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Swift Ion Beam Analysis in Nanosciences

Denis Jalabert, Ian Vickridge, Amal Chabli

1, 2017

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The carbon and hydrogen contents in ALD-grown ZnO films define a narrow ALD temperature window

Vacuum, 2021-08, Vol.190, p.110289, Article 110289

2021

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18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films

Journal of applied physics, 2021-09, Vol.130 (10)

2021

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RBS and NRA analysis for films with high growth rate prepared by atomic layer deposition

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2021-02, Vol.489, p.20-25

2021

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Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations

Applied surface science, 2022-11, Vol.601, p.154233, Article 154233

2022

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Elastic backscattering during boron implantation in Si1-Ge

Vacuum, 2024-01, Vol.219, p.112740, Article 112740

2024

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ToF-SIMS and ERDA study of hydrogen and deuterium in nickel-base alloys oxidized in water

Corrosion science, 2018-08, Vol.140, p.151-158

2018

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Rutherford backscattering spectrometry analysis of InGaAs nanostructures

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2019-03, Vol.37 (2)

2019

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Tracer study of pore initiation in anodic alumina formed in phosphoric acid

Electrochimica acta, 2013-12, Vol.113, p.302-312

2013

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Sewers - Rehabilitation and New Construction - Repair and Renovation

1997

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Measurement of (p,p) elastic differential cross sections for 17O in the 0.6–2 MeV range at 165

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2022-04, Vol.516, p.15-22

2022

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Determination and benchmarking of 27Al(d,α) and 27Al(d,p) reaction cross sections for energies and angles relevant to NRA

Scientific reports, 2021-09, Vol.11 (1), p.18036-18036, Article 18036

2021

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Elastic backscattering during boron implantation in Si1-xGex

Vacuum, 2024-01, Vol.219

2024

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Sewers: Repair and Renovation

Geoffrey F Read, Ian Vickridge

1996

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Method for Determining the Polymer Content in Nonsoluble Polydiacetylene Films: Application to Pentacosadiynoic Acid

Langmuir, 2017-02, Vol.33 (6), p.1419-1426

2017

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A systematical investigation of layer growth rate, impurity level and morphology evolution in TiO2 thin films grown by ALD between 100 and 300 °C

Vacuum, 2023-10, Vol.216, p.112408, Article 112408

2023

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NIMB Editorial for 2009

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2009, Vol.267 (1), p.1-2

2009

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Low resistivity amorphous carbon-based thin films employed as anti-reflective coatings on copper

Thin solid films, 2020-10, Vol.712, p.138319, Article 138319

2020

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Harnessing Atomic Layer Deposition and Diffusion to Spatially Localize Rare-Earth Ion Emitters

Journal of physical chemistry. C, 2020-09, Vol.124 (36), p.19725-19735

2020

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Chemically vapor deposited Eu3+:Y2O3 thin films as a material platform for quantum technologies

Journal of applied physics, 2020-08, Vol.128 (5)

2020

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Chemically vapor deposited Eu 3+ :Y 2 O 3 thin films as a material platform for quantum technologies

Journal of applied physics, 2020-08, Vol.128 (5)

2020

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XPS and NRA investigations during the fabrication of gold nanostructured functionalized screen-printed sensors for the detection of metallic pollutants

Applied surface science, 2017-03, Vol.397, p.159-166

2017

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Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

Journal of applied physics, 2018-07, Vol.124 (3)

2018

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Li-Ion Intercalation in Thermal Oxide Thin Films of MoO3 as Studied by XPS, RBS, and NRA

Journal of physical chemistry. C, 2008-07, Vol.112 (29), p.11050-11058

2008

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NIMB Editorial for 2008

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2008, Vol.266 (1), p.1-1

2008

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Swift Ion Beam Analysis in Nanosciences

The carbon and hydrogen contents in ALD-grown ZnO films define a narrow ALD temperature window

18O(p,α)15N isotopic tracing of germanium diffusion in SiO2/Si films

RBS and NRA analysis for films with high growth rate prepared by atomic layer deposition

Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations

Elastic backscattering during boron implantation in Si1-Ge

ToF-SIMS and ERDA study of hydrogen and deuterium in nickel-base alloys oxidized in water

Rutherford backscattering spectrometry analysis of InGaAs nanostructures

Tracer study of pore initiation in anodic alumina formed in phosphoric acid

Sewers - Rehabilitation and New Construction - Repair and Renovation

Measurement of (p,p) elastic differential cross sections for 17O in the 0.6–2 MeV range at 165

Determination and benchmarking of 27Al(d,α) and 27Al(d,p) reaction cross sections for energies and angles relevant to NRA

Elastic backscattering during boron implantation in Si1-xGex

Sewers: Repair and Renovation

Method for Determining the Polymer Content in Nonsoluble Polydiacetylene Films: Application to Pentacosadiynoic Acid

A systematical investigation of layer growth rate, impurity level and morphology evolution in TiO2 thin films grown by ALD between 100 and 300 °C

NIMB Editorial for 2009

Low resistivity amorphous carbon-based thin films employed as anti-reflective coatings on copper

Harnessing Atomic Layer Deposition and Diffusion to Spatially Localize Rare-Earth Ion Emitters

Chemically vapor deposited Eu3+:Y2O3 thin films as a material platform for quantum technologies

Chemically vapor deposited Eu 3+ :Y 2 O 3 thin films as a material platform for quantum technologies

XPS and NRA investigations during the fabrication of gold nanostructured functionalized screen-printed sensors for the detection of metallic pollutants

Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

Li-Ion Intercalation in Thermal Oxide Thin Films of MoO3 as Studied by XPS, RBS, and NRA

NIMB Editorial for 2008

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