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Some comments on models for field enhancement

Ultramicroscopy, 2003-05, Vol.95 (1-4), p.57-65

2003

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Microscopy and computational modelling to elucidate the enhancement factor for field electron emitters

Journal of microscopy (Oxford), 2001-08, Vol.203 (2), p.188-194

2001

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Electron Microscopy in Material Science

Valdre, U

1, 1972

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Electron Microscopy in Material Science: 'Ettore Majorana' International Centre for Scientific Culture, 1970 International School of Electron Microscopy, a Nato Advanced Study Institute Sponsored By Cnr-mpi, Erice, April 4-18

Valdre, U

2012

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On Sublimation: A Path to the Destiny of Desire, Theory, and Treatment

Valdre, Rossella

1, 2014

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Hyaluronic Acid by Atomic Force Microscopy

Journal of structural biology, 1999-06, Vol.126 (1), p.52-58

1999

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Atomic force microscopy observations of acyl chains in phospholipids

Journal of microscopy (Oxford), 1996-06, Vol.182 (3), p.200-207

1996

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High-resolution imaging of n-alkane crystals by atomic force microscopy

Philosophical magazine letters, 1998-09, Vol.78 (3), p.255-261

1998

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The enhancement factor and the characterization of amorphous carbon field emitters

Solid-state electronics, 2001-06, Vol.45 (6), p.857-863

2001

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Study of elastic fiber organization by scanning force microscopy

Matrix biology, 1998-04, Vol.17 (1), p.75-83

1998

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Experimental and computational study of field emission characteristics from amorphous carbon single nanotips grown by carbon contamination - I. Experiments and computation

Philosophical magazine. B, Physics of condensed matter. Structural, electronic, optical, and magnetic properties., 2002-06, Vol.82 (9), p.987-1007

2002

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Field Emission and Electron Microscopy

Microscopy and microanalysis, 2000-07, Vol.6 (4), p.380-387

2000

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Coexistence of nanoscopic domains in synthetic membranes

Philosophical magazine. B, Physics of condensed matter. Structural, electronic, optical, and magnetic properties., 1999-10, Vol.79 (10), p.1549-1559

1999

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Electron Microscope Stage Design And Applications

Journal of microscopy (Oxford), 1979-09, Vol.117 (1), p.55-75

Valdre, U

1979

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A proposal for an operative definition of resolution in EBIC images

Ultramicroscopy, 1981, Vol.6 (1), p.91-92

Valdrè, U.

1981

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Work function dependence on the thickness and substrate of carbon contamination layers by Kelvin probe force microscopy

Philosophical magazine letters, 2003-07, Vol.83 (7), p.441-451

2003

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An electron optical method for the measurement of the superconducting penetration depth

Ultramicroscopy, 1980, Vol.5 (1), p.19-26

Valdre, U

1980

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Residual pressure effects on SEM/SE YBCO image brightness versus temperature

Superconductor science & technology, 1994-07, Vol.7 (7), p.507-513

1994

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Editorial: Workshop on metastable metallic phases: Principles and applications

Philosophical magazine. B, Physics of condensed matter. Structural, electronic, optical, and magnetic properties., 1990-04, Vol.61 (4), p.447-448

1990

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A simple goniometer stage for the Siemens electron microscope

Journal of scientific instruments, 1962-06, Vol.39 (6), p.278-280

Valdre, U

1962

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A modified goniometer specimen holder for the Siemens electron microscope operating under long focal length conditions

Journal of scientific instruments, 1964-05, Vol.41 (5), p.327-328

Valdre, U

1964

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Technic of ultra-microtomy. II

Bollettino della Societa italiana di biologia sperimentale, 1958-03, Vol.34 (5), p.207

VALDRE, U

1958

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Properties of single field emitters deduced by use of spherical Fowler-Nordheim theory

Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737), 2004, p.38-39

2004

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Combined cartridges and versatile specimen stage for electron microscopy

Il Nuovo Cimento B Series 10, 1968-01, Vol.53 (1), p.157-173, Article 157

Valdrè, U.

1968

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Structural and analytical electron microscopy of dislocation loops and precipitates formed during ageing of an α-bombarded MnCr austenitic steel

Physica status solidi. A, Applied research, 1988-06, Vol.107 (2), p.745-758

1988

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Some comments on models for field enhancement

Microscopy and computational modelling to elucidate the enhancement factor for field electron emitters

Electron Microscopy in Material Science

Electron Microscopy in Material Science: 'Ettore Majorana' International Centre for Scientific Culture, 1970 International School of Electron Microscopy, a Nato Advanced Study Institute Sponsored By Cnr-mpi, Erice, April 4-18

On Sublimation: A Path to the Destiny of Desire, Theory, and Treatment

Hyaluronic Acid by Atomic Force Microscopy

Atomic force microscopy observations of acyl chains in phospholipids

High-resolution imaging of n-alkane crystals by atomic force microscopy

The enhancement factor and the characterization of amorphous carbon field emitters

Study of elastic fiber organization by scanning force microscopy

Experimental and computational study of field emission characteristics from amorphous carbon single nanotips grown by carbon contamination - I. Experiments and computation

Field Emission and Electron Microscopy

Coexistence of nanoscopic domains in synthetic membranes

Electron Microscope Stage Design And Applications

A proposal for an operative definition of resolution in EBIC images

Work function dependence on the thickness and substrate of carbon contamination layers by Kelvin probe force microscopy

An electron optical method for the measurement of the superconducting penetration depth

Residual pressure effects on SEM/SE YBCO image brightness versus temperature

Editorial: Workshop on metastable metallic phases: Principles and applications

A simple goniometer stage for the Siemens electron microscope

A modified goniometer specimen holder for the Siemens electron microscope operating under long focal length conditions

Technic of ultra-microtomy. II

Properties of single field emitters deduced by use of spherical Fowler-Nordheim theory

Combined cartridges and versatile specimen stage for electron microscopy

Structural and analytical electron microscopy of dislocation loops and precipitates formed during ageing of an α-bombarded MnCr austenitic steel

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