, 2008, Vol.35 (2), p.167-170
2008
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2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.1-19
2008
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Physical review. C, Nuclear physics, 2008-04, Vol.77 (4), Article 042801
2008
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2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.16-20
2008
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IEEE transactions on device and materials reliability, 2009-06, Vol.9 (2), p.120-127
2009
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2009 IEEE International Interconnect Technology Conference, 2009, p.179-181
2009
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2009 IEEE International Interconnect Technology Conference, 2009, p.122-124
2009
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2007 IEEE International Interconnect Technology Conferencee, 2007, p.175-177
2007
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2009 IEEE International Interconnect Technology Conference, 2009, p.155-156
2009
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IEEE transactions on device and materials reliability, 2009-06, Vol.9 (2), p.120
2009
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