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Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures
IEEE transactions on electron devices, 2001-04, Vol.48 (4), p.737-742
2001
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Critical discussion on unified 1/f noise models for MOSFETs
IEEE transactions on electron devices, 2000-11, Vol.47 (11), p.2146-2152
2000
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Elevated source/drain by sacrificial selective epitaxy for high performance deep submicron CMOS: Process window versus complexity
IEEE transactions on electron devices, 2000-07, Vol.47 (7), p.1484-1491
2000
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Modeling the subthreshold swing in MOSFET's
IEEE electron device letters, 1997-08, Vol.18 (8), p.369-371
1997
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Parameter extraction and 1/ f noise in a surface and a bulk-type, p-channel LDD MOSFET
Solid-state electronics, 1994-11, Vol.37 (11), p.1853-1862
1994
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Current crowding and its effect on 1/ f noise and third harmonic distortion – a case study for quality assessment of resistors
Microelectronics and reliability, 2000-11, Vol.40 (11), p.1847-1853
2000
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Development of a RF large signal MOSFET model, based on an equivalent circuit, and comparison with the BSIM3v3 compact model
Solid-state electronics, 2002-03, Vol.46 (3), p.353-360
2002
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Impact of silicon substrate, iron contamination and perimeter on saturation current and noise in n+p diodes
Solid-state electronics, 1997-06, Vol.41 (6), p.901-908
1997
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Impact of silicidation on the excess noise behaviour of mos transistors
Solid-state electronics, 1995-11, Vol.38 (11), p.1893-1897
1995
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1/f noise and its coherence as a diagnostic tool for quality assessment of potentiometers
IEEE transactions on components, packaging, and manufacturing technology. Part A, 1994-09, Vol.17 (3), p.436-445
1994
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Diagnostics of the quality of MOSFETs
Microelectronics and reliability, 1996, Vol.36 (7), p.1107-1112
1996
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Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25μm Ti-silicided poly lines
Microelectronics and reliability, 1998-06, Vol.38 (6), p.925-929
1998
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Use of Vectorial Large-Signal Measurements to Experimentally Evaluate Digital Circuits at Microwave Frequencies: Application to Inverters
57th ARFTG Conference Digest, 2001, Vol.39, p.1-5
2001
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Capabilities of Vectorial Large-Signal Measurements to Validate RF Large-Signal Device Models
58th ARFTG Conference Digest, 2001, Vol.40, p.1-6
2001
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Impact of non-quasi-static effects on the high frequency small-signal behaviour of MOSFETs
ICM 2000. Proceedings of the 12th International Conference on Microelectronics. (IEEE Cat. No.00EX453), 2000, p.371-374
2000
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5.5GHz LSNA MOSFET modeling for RF CMOS circuit design
60th ARFTG Conference Digest, Fall 2002, 2002, p.39-47
2002
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Accuracy assessment of the BSIM3v3 MOSFET compact model for large signal RF applications
2000 Topical Meetings on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (Cat. No.00EX397), 2000, p.152-155
2000
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Reliable extraction of RF figures-of-merit for MOSFETs
29th European Solid-State Device Research Conference, 1999, Vol.1, p.660-663
1999
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