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Combined Neutron and TID Results of the Intersil ISL70321SEH

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC), 2022, p.1-4

2022

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SET Results of the Intersil ISL7202xSEH CAN Transceivers in a Two Node Bus System

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 2020, p.1-4

2020

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Combined Displacement Damage and LDR Results of the Intersil ISL73141SEH 3.3V Analog to Digital Converter

2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023, p.1-5

2023

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SEE and Total Dose Results of the ISL73033SLHM Dri-GaN Power Stage with 100V GaN FET

2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2021, p.1-4

2021

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Total Dose and Single-Event Effects Testing of the Intersil ISL73041SEH 12V Half Bridge GaN FET Driver

2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023, p.1-5

2023

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Low Dose Rate Testing of the Intersil IS1009RH Hardened Voltage Reference and ISL72991RH Negative Low Dropout Regulator

2007 IEEE Radiation Effects Data Workshop, 2007, p.101-106

2007

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Freeze-out characterization of radiation hardened N/sup +/ polysilicon gate CMOS transistors

IEEE transactions on nuclear science, 1991-12, Vol.38 (6), p.1289-1296

1991

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Freeze-out characterization of radiation hardened N+polysilicon gate CMOS transistors

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1289-1296

1991

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A cryogenic mixed-signal process for radiation-hardened applications

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3), 1993, p.325-328

van Vonno, N.W.

1993

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Neutron irradiation effects on AlGaAs/GaAs heterojunction bipolar transistors

IEEE transactions on nuclear science, 1988-12, Vol.35 (6), p.1657-1661

1988

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Design and validation testing of the SEE-hardened IS1825ASRH pulse width modulator

RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605), 2001, p.261-265

2001

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Radiation characterization of a Monolithic nuclear event detector

Workshop Record 1992 IEEE Radiation Effects Data Workshop, 1992, p.82-86

1992

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Design considerations and verification testing of an SEE-hardened quad comparator

IEEE transactions on nuclear science, 2001-12, Vol.48 (6), p.1859-1864

2001

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Combined Neutron and TID Results of the Intersil ISL70321SEH

SET Results of the Intersil ISL7202xSEH CAN Transceivers in a Two Node Bus System

Combined Displacement Damage and LDR Results of the Intersil ISL73141SEH 3.3V Analog to Digital Converter

SEE and Total Dose Results of the ISL73033SLHM Dri-GaN Power Stage with 100V GaN FET

Total Dose and Single-Event Effects Testing of the Intersil ISL73041SEH 12V Half Bridge GaN FET Driver

Low Dose Rate Testing of the Intersil IS1009RH Hardened Voltage Reference and ISL72991RH Negative Low Dropout Regulator

Freeze-out characterization of radiation hardened N/sup +/ polysilicon gate CMOS transistors

Freeze-out characterization of radiation hardened N+polysilicon gate CMOS transistors

A cryogenic mixed-signal process for radiation-hardened applications

Neutron irradiation effects on AlGaAs/GaAs heterojunction bipolar transistors

Design and validation testing of the SEE-hardened IS1825ASRH pulse width modulator

Radiation characterization of a Monolithic nuclear event detector

Design considerations and verification testing of an SEE-hardened quad comparator

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