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A 450-Mb/s analog front end for PRML read channels

IEEE journal of solid-state circuits, 1999-11, Vol.34 (11), p.1661-1675

1999

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IEEE_Xplore

‘3-Dimensional’ TEM silicon-device analysis by combining plan-view and FIB sample preparation

Materials science & engineering. B, Solid-state materials for advanced technology, 2003-09, Vol.102 (1), p.63-69

De Veirman, A.E.M.

2003

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Structural and electrical characterization of heteroepitaxial lead zirconate titanate thin films

Journal of applied physics, 1996-01, Vol.79 (1), p.393-402

1996

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Inverted spin valves for magnetic heads and sensors

Journal of applied physics, 1997-04, Vol.81 (8), p.4915-4917

1997

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On the ferromagnetic interlayer coupling in exchange-biased spin-valve multilayers

IEEE transactions on magnetics, 1995-11, Vol.31 (6), p.3918-3920

1995

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IEEE_Xplore

Columnar microstructures in magnetron-sputtered refractory metal thin films of tungsten, molybdenum and W-Ti-(N)

Thin solid films, 1992-02, Vol.208 (2), p.181-188

1992

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The use of a focused-ion-beam machine to prepare transmission electron microscopy samples of residual photoresist

Micron (Oxford, England : 1993), 1999-06, Vol.30 (3), p.213-220

1999

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The structure of heteroepitaxial lead titanate layers grown by organometallic chemical vapour deposition

Thin solid films, 1995-10, Vol.266 (2), p.157-167

1995

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Pulse switching characterization of organometallic chemical vapor deposited PbZrxTi1−xO3 thin films for high-density memory applications

Integrated ferroelectrics, 1995-02, Vol.7 (1-4), p.123-138

1995

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Spectroscopic ellipsometry and transmission electron microscopy study of annealed high-dose oxygen implanted silicon

Journal of applied physics, 1989-06, Vol.65 (11), p.4454-4456

1989

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Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi5

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1994-11, Vol.70 (5), p.837-849

1994

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Defects in high-dose oxygen implanted silicon: a TEM study

Vacuum, 1991, Vol.42 (5), p.367-369

1991

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A 3.0 V 40 Mb/s hard disk drive read channel IC

IEEE journal of solid-state circuits, 1995-07, Vol.30 (7), p.788-799

1995

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IEEE_Xplore

Transmission electron microscopy study of PbTiO3 and PbZrxTi1−xO3 films

Ferroelectrics, 1996-08, Vol.184 (1), p.51-59

1996

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Hetero-epitaxial oxidic conductor La1-xSrxCoO3 prepared by pulsed laser deposition

Applied surface science, 1993-05, Vol.69 (1-4), p.212-215

1993

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TEM study of combined oxygen and nitrogen implanted silicon

Philosophical magazine. A, Physics of condensed matter. Defects and mechanical properties, 1991-09, Vol.64 (3), p.513-531

1991

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Spectroscopic ellipsometry studies of SIMOX structures and correlation with cross-section TEM

Vacuum, 1991, Vol.42 (5), p.359-365

1991

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Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films

Thin solid films, 1996-07, Vol.280 (1-2), p.136-141

1996

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Design of a bipolar 10-MHz programmable continuous-time 0.05° equiripple linear phase filter

IEEE journal of solid-state circuits, 1992, Vol.27 (3), p.324-331

1992

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A new diamond-related compound in the system Al2O3-Al4C3-AlN

Journal of solid state chemistry, 1995-12, Vol.120 (2), p.211-215

1995

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AlSiV and AlSiVPd films as alternatives for AlSiCu interconnect: microstructure and its impact on reliability

Thin solid films, 1994-01, Vol.246 (1), p.164-171

1994

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Cross Section Transmission Electron Microscopy Studies of Zr Samples Laser Irradiated in Air

November 16, 2021, Vol.110, Number 1, p.317-321

2021

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The phase of the oscillatory exchange coupling in coherent fcc (Fe-Co-Ni) / Cu (001) multilayers

Journal of magnetism and magnetic materials, 1993-03, Vol.121 (1), p.266-269

1993

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MBE Growth of CoO and Fe3O4 films and CoO/Fe3O4 multilayers

MRS proceedings, 1994, Vol.341

1994

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Cross-sectional transmission electron microscopy studies of metallic multilayers

Ultramicroscopy, 1993-06, Vol.51 (1), p.306-315

1993

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A 450-Mb/s analog front end for PRML read channels

‘3-Dimensional’ TEM silicon-device analysis by combining plan-view and FIB sample preparation

Structural and electrical characterization of heteroepitaxial lead zirconate titanate thin films

Inverted spin valves for magnetic heads and sensors

On the ferromagnetic interlayer coupling in exchange-biased spin-valve multilayers

Columnar microstructures in magnetron-sputtered refractory metal thin films of tungsten, molybdenum and W-Ti-(N)

The use of a focused-ion-beam machine to prepare transmission electron microscopy samples of residual photoresist

The structure of heteroepitaxial lead titanate layers grown by organometallic chemical vapour deposition

Pulse switching characterization of organometallic chemical vapor deposited PbZrxTi1−xO3 thin films for high-density memory applications

Spectroscopic ellipsometry and transmission electron microscopy study of annealed high-dose oxygen implanted silicon

Transmission electron microscopy study of unhydrided, dehydrided and annealed LaNi5

Defects in high-dose oxygen implanted silicon: a TEM study

A 3.0 V 40 Mb/s hard disk drive read channel IC

Transmission electron microscopy study of PbTiO3 and PbZrxTi1−xO3 films

Hetero-epitaxial oxidic conductor La1-xSrxCoO3 prepared by pulsed laser deposition

TEM study of combined oxygen and nitrogen implanted silicon

Spectroscopic ellipsometry studies of SIMOX structures and correlation with cross-section TEM

Grain size and strain in thin sputter-deposited Ni0.8Fe0.2 and Cu films

Design of a bipolar 10-MHz programmable continuous-time 0.05° equiripple linear phase filter

A new diamond-related compound in the system Al2O3-Al4C3-AlN

AlSiV and AlSiVPd films as alternatives for AlSiCu interconnect: microstructure and its impact on reliability

Cross Section Transmission Electron Microscopy Studies of Zr Samples Laser Irradiated in Air

The phase of the oscillatory exchange coupling in coherent fcc (Fe-Co-Ni) / Cu (001) multilayers

MBE Growth of CoO and Fe3O4 films and CoO/Fe3O4 multilayers

Cross-sectional transmission electron microscopy studies of metallic multilayers

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